O. Wehrhan

971 total citations
25 papers, 689 citations indexed

About

O. Wehrhan is a scholar working on Radiation, Condensed Matter Physics and Materials Chemistry. According to data from OpenAlex, O. Wehrhan has authored 25 papers receiving a total of 689 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Radiation, 12 papers in Condensed Matter Physics and 8 papers in Materials Chemistry. Recurrent topics in O. Wehrhan's work include Advanced X-ray Imaging Techniques (12 papers), Crystallography and Radiation Phenomena (12 papers) and X-ray Spectroscopy and Fluorescence Analysis (9 papers). O. Wehrhan is often cited by papers focused on Advanced X-ray Imaging Techniques (12 papers), Crystallography and Radiation Phenomena (12 papers) and X-ray Spectroscopy and Fluorescence Analysis (9 papers). O. Wehrhan collaborates with scholars based in Germany, United States and France. O. Wehrhan's co-authors include E. Förster, H. Mutschke, J. Dorschner, C. Jäger, Thomas Henning, D. Fabian, G. Hölzer, I. Uschmann, S. Zeidler and Th. Posch and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Physical Review A.

In The Last Decade

O. Wehrhan

24 papers receiving 665 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
O. Wehrhan Germany 12 249 247 221 167 127 25 689
E. Silver United States 13 234 0.9× 287 1.2× 392 1.8× 312 1.9× 207 1.6× 68 817
P. Meyer United States 20 370 1.5× 158 0.6× 333 1.5× 506 3.0× 90 0.7× 53 964
T. Miyachi Japan 18 194 0.8× 183 0.7× 152 0.7× 561 3.4× 37 0.3× 71 849
J.G. Pronko United States 14 232 0.9× 145 0.6× 265 1.2× 343 2.1× 49 0.4× 60 669
D. L. Matthews United States 17 204 0.8× 288 1.2× 620 2.8× 230 1.4× 260 2.0× 45 1.2k
Maximilian Hamm United States 14 165 0.7× 162 0.7× 214 1.0× 368 2.2× 16 0.1× 45 707
Robert E. Vest United States 14 129 0.5× 222 0.9× 77 0.3× 43 0.3× 43 0.3× 46 670
R. W. Hill United States 12 315 1.3× 165 0.7× 214 1.0× 225 1.3× 21 0.2× 29 644
J. N. Bradbury United States 13 295 1.2× 40 0.2× 246 1.1× 173 1.0× 186 1.5× 41 726
P. A. Amundsen Norway 19 402 1.6× 45 0.2× 450 2.0× 460 2.8× 65 0.5× 84 1.1k

Countries citing papers authored by O. Wehrhan

Since Specialization
Citations

This map shows the geographic impact of O. Wehrhan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Wehrhan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Wehrhan more than expected).

Fields of papers citing papers by O. Wehrhan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by O. Wehrhan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Wehrhan. The network helps show where O. Wehrhan may publish in the future.

Co-authorship network of co-authors of O. Wehrhan

This figure shows the co-authorship network connecting the top 25 collaborators of O. Wehrhan. A scholar is included among the top collaborators of O. Wehrhan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with O. Wehrhan. O. Wehrhan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Zastrau, U., L. B. Fletcher, E. Förster, et al.. (2014). Publisher's Note: “Bent crystal spectrometer for both frequency and wavenumber resolved x-ray scattering at a seeded free-electron laser” [Rev. Sci. Instrum. 85, 093106 (2014)]. Review of Scientific Instruments. 85(10). 2 indexed citations
2.
Zastrau, U., L. B. Fletcher, E. Förster, et al.. (2014). Bent crystal spectrometer for both frequency and wavenumber resolved x-ray scattering at a seeded free-electron laser. Review of Scientific Instruments. 85(9). 93106–93106. 4 indexed citations
3.
Schulze, Kai S., I. Uschmann, T. Kämpfer, et al.. (2014). High precision measurement of undulator polarization in the regime of hard x-rays. Applied Physics Letters. 105(2). 2 indexed citations
4.
Schulze, Kai S., I. Uschmann, T. Kämpfer, et al.. (2013). High-Precision X-Ray Polarimetry. Physical Review Letters. 110(25). 254801–254801. 66 indexed citations
5.
Zastrau, U., Colin Brown, T. Döppner, et al.. (2012). Focal aberrations of large-aperture HOPG von-Hàmos x-ray spectrometers. Journal of Instrumentation. 7(9). P09015–P09015. 20 indexed citations
6.
Zeidler, S., Th. Posch, H. Mutschke, Hans Richter, & O. Wehrhan. (2010). Near-infrared absorption properties of oxygen-rich stardust analogs. Springer Link (Chiba Institute of Technology). 72 indexed citations
7.
Kneip, S., D. R. Symes, G. Dyer, et al.. (2008). K-shell spectroscopy of plasmas created by intense laser irradiation of micron-scale pyramid and sphere targets. High Energy Density Physics. 4(1-2). 41–48. 4 indexed citations
8.
Renner, O., et al.. (2004). Vertical dispersion Johann x-ray spectrometer with asymmetrically cut crystal. Review of Scientific Instruments. 75(11). 4569–4577. 3 indexed citations
9.
Fabian, D., Thomas Henning, C. Jäger, et al.. (2001). Steps toward interstellar silicate mineralogy. Astronomy and Astrophysics. 378(1). 228–238. 189 indexed citations
10.
Renner, O., et al.. (2001). Optimized polychromatic x-ray imaging with asymmetrically cut bent crystals. Journal of Physics D Applied Physics. 34(15). 2363–2368. 15 indexed citations
11.
Bitter, M., et al.. (2001). Measurements of the integrated reflectivity of a mica crystal for different orders of reflection. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4501. 177–177. 1 indexed citations
12.
Hölzer, G., O. Wehrhan, & E. Förster. (1998). Characterization of Flat and Bent Crystals for X-ray Spectroscopy and Imaging. Crystal Research and Technology. 33(4). 555–567.
13.
Hölzer, G., O. Wehrhan, & E. Förster. (1998). Characterization of Flat and Bent Crystals for X-ray Spectroscopy and Imaging. Crystal Research and Technology. 33(4). 555–567. 26 indexed citations
14.
Hölzer, G., O. Wehrhan, E. Förster, et al.. (1998). Flat and Spherically Bent Muscovite (Mica) Crystals for X-ray Spectroscopy. Physica Scripta. 57(2). 301–309. 41 indexed citations
15.
Chukhovskiǐ, F. N., G. Hölzer, O. Wehrhan, & E. Förster. (1996). Anisotropic Elasticity Corrections for Reflection Efficiency and X-ray Standing-Wave Patterns using Bent Crystals. Journal of Applied Crystallography. 29(4). 438–445. 6 indexed citations
16.
Beiersdörfer, P., D. A. Vogel, K. J. Reed, et al.. (1996). Measurement and interpretation of the polarization of the x-ray line emission of heliumlike Fe XXV excited by an electron beam. Physical Review A. 53(6). 3974–3981. 119 indexed citations
17.
Pikuz, T. A., A. Ya. Faenov, Johannes Wolf, et al.. (1995). Measurements and calculations of flat and spherically bent mica crystals' reflectivity and using them for different applications in the spectral range 1-19 Å. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2515. 468–468. 6 indexed citations
18.
Пикуз, С. А., V. M. Romanova, T. A. Shelkovenko, et al.. (1995). Use of higher-order reflection from mica crystals in x-ray spectroscopic investigations at 0.1–0.3 nm. Quantum Electronics. 25(1). 16–18. 11 indexed citations
19.
Wehrhan, O., et al.. (1990). Three X‐ray diffraction methods for testing of large disk‐shaped or lentiform CaF2‐crystals for high‐performance optics. Crystal Research and Technology. 25(9). 1097–1102. 6 indexed citations
20.
Wehrhan, O., et al.. (1983). X‐ray double crystal diffractometer for testing of plane analyser crystals of LiF. Crystal Research and Technology. 18(12). 1595–1598. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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