R. Carel

1.1k total citations · 1 hit paper
9 papers, 960 citations indexed

About

R. Carel is a scholar working on Mechanics of Materials, Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering. According to data from OpenAlex, R. Carel has authored 9 papers receiving a total of 960 indexed citations (citations by other indexed papers that have themselves been cited), including 7 papers in Mechanics of Materials, 7 papers in Electronic, Optical and Magnetic Materials and 5 papers in Electrical and Electronic Engineering. Recurrent topics in R. Carel's work include Copper Interconnects and Reliability (7 papers), Metal and Thin Film Mechanics (7 papers) and Semiconductor materials and devices (5 papers). R. Carel is often cited by papers focused on Copper Interconnects and Reliability (7 papers), Metal and Thin Film Mechanics (7 papers) and Semiconductor materials and devices (5 papers). R. Carel collaborates with scholars based in United States. R. Carel's co-authors include Carl V. Thompson, H.J. Frost, J. A. Floro, Paul D. Bristowe, Steven C. Seel, Jerrold A. Floro and Jingjing Chen and has published in prestigious journals such as Acta Materialia, Journal of the Mechanics and Physics of Solids and Journal of materials research/Pratt's guide to venture capital sources.

In The Last Decade

R. Carel

8 papers receiving 929 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Stress and grain growth in thin films

1996 424 citations Carl V. Thompson, R. Carel Journal of the Mechanics and Physics of Solids profile →

Peers

R. Carel

MC

EEE

EOMM

MM

AMPO

Steven C. Seel United States

J. M. Molarius Finland

D. B. Knorr United States

Shozo Inoue Japan

C.A. Carosella United States

K. P. Rodbell United States

K. F. Badawi France

Sergey Grachev France

D. Gupta United States

J.P. Peyrade France

Steven C. Seel United States

R. Carel

385 ×0.7

MC

367 ×0.9

EEE

272 ×0.7

EOMM

349 ×0.9

MM

163 ×1.0

AMPO

Citations per year, relative to R. Carel R. Carel (= 1×) peers Steven C. Seel

Countries citing papers authored by R. Carel

Since Specialization

Citations

This map shows the geographic impact of R. Carel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Carel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Carel more than expected).

Fields of papers citing papers by R. Carel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Carel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Carel. The network helps show where R. Carel may publish in the future.

Co-authorship network of co-authors of R. Carel

This figure shows the co-authorship network connecting the top 25 collaborators of R. Carel. A scholar is included among the top collaborators of R. Carel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Carel. R. Carel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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9 of 9 papers shown

1.

Carel, R., et al.. (2002). Process trends for DPS metal etch: a case study for Al-1%Cu logic devices. 12. 246–251.

2.

Thompson, Carl V. & R. Carel. (1996). Stress and grain growth in thin films. Journal of the Mechanics and Physics of Solids. 44(5). 657–673. 424 indexed citations breakdown →

3.

Carel, R., Carl V. Thompson, & H.J. Frost. (1996). Computer simulation of strain energy effects vs surface and interface energy effects on grain growth in thin films. Acta Materialia. 44(6). 2479–2494. 121 indexed citations

4.

Thompson, Carl V. & R. Carel. (1996). Grain Growth and Texture Evolution in Thin Films. Materials science forum. 204-206. 83–98. 42 indexed citations

5.

Thompson, Carl V. & R. Carel. (1995). Texture development in polycrystalline thin films. Materials Science and Engineering B. 32(3). 211–219. 281 indexed citations

6.

Seel, Steven C., R. Carel, & Carl V. Thompson. (1995). Texture Maps for Orientation Evolution During Grain Growth in Thin Films. MRS Proceedings. 403. 7 indexed citations

7.

Carel, R., Carl V. Thompson, & H.J. Frost. (1994). Computer Simulation of Strain Energy and Surface- and Interface-Energy on Grain Growth in Thin Films. MRS Proceedings. 343. 7 indexed citations

8.

Floro, J. A., Carl V. Thompson, R. Carel, & Paul D. Bristowe. (1994). Competition between strain and interface energy during epitaxial grain growth in Ag films on Ni(001). Journal of materials research/Pratt's guide to venture capital sources. 9(9). 2411–2424. 74 indexed citations

9.

Floro, Jerrold A., R. Carel, & Carl V. Thompson. (1993). Energy Minimization During Epitaxial Grain Growth: Strain VS. Interfacial Energy. MRS Proceedings. 317. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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