P. Wißmann

918 total citations
58 papers, 630 citations indexed

About

P. Wißmann is a scholar working on Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering. According to data from OpenAlex, P. Wißmann has authored 58 papers receiving a total of 630 indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Electronic, Optical and Magnetic Materials, 29 papers in Atomic and Molecular Physics, and Optics and 23 papers in Electrical and Electronic Engineering. Recurrent topics in P. Wißmann's work include Copper Interconnects and Reliability (33 papers), Surface and Thin Film Phenomena (23 papers) and Semiconductor materials and devices (17 papers). P. Wißmann is often cited by papers focused on Copper Interconnects and Reliability (33 papers), Surface and Thin Film Phenomena (23 papers) and Semiconductor materials and devices (17 papers). P. Wißmann collaborates with scholars based in Germany and Japan. P. Wißmann's co-authors include G. Wedler, Werner Fischer, Masao Watanabe, U. Merkt, Petra Rudolf, Hans Geiger, Rolf E. Hummel, Erich Christian Wittmann, Manfred Rauh and Maik Lang and has published in prestigious journals such as Applied Surface Science, Surface Science and Thin Solid Films.

In The Last Decade

P. Wißmann

57 papers receiving 569 citations

Peers

P. Wißmann

EEE

AMPO

EOMM

J. M. Heras Argentina

M. L. Colaianni United States

M. Sotto France

L. Pham Van France

C. Argile France

F.W. Boswell Canada

W. J. Scouler United States

L. D. Marks United States

H. Siekmann Germany

R. Heckingbottom United Kingdom

J. M. Heras Argentina

P. Wißmann

301 ×1.0

EEE

254 ×0.9

AMPO

198 ×0.7

EOMM

298 ×1.5

98 ×1.1

Citations per year, relative to P. Wißmann P. Wißmann (= 1×) peers J. M. Heras

Countries citing papers authored by P. Wißmann

Since Specialization

Citations

This map shows the geographic impact of P. Wißmann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Wißmann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Wißmann more than expected).

Fields of papers citing papers by P. Wißmann

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Wißmann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Wißmann. The network helps show where P. Wißmann may publish in the future.

Co-authorship network of co-authors of P. Wißmann

This figure shows the co-authorship network connecting the top 25 collaborators of P. Wißmann. A scholar is included among the top collaborators of P. Wißmann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Wißmann. P. Wißmann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Rauh, Manfred, et al.. (1999). The Oxidation Kinetics of Thin Copper Films Studied by Resistivity Measurements. Zeitschrift für Naturforschung A. 54(2). 117–123. 12 indexed citations

Hummel, Rolf E. & P. Wißmann. (1997). Optics of small particles, interfaces, and Surfaces. CRC Press eBooks. 17 indexed citations

Brüggemann, Monika, et al.. (1997). Electrical and optical properties of melting Au/Si eutectics on Si(111). Fresenius Journal of Analytical Chemistry. 358(1-2). 179–181. 6 indexed citations

Rauh, Manfred, et al.. (1995). The effect of CO adsorption on the resistivity of thin Pd films. Applied Physics A. 61(6). 587–590. 8 indexed citations

Wißmann, P., et al.. (1994). The Electrical Resistivity of Thin Pd Films Grown on Si(111). physica status solidi (a). 145(2). 521–526. 3 indexed citations

Schmidt, Ralf & P. Wißmann. (1988). Ellipsometric studies on the interaction of oxygen with thin copper films at 460 K. Surface and Interface Analysis. 12(7). 407–411. 3 indexed citations

Wißmann, P.. (1987). Thin metal films and gas chemisorption. Elsevier eBooks. 50 indexed citations

Watanabe, Masao, et al.. (1986). The Electrical Resistivity of Thin Silver Films During Oxygen Chemisorption at 295 K. Zeitschrift für Physikalische Chemie. 148(2). 153–156. 2 indexed citations

Antón, R., et al.. (1986). Electrical and Structural Properties of Thin Palladium Films. Zeitschrift für Naturforschung A. 41(4). 665–670. 6 indexed citations

10.

Wißmann, P., et al.. (1986). The d⁻³ Law Describing the Thickness Dependence of the Electrical Resistivity of Rough Metal Films. Annalen der Physik. 498(1-2). 5–10. 14 indexed citations

11.

Wißmann, P. & Erich Christian Wittmann. (1985). Observation of negative values of the changes of the ellipsometric phase difference during gas adsorption on rough metal films. Surface Science. 152-153. 638–646. 9 indexed citations

12.

Watanabe, Masao & P. Wißmann. (1984). Dielectric constants of adsorbed CO on Cu and Ag. Surface Science. 138(1). 95–112. 28 indexed citations

13.

Wißmann, P., et al.. (1983). Determination of thickness and roughness of thin copper films by X-Ray diffraction measurements. Fresenius Zeitschrift für Analytische Chemie. 314(3). 337–339. 5 indexed citations

14.

Geiger, Hans & P. Wißmann. (1980). LEED detection of twin formation in epitaxially grown metal films. Applications of Surface Science. 5(2). 153–160. 6 indexed citations

15.

Merkt, U. & P. Wißmann. (1979). Ellipsometrische Untersuchung der Adsorption von CO an aufgedampften Nickelfilmen. Zeitschrift für Physikalische Chemie. 115(1). 55–67. 8 indexed citations

16.

Geiger, Hans, et al.. (1978). Photoelectric Measurements on Pure and CO Covered Copper Films. Zeitschrift für Physikalische Chemie. 110(1). 75–84. 4 indexed citations

17.

Wedler, G., et al.. (1971). Schichtdickenabhängigkeit der Thermokraft und des Widerstandstemperaturkoeffizienten reiner und mit Gas belegter Nickelfilme. Berichte der Bunsengesellschaft für physikalische Chemie. 75(10). 1033–1037. 6 indexed citations

18.

Wißmann, P.. (1970). Die Änderung des elektrischen Widerstandes dünner Metallschichten durch Gasadsorption*. Zeitschrift für Physikalische Chemie. 71(4_6). 294–302. 18 indexed citations

19.

Wedler, G. & P. Wißmann. (1968). Röntgenographische Untersuchungen an aufgedampften Nickelfilmen. Zeitschrift für Naturforschung A. 23(10). 1544–1548. 11 indexed citations

20.

Wedler, G. & P. Wißmann. (1968). Röntgenographische Untersuchungen an aufgedampften Nickelfilmen. Zeitschrift für Naturforschung A. 23(10). 1537–1543. 20 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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