P. Hones

1.6k total citations
19 papers, 1.5k citations indexed

About

P. Hones is a scholar working on Mechanics of Materials, Materials Chemistry and Electrical and Electronic Engineering. According to data from OpenAlex, P. Hones has authored 19 papers receiving a total of 1.5k indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Mechanics of Materials, 14 papers in Materials Chemistry and 10 papers in Electrical and Electronic Engineering. Recurrent topics in P. Hones's work include Metal and Thin Film Mechanics (15 papers), Semiconductor materials and devices (9 papers) and Diamond and Carbon-based Materials Research (8 papers). P. Hones is often cited by papers focused on Metal and Thin Film Mechanics (15 papers), Semiconductor materials and devices (9 papers) and Diamond and Carbon-based Materials Research (8 papers). P. Hones collaborates with scholars based in Switzerland, Romania and France. P. Hones's co-authors include F. Lévy, R. Sanjinés, Matthieu Diserens, Diana Mardare, P. E. Schmid, Nicolas Martin, M. Regula, A Bally, Claudia Wiemer and Nicholas X. Randall and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Catalysis B: Environmental.

In The Last Decade

P. Hones

19 papers receiving 1.4k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
P. Hones Switzerland 17 1.1k 893 533 226 203 19 1.5k
O. Banakh Switzerland 19 906 0.8× 758 0.8× 515 1.0× 139 0.6× 79 0.4× 38 1.2k
Y. Massiani France 21 768 0.7× 425 0.5× 442 0.8× 179 0.8× 64 0.3× 46 1.1k
Vipin Chawla India 22 851 0.8× 622 0.7× 501 0.9× 264 1.2× 107 0.5× 84 1.4k
Kürşat Kazmanlı Türkiye 18 767 0.7× 664 0.7× 362 0.7× 343 1.5× 132 0.7× 55 1.2k
Da-Yung Wang Taiwan 31 1.8k 1.6× 1.8k 2.0× 475 0.9× 778 3.4× 219 1.1× 75 2.2k
O. Zywitzki Germany 18 652 0.6× 466 0.5× 494 0.9× 96 0.4× 126 0.6× 51 1.1k
P. Zeman Czechia 28 1.5k 1.4× 1.2k 1.4× 517 1.0× 714 3.2× 224 1.1× 74 2.0k
M. Morstein Switzerland 20 783 0.7× 756 0.8× 302 0.6× 309 1.4× 79 0.4× 41 1.2k
F. Mahboubi Iran 28 1.4k 1.3× 1.4k 1.6× 737 1.4× 666 2.9× 136 0.7× 82 2.1k
Xi Chu United States 11 765 0.7× 570 0.6× 372 0.7× 218 1.0× 46 0.2× 18 1.1k

Countries citing papers authored by P. Hones

Since Specialization
Citations

This map shows the geographic impact of P. Hones's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Hones with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Hones more than expected).

Fields of papers citing papers by P. Hones

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Hones. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Hones. The network helps show where P. Hones may publish in the future.

Co-authorship network of co-authors of P. Hones

This figure shows the co-authorship network connecting the top 25 collaborators of P. Hones. A scholar is included among the top collaborators of P. Hones based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Hones. P. Hones is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

19 of 19 papers shown
1.
Hones, P., et al.. (2003). Structural and mechanical properties of chromium nitride, molybdenum nitride, and tungsten nitride thin films. Journal of Physics D Applied Physics. 36(8). 1023–1029. 159 indexed citations
2.
Hones, P., et al.. (2000). MOCVD of Thin Ruthenium Oxide Films: Properties and Growth Kinetics. Chemical Vapor Deposition. 6(4). 193–198. 9 indexed citations
3.
Dumitriu, Daniela, A Bally, Christophe Ballif, et al.. (2000). Photocatalytic degradation of phenol by TiO2 thin films prepared by sputtering. Applied Catalysis B: Environmental. 25(2-3). 83–92. 144 indexed citations
4.
Hones, P.. (2000). Structural and electronic properties of transition metal nitrides with emphasis on chromium nitride based thin films. Infoscience (Ecole Polytechnique Fédérale de Lausanne). 3 indexed citations
5.
Hones, P., Matthieu Diserens, R. Sanjinés, & F. Lévy. (2000). Electronic structure and mechanical properties of hard coatings from the chromium–tungsten nitride system. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 18(6). 2851–2856. 41 indexed citations
6.
Martin, Nicolas, A Bally, P. Hones, R. Sanjinés, & F. Lévy. (2000). High rate and process control of reactive sputtering by gas pulsing: the Ti–O system. Thin Solid Films. 377-378. 550–556. 40 indexed citations
7.
Hones, P., et al.. (2000). Mechanical properties of hard chromium tungsten nitride coatings. Surface and Coatings Technology. 125(1-3). 179–184. 74 indexed citations
8.
Hones, P., et al.. (2000). Oxidation resistance of protective coatings studied by spectroscopic ellipsometry. Applied Physics Letters. 76(22). 3194–3196. 45 indexed citations
9.
Hones, P., F. Lévy, & Nicholas X. Randall. (1999). Influence of deposition parameters on mechanical properties of sputter-deposited Cr2O3 thin films. Journal of materials research/Pratt's guide to venture capital sources. 14(9). 3623–3629. 24 indexed citations
10.
Hones, P., Matthieu Diserens, & F. Lévy. (1999). Characterization of sputter-deposited chromium oxide thin films. Surface and Coatings Technology. 120-121. 277–283. 156 indexed citations
11.
Hones, P., et al.. (1999). Electronic structure and mechanical properties of resistant coatings: The chromium molybdenum nitride system. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 17(3). 1024–1030. 21 indexed citations
12.
Mardare, Diana & P. Hones. (1999). Optical dispersion analysis of TiO2 thin films based on variable-angle spectroscopic ellipsometry measurements. Materials Science and Engineering B. 68(1). 42–47. 128 indexed citations
13.
Lévy, F., P. Hones, P. E. Schmid, et al.. (1999). Electronic states and mechanical properties in transition metal nitrides. Surface and Coatings Technology. 120-121. 284–290. 104 indexed citations
14.
Bally, A, P. Hones, R. Sanjinés, P. E. Schmid, & F. Lévy. (1998). Mechanical and electrical properties of fcc TiO1+x thin films prepared by r.f. reactive sputtering. Surface and Coatings Technology. 108-109. 166–170. 57 indexed citations
15.
Hones, P., R. Sanjinés, & F. Lévy. (1998). Sputter deposited chromium nitride based ternary compounds for hard coatings. Thin Solid Films. 332(1-2). 240–246. 138 indexed citations
16.
Sanjinés, R., Claudia Wiemer, P. Hones, & F. Lévy. (1998). Chemical bonding and electronic structure in binary VNy and ternary T1−xVxNy nitrides. Journal of Applied Physics. 83(3). 1396–1402. 51 indexed citations
17.
Sanjinés, R., P. Hones, & F. Lévy. (1998). Hexagonal nitride coatings: electronic and mechanical properties of V 2 N, Cr 2 N and δ -MoN. Thin Solid Films. 332(1-2). 225–229. 79 indexed citations
18.
Hones, P., R. Sanjinés, & F. Lévy. (1997). Characterization of sputter-deposited chromium nitride thin films for hard coatings. Surface and Coatings Technology. 94-95. 398–402. 149 indexed citations
19.
Hones, P., Tobias Gerfin, & Michaël Grätzel. (1995). Spectroscopic ellipsometry of RuO2 films prepared by metalorganic chemical vapor deposition. Applied Physics Letters. 67(21). 3078–3080. 34 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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