Pan Wei

607 citations
19 papers · 394 · h-index 8

Impact in

Papers in

Pan Wei

18 papers receiving 371 citations

Peers

Pan Wei
Comparison fields: 5 of 72
  • Computer Vision and Pattern Recognition 276
  • Instrumentation 18
  • Media Technology 32
  • Automotive Engineering 37
  • Computer Graphics and Computer-Aided Design 7
Replace Yurong You with:
Yurong You United States
Peide Cai Hong Kong
Kevin J. Shih United States
Guoxin Zhang China
Rohit Mohan India
Laksono Kurnianggoro South Korea
Peter Pinggera Germany
Zebang Yang China
Hang Zhao China
Zhengxu Yu China
Pan Wei relative to Yurong You United States Yurong You's profile →
Citations per field
00.5×1.6×
Yurong You · 1×
Citations per year

Countries citing papers authored by Pan Wei

Since Specialization
Citations

This map shows the geographic impact of Pan Wei's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Pan Wei with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Pan Wei more than expected).

Fields of papers citing papers by Pan Wei

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Pan Wei. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Pan Wei. The network helps show where Pan Wei may publish in the future.

Co-authors

The 25 scholars most cited alongside Pan Wei, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Pan Wei Line = papers co-authored together Pan Wei links everyone, so they are left out of the graph.

All Works

19 of 19 papers shown
#Work
1 2012187
2 201890
3 201822
4 201822
5 201816
6 201815
7 20189
8 20188
9 20167
10 20163
11 20153
12 20233
13 20203
14 20192
15 20151
16 20211
17 20191
18 20201
19 20250

About Pan Wei

Pan Wei is a scholar working on Computer Vision and Pattern Recognition, Artificial Intelligence, Media Technology, Civil and Structural Engineering and Ocean Engineering, having authored 19 papers that have together received 394 indexed citations. Recurring topics across this work include Remote-Sensing Image Classification (3 papers), Advanced Image and Video Retrieval Techniques (3 papers), Robotics and Sensor-Based Localization (2 papers), Industrial Vision Systems and Defect Detection (2 papers), Advanced Steganography and Watermarking Techniques (2 papers), Image Retrieval and Classification Techniques (2 papers), Chaos-based Image/Signal Encryption (2 papers) and Infrastructure Maintenance and Monitoring (2 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (276 citations), Instrumentation (18 citations), Media Technology (32 citations), Automotive Engineering (37 citations) and Computer Graphics and Computer-Aided Design (7 citations). Pan Wei has collaborated with scholars based in China, United States and United Kingdom. Frequent co-authors include Gouenou Coatrieux, John E. Ball, F. Cuppens, C. Roux, James Gafford, Derek T. Anderson, Perry Xiao, Xu Zhang, Reuben F. Burch and Harish Chander. Their work appears in journals such as Electronics, Computer Methods and Programs in Biomedicine, Sensors, IEEE Transactions on Information Forensics and Security and Cosmetics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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