P. Roche
Impact in
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- Radiation Effects in Electronics
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design
- CCD and CMOS Imaging Sensors
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
Papers in
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- Radiation Effects in Electronics 116
- Low-power high-performance VLSI design 20
- CCD and CMOS Imaging Sensors 2
- VLSI and FPGA Design Techniques 1
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- Physical Unclonable Functions (PUFs) and Hardware Security 3
- VLSI and Analog Circuit Testing 2
- Co-authors
- Gilles Gasiot (100 shared papers)Jean‐Luc Autran (67 shared papers)Damien Giot (10 shared papers)Daniela Munteanu (35 shared papers)Tino Heijmen (3 shared papers)Sylvain Clerc (33 shared papers)Sławosz Uznański (18 shared papers)J.M. Palau (6 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (54 papers)Microelectronics Reliability (6 papers)IEEE Solid-State Circuits Letters (2 papers)IEEE Transactions on Device and Materials Reliability (2 papers)IEEE Journal of Solid-State Circuits (2 papers)
- Partner nations
- FranceUnited StatesNetherlands
In The Last Decade
P. Roche
150 papers receiving 2.8k citations
Peers
Comparison fields: 5 of 21
- Electrical and Electronic Engineering 2.5k
- Hardware and Architecture 38
- Biomedical Engineering 37
- Nuclear and High Energy Physics 20
- Safety, Risk, Reliability and Quality 8
Countries citing papers authored by P. Roche
This map shows the geographic impact of P. Roche's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Roche with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Roche more than expected).
Fields of papers citing papers by P. Roche
This network shows the impact of papers produced by P. Roche. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Roche. The network helps show where P. Roche may publish in the future.
Co-authors
The 25 scholars most cited alongside P. Roche, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 165 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 122 | |
| 2 | 2007 | 122 | |
| 3 | 2006 | 113 | |
| 4 | 2013 | 97 | |
| 5 | 2003 | 82 | |
| 6 | 2005 | 78 | |
| 7 | 2010 | 68 | |
| 8 | 1996 | 65 | |
| 9 | 2005 | 65 | |
| 10 | 2007 | 57 | |
| 11 | 2008 | 57 | |
| 12 | 2009 | 56 | |
| 13 | 2006 | 53 | |
| 14 | 2007 | 51 | |
| 15 | 1998 | 50 | |
| 16 | 2003 | 43 | |
| 17 | 2015 | 41 | |
| 18 | 2010 | 40 | |
| 19 | 2009 | 38 | |
| 20 | 2010 | 38 |
About P. Roche
P. Roche is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Computational Theory and Mathematics, Radiation and Safety, Risk, Reliability and Quality, having authored 165 papers that have together received 2.9k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (116 papers), Low-power high-performance VLSI design (20 papers), Physical Unclonable Functions (PUFs) and Hardware Security (3 papers), Formal Methods in Verification (2 papers), VLSI and Analog Circuit Testing (2 papers), CCD and CMOS Imaging Sensors (2 papers), VLSI and FPGA Design Techniques (1 paper) and Particle Detector Development and Performance (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (2.5k citations), Hardware and Architecture (38 citations), Biomedical Engineering (37 citations), Nuclear and High Energy Physics (20 citations) and Safety, Risk, Reliability and Quality (8 citations). P. Roche has collaborated with scholars based in France, United States and Netherlands. Frequent co-authors include Gilles Gasiot, Jean‐Luc Autran, Damien Giot, Daniela Munteanu, Tino Heijmen, Sylvain Clerc, Sławosz Uznański, J.M. Palau, Fady Abouzeid and Jean-Marc Daveau. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, IEEE Solid-State Circuits Letters, IEEE Transactions on Device and Materials Reliability and IEEE Journal of Solid-State Circuits.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.