Nian Cai
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- Industrial Vision Systems and Defect Detection 9
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- Digital Media Forensic Detection 4
- Chaos-based Image/Signal Encryption 3
- Image and Object Detection Techniques 3
- Media Technology top 10%
- Image Processing Techniques and Applications 6
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- Integrated Circuits and Semiconductor Failure Analysis 6
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- Advanced Measurement and Metrology Techniques 3
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- Sensor Technology and Measurement Systems 3
- Co-authors
- Han WangShaowei WengXindu ChenFeiyang LiBingo Wing‐Kuen LingGen LiuJeng‐Shyang PanYijun Liu
- Cited by
- Industrial and Manufacturing EngineeringComputer Vision and Pattern RecognitionMedia Technology
In The Last Decade
Nian Cai
19 papers receiving 307 citations
Peers
Comparison fields: 5 of 39
- Industrial and Manufacturing Engineering 205
- Computer Vision and Pattern Recognition 142
- Media Technology 52
- Electrical and Electronic Engineering 113
- Mechanical Engineering 55
Countries citing papers authored by Nian Cai
This map shows the geographic impact of Nian Cai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nian Cai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nian Cai more than expected).
Fields of papers citing papers by Nian Cai
This network shows the impact of papers produced by Nian Cai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nian Cai. The network helps show where Nian Cai may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Nian Cai, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 1 | |
| 2 | 2025 | 1 | |
| 3 | 2025 | 0 | |
| 4 | 2024 | 7 | |
| 5 | 2024 | 0 | |
| 6 | 2023 | 3 | |
| 7 | 2023 | 9 | |
| 8 | 2021 | 5 | |
| 9 | 2020 | 4 | |
| 10 | 2019 | 7 | |
| 11 | 2018 | 2 | |
| 12 | 2018 | 16 | |
| 13 | 2018 | 63 | |
| 14 | 2018 | 24 | |
| 15 | 2017 | 38 | |
| 16 | 2016 | 34 | |
| 17 | 2016 | 22 | |
| 18 | 2015 | 16 | |
| 19 | 2015 | 58 | |
| 20 | Invariability of Mean Value Based Reversible Watermarking | 2013 | 14 |
About Nian Cai
Nian Cai is a scholar working on Industrial and Manufacturing Engineering, Media Technology and Computer Vision and Pattern Recognition, having authored 21 papers that have together received 328 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (9 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Image Processing Techniques and Applications (6 papers), Digital Media Forensic Detection (4 papers), Advanced Measurement and Metrology Techniques (3 papers), Sensor Technology and Measurement Systems (3 papers), Chaos-based Image/Signal Encryption (3 papers) and Image and Object Detection Techniques (3 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (205 citations), Computer Vision and Pattern Recognition (142 citations) and Media Technology (52 citations). Nian Cai has collaborated with scholars based in China and Singapore. Frequent co-authors include Han Wang, Shaowei Weng, Xindu Chen, Feiyang Li, Bingo Wing‐Kuen Ling, Gen Liu, Jeng‐Shyang Pan, Yijun Liu, Zhijing Yang and Nannan Zhu. Their work appears in journals such as Expert Systems with Applications, IEEE Transactions on Circuits and Systems for Video Technology and IEEE Transactions on Instrumentation and Measurement.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.