O.A. Baschenko

547 total citations
17 papers, 500 citations indexed

About

O.A. Baschenko is a scholar working on Surfaces, Coatings and Films, Radiation and Electrical and Electronic Engineering. According to data from OpenAlex, O.A. Baschenko has authored 17 papers receiving a total of 500 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Surfaces, Coatings and Films, 9 papers in Radiation and 9 papers in Electrical and Electronic Engineering. Recurrent topics in O.A. Baschenko's work include Electron and X-Ray Spectroscopy Techniques (16 papers), X-ray Spectroscopy and Fluorescence Analysis (9 papers) and Advancements in Photolithography Techniques (5 papers). O.A. Baschenko is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (16 papers), X-ray Spectroscopy and Fluorescence Analysis (9 papers) and Advancements in Photolithography Techniques (5 papers). O.A. Baschenko collaborates with scholars based in Russia, Bulgaria and Czechia. O.A. Baschenko's co-authors include V. I. Nefedov, V. I. Bukhtiyarov, J. Zemek, А. И. Боронин, Hans Siegbahn, P. Jiřı́ček, G. Polzonetti, M.V. Russo, A. Furlani and В. И. Нефедов and has published in prestigious journals such as Applied Surface Science, Surface Science and Thin Solid Films.

In The Last Decade

O.A. Baschenko

17 papers receiving 445 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
O.A. Baschenko Russia 11 410 256 222 145 92 17 500
D. Varga Hungary 13 296 0.7× 208 0.8× 170 0.8× 169 1.2× 96 1.0× 42 431
Seiji Usami Japan 11 83 0.2× 50 0.2× 123 0.6× 141 1.0× 225 2.4× 45 374
K. Zeppenfeld Germany 9 156 0.4× 47 0.2× 146 0.7× 120 0.8× 249 2.7× 14 423
L. Zommer Poland 12 187 0.5× 79 0.3× 167 0.8× 113 0.8× 165 1.8× 31 372
N. Beatham United Kingdom 9 100 0.2× 58 0.2× 66 0.3× 102 0.7× 166 1.8× 11 344
C. J. Vesely United States 7 97 0.2× 42 0.2× 265 1.2× 110 0.8× 308 3.3× 12 458
S. Witzel Germany 9 116 0.3× 22 0.1× 128 0.6× 159 1.1× 260 2.8× 11 416
S. Ustaze France 12 60 0.1× 45 0.2× 89 0.4× 189 1.3× 141 1.5× 19 340
H. Bu United States 12 65 0.2× 50 0.2× 284 1.3× 112 0.8× 127 1.4× 28 493
A. B. Preobrajenski Germany 13 38 0.1× 27 0.1× 214 1.0× 132 0.9× 326 3.5× 19 483

Countries citing papers authored by O.A. Baschenko

Since Specialization
Citations

This map shows the geographic impact of O.A. Baschenko's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O.A. Baschenko with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O.A. Baschenko more than expected).

Fields of papers citing papers by O.A. Baschenko

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by O.A. Baschenko. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O.A. Baschenko. The network helps show where O.A. Baschenko may publish in the future.

Co-authorship network of co-authors of O.A. Baschenko

This figure shows the co-authorship network connecting the top 25 collaborators of O.A. Baschenko. A scholar is included among the top collaborators of O.A. Baschenko based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with O.A. Baschenko. O.A. Baschenko is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

17 of 17 papers shown
1.
Bukhtiyarov, V. I., А. И. Боронин, & O.A. Baschenko. (1994). ARXPS-BASED ANALYSIS OF DIFFERENT OXYGEN STATES ADSORBED AT SILVER FOIL. Surface Review and Letters. 1(4). 577–579. 5 indexed citations
2.
Zemek, J., et al.. (1994). Altered layer composition of sputtered InP(100) wafers: non-destructive concentration depth profiling. Surface Science. 318(3). 421–427. 10 indexed citations
3.
Baschenko, O.A., F. Iacona, Giovanni Marletta, & В. И. Нефедов. (1994). ADXPS study of the chemical structure of polyamic acid/ and polyimide/Ni interfaces. Applied Surface Science. 74(1). 27–36. 1 indexed citations
4.
Baschenko, O.A., et al.. (1993). Distribution of ions in subsurface layers of liquid solutions studied by ARXPS. Journal of Electron Spectroscopy and Related Phenomena. 62(4). 317–334. 21 indexed citations
5.
6.
Власов, А. А., et al.. (1992). Restoration of depth profiles of impurity atoms in solids based on yields of ion-excited X-rays. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 69(4). 474–478. 1 indexed citations
7.
Baschenko, O.A., V. I. Bukhtiyarov, & А. И. Боронин. (1992). ARXPS-based concentration profiles restoration applied to adsorbate/metal systems. Surface Science. 271(3). 493–500. 14 indexed citations
8.
Baschenko, O.A., et al.. (1991). The effect of elastic photoelectron scattering on depth-profiling by angular resolved X-ray photoelectron spectroscopy. Journal of Electron Spectroscopy and Related Phenomena. 57(1). 33–46. 25 indexed citations
9.
10.
Baschenko, O.A., et al.. (1991). Determination of depth-profiles in surface layers of solids by angular resolved X-ray photoelectron spectroscopy. Analytical and Bioanalytical Chemistry. 341(10). 597–600. 2 indexed citations
11.
Baschenko, O.A., et al.. (1991). Iodine incorporation into polymeric films investigated by angle-resolved XPS. Journal of Electron Spectroscopy and Related Phenomena. 56(3). 203–209. 13 indexed citations
12.
Baschenko, O.A. & V. I. Nefedov. (1990). Depth profiling of elements in surface layers of solids based on angular resolved X-ray photoelectron spectroscopy. Journal of Electron Spectroscopy and Related Phenomena. 53(1-2). 1–18. 38 indexed citations
13.
Nefedov, V. I. & O.A. Baschenko. (1988). Relative intensities in ESCA and quantitative depth profiling. Journal of Electron Spectroscopy and Related Phenomena. 47. 1–25. 54 indexed citations
14.
Baschenko, O.A., et al.. (1984). New technique for investigation of angular distribution of photoemission from solids. Demonstration of the effect of elastic scattering. Journal of Electron Spectroscopy and Related Phenomena. 34(3). 305–308. 62 indexed citations
15.
Baschenko, O.A. & V. I. Nefedov. (1982). Relative intensities in X-ray photoelectron spectra. Part IX. Estimates for photoelectron mean free paths taking into account elastic collisions in a solid. Journal of Electron Spectroscopy and Related Phenomena. 27(2). 109–118. 68 indexed citations
16.
Baschenko, O.A. & V. I. Nefedov. (1980). Relative intensities in X-ray photoelectron spectra. Journal of Electron Spectroscopy and Related Phenomena. 21(2). 153–169. 67 indexed citations
17.
Baschenko, O.A. & V. I. Nefedov. (1979). Relative intensities in x-ray photoelectron spectra. Journal of Electron Spectroscopy and Related Phenomena. 17(6). 405–420. 86 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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