Osamu Ishiyama
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- Copper Interconnects and Reliability 4
- Materials Chemistry top 5%
- Electronic and Structural Properties of Oxides 8
- Diamond and Carbon-based Materials Research 5
- Condensed Matter Physics top 5%
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- Semiconductor materials and devices 11
- Silicon Carbide Semiconductor Technologies 8
- Integrated Circuits and Semiconductor Failure Analysis 5
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- Ion-surface interactions and analysis 10
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- Electron and X-Ray Spectroscopy Techniques 6
In The Last Decade
Osamu Ishiyama
35 papers receiving 1.8k citations
Hit Papers
Peers
Comparison fields: 5 of 48
- Electronic, Optical and Magnetic Materials 876
- Materials Chemistry 1.5k
- Condensed Matter Physics 339
- Electrical and Electronic Engineering 851
- Atomic and Molecular Physics, and Optics 241
Countries citing papers authored by Osamu Ishiyama
This map shows the geographic impact of Osamu Ishiyama's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Osamu Ishiyama with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Osamu Ishiyama more than expected).
Fields of papers citing papers by Osamu Ishiyama
This network shows the impact of papers produced by Osamu Ishiyama. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Osamu Ishiyama. The network helps show where Osamu Ishiyama may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Osamu Ishiyama, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 2 | |
| 2 | 2024 | 1 | |
| 3 | 2022 | 2 | |
| 4 | 2017 | 3 | |
| 5 | 2014 | 11 | |
| 6 | 2014 | 11 | |
| 7 | 2014 | 17 | |
| 8 | 2013 | 47 | |
| 9 | 2013 | 5 | |
| 10 | Dopant profiling on 4H silicon carbide P[+]N junction by scanning probe and secondary electron microscopy (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan) | 2008 | 2 |
| 11 | 2004 | 7 | |
| 12 | 2001 | 26 | |
| 13 | 1997 | 5 | |
| 14 | 1996 | 0 | |
| 15 | 1996 | 8 | |
| 16 | 1995 | 98 | |
| 17 | 1995 | 34 | |
| 18 | 1994 | 94 | |
| 19 | 1993 | 6 | |
| 20 | 1991 | 31 |
About Osamu Ishiyama
Osamu Ishiyama is a scholar working on Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials and Computational Mechanics, having authored 38 papers that have together received 1.9k indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Ion-surface interactions and analysis (10 papers), Electronic and Structural Properties of Oxides (8 papers), Silicon Carbide Semiconductor Technologies (8 papers), Electron and X-Ray Spectroscopy Techniques (6 papers), Diamond and Carbon-based Materials Research (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Copper Interconnects and Reliability (4 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (876 citations), Materials Chemistry (1.5k citations) and Condensed Matter Physics (339 citations). Osamu Ishiyama has collaborated with scholars based in Japan, Germany and Canada. Frequent co-authors include Makoto Shinohara, Mamoru Yoshimoto, Tatsuro Maeda, Hideomi Koinuma, M. Kawasaki, Ryuta Tsuchiya, Kazuhiro Takahashi, Tsuyoshi Ohnishi, Momoji Kubo and Ayaho Miyamoto. Their work appears in journals such as Science, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.