Peter E. Raad

2.4k total citations
91 papers, 1.9k citations indexed

About

Peter E. Raad is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Mechanics of Materials. According to data from OpenAlex, Peter E. Raad has authored 91 papers receiving a total of 1.9k indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Materials Chemistry, 35 papers in Electrical and Electronic Engineering and 31 papers in Mechanics of Materials. Recurrent topics in Peter E. Raad's work include Thermal properties of materials (37 papers), Thermography and Photoacoustic Techniques (15 papers) and Silicon Carbide Semiconductor Technologies (14 papers). Peter E. Raad is often cited by papers focused on Thermal properties of materials (37 papers), Thermography and Photoacoustic Techniques (15 papers) and Silicon Carbide Semiconductor Technologies (14 papers). Peter E. Raad collaborates with scholars based in United States, Sweden and Australia. Peter E. Raad's co-authors include Pavel L. Komarov, Mihai Burzo, David B. Johnson, Marko J. Tadjer, Karl D. Hobart, Travis J. Anderson, A. Keshavarzi, R. Venkatasubramanian, Yogendra Joshi and Ravi Prasher and has published in prestigious journals such as Analytical Chemistry, Journal of Computational Physics and ACS Applied Materials & Interfaces.

In The Last Decade

Peter E. Raad

87 papers receiving 1.8k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Peter E. Raad United States 21 682 609 525 353 332 91 1.9k
Ching-Yen Ho Taiwan 19 749 1.1× 300 0.5× 886 1.7× 300 0.8× 375 1.1× 52 2.0k
Chih‐Hsiang Ho United States 17 630 0.9× 634 1.0× 455 0.9× 175 0.5× 110 0.3× 63 1.7k
N. Arnold Austria 26 626 0.9× 538 0.9× 347 0.7× 537 1.5× 580 1.7× 78 2.4k
Joseph D. Paulsen United States 15 342 0.5× 301 0.5× 275 0.5× 99 0.3× 452 1.4× 24 1.2k
Laurent Limat France 29 425 0.6× 678 1.1× 228 0.4× 448 1.3× 1.7k 5.0× 87 2.7k
Tapati Dutta India 20 211 0.3× 599 1.0× 127 0.2× 250 0.7× 373 1.1× 71 1.4k
Shankar Krishnan United States 27 957 1.4× 335 0.6× 1.5k 2.8× 227 0.6× 960 2.9× 154 3.1k
Daniel Bonamy France 26 725 1.1× 93 0.2× 303 0.6× 610 1.7× 476 1.4× 64 2.1k
S.K. Lai Hong Kong 28 877 1.3× 301 0.5× 969 1.8× 833 2.4× 132 0.4× 196 2.8k
Hideya Nishiyama Japan 21 370 0.5× 586 1.0× 361 0.7× 217 0.6× 541 1.6× 256 2.0k

Countries citing papers authored by Peter E. Raad

Since Specialization
Citations

This map shows the geographic impact of Peter E. Raad's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter E. Raad with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter E. Raad more than expected).

Fields of papers citing papers by Peter E. Raad

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Peter E. Raad. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter E. Raad. The network helps show where Peter E. Raad may publish in the future.

Co-authorship network of co-authors of Peter E. Raad

This figure shows the co-authorship network connecting the top 25 collaborators of Peter E. Raad. A scholar is included among the top collaborators of Peter E. Raad based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Peter E. Raad. Peter E. Raad is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Nandi, Sanjoy Kumar, Sujan Kumar Das, Yubo Cui, et al.. (2022). Thermal Conductivity of Amorphous NbOx Thin Films and Its Effect on Volatile Memristive Switching. ACS Applied Materials & Interfaces. 14(18). 21270–21277. 6 indexed citations
2.
Cui, Yue, Marko J. Tadjer, Travis J. Anderson, et al.. (2020). Full thermal characterization of AlGaN/GaN high electron mobility transistors on silicon, silicon carbide, and diamond substrates using a reverse modeling approach. Semiconductor Science and Technology. 36(1). 14008–14008. 10 indexed citations
3.
Nandi, Sanjoy Kumar, Shimul Kanti Nath, Shuai Li, et al.. (2020). Electric Field- and Current-Induced Electroforming Modes in NbOx. ACS Applied Materials & Interfaces. 12(7). 8422–8428. 36 indexed citations
4.
Venugopal, Archana, et al.. (2020). Standardized Heat Spreader Design for Passive Cooling of Interconnects in the BEOL of ICs. IEEE Transactions on Components Packaging and Manufacturing Technology. 10(6). 1010–1019. 2 indexed citations
5.
Tadjer, Marko J., Travis J. Anderson, Mario G. Ancona, et al.. (2019). GaN-On-Diamond HEMT Technology With TAVG = 176°C at PDC,max = 56 W/mm Measured by Transient Thermoreflectance Imaging. IEEE Electron Device Letters. 40(6). 881–884. 75 indexed citations
6.
Koklu, Anil, et al.. (2019). Characterization of Temperature Rise in Alternating Current Electrothermal Flow Using Thermoreflectance Method. Analytical Chemistry. 91(19). 12492–12500. 14 indexed citations
7.
Tadjer, Marko J., Fritz J. Kub, Peter E. Raad, et al.. (2018). Electrothermal Evaluation of AlGaN/GaN Membrane High Electron Mobility Transistors by Transient Thermoreflectance. IEEE Journal of the Electron Devices Society. 6. 922–930. 15 indexed citations
8.
Raad, Peter E., et al.. (2014). Thermoreflectance temperature measurements for optically emitting devices. Microelectronics Journal. 45(5). 515–520. 10 indexed citations
9.
Raad, Peter E., et al.. (2012). Thermoreflectance measurements for optically emitting devices. 1–3. 2 indexed citations
10.
Lee, Taehun, Mihai Burzo, Pavel L. Komarov, Peter E. Raad, & M. J. Kim. (2011). Direct Observation of Heat Transport in Plural AlN Films Using Thermal Imaging and Transient Thermal Reflectance Method. Electrochemical and Solid-State Letters. 14(5). H184–H184. 4 indexed citations
11.
Haneef, Ibraheem, Mihai Burzo, S. Z. Ali, et al.. (2010). Thermal characterization of SOI CMOS micro hot-plate gas sensors. Cambridge University Engineering Department Publications Database. 1–4. 2 indexed citations
12.
Burzo, Mihai, Pavel L. Komarov, & Peter E. Raad. (2009). Pixel-by-pixel calibration of a CCD camera based thermoreflectance thermography system with nanometer resolution. 130–135. 3 indexed citations
13.
Raad, Peter E., Pavel L. Komarov, & Mihai Burzo. (2008). Thermal characterization of embedded electronic features by an integrated system of CCD thermography and self-adaptive numerical modeling. Microelectronics Journal. 39(7). 1008–1015. 17 indexed citations
14.
Komarov, Pavel L., Mihai Burzo, & Peter E. Raad. (2006). A thermoreflectance thermography system for measuring the transient surface temperature field of activated electronic devices. 199–203. 21 indexed citations
15.
Raad, Peter E., et al.. (2005). Field Survey of the 2004 Indonesian Tsunami in Oman. AGUFM. 2005. 9 indexed citations
16.
Raad, Peter E., et al.. (2004). Design of Cast Pin Fin Coldwalls for Air-Cooled Electronics Systems. Journal of Electronic Packaging. 126(1). 67–73. 11 indexed citations
17.
Kulish, Vladimír, José Luis Caramés Lage, Pavel L. Komarov, & Peter E. Raad. (2001). A Fractional-Diffusion Theory for Calculating Thermal Properties of Thin Films From Surface Transient Thermoreflectance Measurements. Journal of Heat Transfer. 123(6). 1133–1138. 36 indexed citations
18.
Johnson, David B., et al.. (1997). The surface marker and micro cell method. International Journal for Numerical Methods in Fluids. 25(7). 749–778. 3 indexed citations
19.
Johnson, David B., et al.. (1995). Velocity Boundary Conditions for the Simulation of Free Surface Fluid Flow. Journal of Computational Physics. 116(2). 262–276. 48 indexed citations
20.
White, J. W. & Peter E. Raad. (1987). Effect of a Rough Translating Surface on Gas Film Lubrication: A Numerical and Analytical Study. Journal of Tribology. 109(2). 271–275. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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