Patrick Dumais

1.1k citations
64 papers · 736 indexed · h-index 14

Patrick Dumais

60 papers receiving 689 citations

Peers

Patrick Dumais
Comparison fields: 5 of 29
  • Atomic and Molecular Physics, and Optics 385
  • Electrical and Electronic Engineering 685
  • Artificial Intelligence 118
  • Instrumentation 8
  • Bioengineering 13
Replace Abdul Rahim with:
Abdul Rahim Belgium
Thijs Spuesens Belgium
Myeong Soo Kang Germany
Michael Förtsch Germany
Lian-Wee Luo United States
Huifu Xiao China
Noam Ophir United States
Laurent Labonté France
M. Kroh Germany
Jun Rong Ong Singapore
Patrick Dumais relative to Abdul Rahim Belgium Abdul Rahim's profile →
Citations per field
00.5×5.3×
Abdul Rahim · 1×
Citations per year

Countries citing papers authored by Patrick Dumais

Since Specialization
Citations

This map shows the geographic impact of Patrick Dumais's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick Dumais with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick Dumais more than expected).

Fields of papers citing papers by Patrick Dumais

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick Dumais. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick Dumais. The network helps show where Patrick Dumais may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Patrick Dumais, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Patrick Dumais Line = papers co-authored together Patrick Dumais links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20187
2 20178
3
32×32 silicon photonic switch
201613
4 20169
5 20151
6 20141
7 20142
8 201412
9 20122
10 201210
11 20113
12 20112
13 20100
14 20091
15 200832
16 20068
17 20065
18 200522
19 200015
20 199362

About Patrick Dumais

Patrick Dumais is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films, having authored 64 papers that have together received 736 indexed citations. Recurring topics across this work include Photonic and Optical Devices (58 papers), Optical Network Technologies (28 papers), Advanced Photonic Communication Systems (26 papers), Advanced Fiber Laser Technologies (20 papers), Semiconductor Lasers and Optical Devices (16 papers), Advanced Fiber Optic Sensors (10 papers), Photonic Crystals and Applications (7 papers) and Laser-Matter Interactions and Applications (3 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (385 citations), Electrical and Electronic Engineering (685 citations) and Artificial Intelligence (118 citations). Patrick Dumais has collaborated with scholars based in Canada, China and United States. Frequent co-authors include Dominic Goodwill, Claire L. Callender, Éric Bernier, Jia Jiang, Julian P. Noad, Xianshu Luo, Jared C. Mikkelsen, Joyce K. S. Poon, Wesley D. Sacher and Patrick Lo. Their work appears in journals such as IEEE Photonics Technology Letters, Optics Express, Optics Letters, Journal of Lightwave Technology and IEEE photonics journal.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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