P. Wilhartitz

589 total citations
52 papers, 486 citations indexed

About

P. Wilhartitz is a scholar working on Computational Mechanics, Materials Chemistry and Electrical and Electronic Engineering. According to data from OpenAlex, P. Wilhartitz has authored 52 papers receiving a total of 486 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Computational Mechanics, 19 papers in Materials Chemistry and 15 papers in Electrical and Electronic Engineering. Recurrent topics in P. Wilhartitz's work include Ion-surface interactions and analysis (29 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and Metal and Thin Film Mechanics (12 papers). P. Wilhartitz is often cited by papers focused on Ion-surface interactions and analysis (29 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and Metal and Thin Film Mechanics (12 papers). P. Wilhartitz collaborates with scholars based in Austria, Germany and Bulgaria. P. Wilhartitz's co-authors include Hugo M. Ortner, M. Grasserbauer, Gernot Friedbacher, A. Virag, Herbert Hutter, O. Bobleter, V. Kriváň, Gerhard Stingeder, Jens Stummeyer and Manfred Schreiner and has published in prestigious journals such as Analytica Chimica Acta, Surface Science and Thin Solid Films.

In The Last Decade

P. Wilhartitz

50 papers receiving 446 citations

Peers

P. Wilhartitz

EEE

Dietmar Hirsch Germany

D. P. Leta United States

L. Fornarini Italy

D. Lipinsky Germany

P. Sander United States

H. E. Beske Germany

M. Marinković Serbia

Patrick Philipp Luxembourg

R. Avni Israel

Jean-Paul Moulin France

Dietmar Hirsch Germany

P. Wilhartitz

226 ×1.4

169 ×1.2

111 ×0.8

209 ×1.8

EEE

81 ×0.7

Citations per year, relative to P. Wilhartitz P. Wilhartitz (= 1×) peers Dietmar Hirsch

Countries citing papers authored by P. Wilhartitz

Since Specialization

Citations

This map shows the geographic impact of P. Wilhartitz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Wilhartitz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Wilhartitz more than expected).

Fields of papers citing papers by P. Wilhartitz

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Wilhartitz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Wilhartitz. The network helps show where P. Wilhartitz may publish in the future.

Co-authorship network of co-authors of P. Wilhartitz

This figure shows the co-authorship network connecting the top 25 collaborators of P. Wilhartitz. A scholar is included among the top collaborators of P. Wilhartitz based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Wilhartitz. P. Wilhartitz is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Mitterbauer, Christoph, Werner Grogger, P. Wilhartitz, & Ferdinand Hofer. (2006). Electron-irradiation damage in chromium nitrides and chromium oxynitride thin films. Micron. 37(5). 385–388. 4 indexed citations

Wilhartitz, P., et al.. (2004). Quantitative SIMS depth profiling of diffusion barrier gate-oxynitride structures in TFT-LCDs. Analytical and Bioanalytical Chemistry. 379(4). 599–604. 2 indexed citations

Wilhartitz, P., et al.. (2003). Can oxygen stabilize chromium nitride?—Characterization of high temperature cycled chromium oxynitride. Thin Solid Films. 447-448. 289–295. 36 indexed citations

Hutter, Herbert, et al.. (2001). SIMS analysis of the oxidation behaviour of SiFeCr coated technical refractory metal alloys. Materials and Corrosion. 52(7). 501–508. 1 indexed citations

Wilhartitz, P., et al.. (2000). Quantitative Sputter Depth Profiling of Silicon- and Aluminium Oxynitride Films. Microchimica Acta. 133(1-4). 75–87. 3 indexed citations

Ortner, Hugo M., et al.. (1999). On the Mechanism of High-Temperature Oxidation of ODS Superalloys: Significance of Yttrium Depletion Within the Oxide Scales. Oxidation of Metals. 51(1-2). 111–128. 33 indexed citations

Wilhartitz, P., et al.. (1997). High performance ultra trace analysis in molybdenum and tungsten accomplished by on-line coupling of ion chromatography with simultaneous ICP-AES. Microchimica Acta. 125(1-4). 45–52. 32 indexed citations

Weinbruch, Stephan, et al.. (1997). High temperature oxidation of Fe- and Ni-based oxide dispersion strengthened superalloys PM 2000 and PM 1000. 1 indexed citations

Latkoczy, Christopher, Herbert Hutter, M. Grasserbauer, & P. Wilhartitz. (1995). Classification of secondary ion mass spectrometry (SIMS) micrographs to characterize chemical phases. Microchimica Acta. 119(1-2). 1–12. 5 indexed citations

10.

Hutter, Herbert, P. Wilhartitz, & M. Grasserbauer. (1993). Topochemical characterization of materials using 3D-SIMS. Analytical and Bioanalytical Chemistry. 346(1-3). 66–68. 14 indexed citations

11.

Wilhartitz, P., Herbert Hutter, M. Grasserbauer, et al.. (1992). Applied analytical tools for the characterization of cermets. International Journal of Refractory Metals and Hard Materials. 11(4). 235–246. 1 indexed citations

12.

Wilhartitz, P. & Hugo M. Ortner. (1991). Bulk trace and distribution analysis in refractory and hard metals. examples from research and development and applications in quality assurance. Analytical and Bioanalytical Chemistry. 341(1-2). 125–130. 4 indexed citations

13.

Stummeyer, Jens, et al.. (1990). Verbundverfahren zur Multielement-Spurenbestimmung in hochreinem Chrom nach Spuren—Matrix-Trennung. Analytica Chimica Acta. 233. 243–249. 4 indexed citations

14.

Jordanov, N., et al.. (1988). Problems of automated qualitative X‐ray fluorescence analysis. 2–Location of maxima and line identification. X-Ray Spectrometry. 17(3). 117–121. 4 indexed citations

15.

Virag, A., Gernot Friedbacher, M. Grasserbauer, Hugo M. Ortner, & P. Wilhartitz. (1988). Multielement ultratrace analysis of molybdenum with high performance secondary ion mass spectrometry. Journal of materials research/Pratt's guide to venture capital sources. 3(4). 694–704. 18 indexed citations

16.

Wilhartitz, P., et al.. (1987). Multielement ultratrace analysis in tungsten using secondary ion mass spectrometry. Fresenius Zeitschrift für Analytische Chemie. 329(2-3). 228–236. 19 indexed citations

17.

Ortner, Hugo M., Gernot Friedbacher, M. Grasserbauer, et al.. (1987). High performance analytical characterization of refractory metals. Microchimica Acta. 91(1-6). 233–260. 41 indexed citations

18.

Wetzig, K., et al.. (1987). Study of the phosphorus embrittlement in heavy metal alloys by a combination of SIMS and TEM. Fresenius Zeitschrift für Analytische Chemie. 326(3). 218–227. 1 indexed citations

19.

Wilhartitz, P., et al.. (1984). Electron-microanalytical investigations of the interfacial corrosion in concrete. Fresenius Zeitschrift für Analytische Chemie. 318(2). 124–128.

20.

Grasserbauer, M., P. Wilhartitz, & Gerhard Stingeder. (1983). In-situ trace analysis of materials with SIMS. Microchimica Acta. 81(5-6). 467–492. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact