Mounira Berkani

1.0k total citations · 1 hit paper
24 papers, 775 citations indexed

About

Mounira Berkani is a scholar working on Electrical and Electronic Engineering, Surgery and Pulmonary and Respiratory Medicine. According to data from OpenAlex, Mounira Berkani has authored 24 papers receiving a total of 775 indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Electrical and Electronic Engineering, 2 papers in Surgery and 2 papers in Pulmonary and Respiratory Medicine. Recurrent topics in Mounira Berkani's work include Silicon Carbide Semiconductor Technologies (18 papers), Semiconductor materials and devices (11 papers) and Advancements in Semiconductor Devices and Circuit Design (5 papers). Mounira Berkani is often cited by papers focused on Silicon Carbide Semiconductor Technologies (18 papers), Semiconductor materials and devices (11 papers) and Advancements in Semiconductor Devices and Circuit Design (5 papers). Mounira Berkani collaborates with scholars based in France, Tanzania and Tunisia. Mounira Berkani's co-authors include Zoubir Khatir, Sébastien Lefebvre, J.-J. Huselstein, Frédéric Richardeau, F. Forest, Vanessa Smet, Ali Ibrahim, Stéphane Lefebvre, Z. Khatir and André Capderou and has published in prestigious journals such as IEEE Transactions on Industrial Electronics, IEEE Transactions on Power Electronics and European Respiratory Journal.

In The Last Decade

Mounira Berkani

24 papers receiving 746 citations

Hit Papers

Ageing and Failure Modes of IGBT Modules in High-Temperat... 2011 2026 2016 2021 2011 100 200 300 400

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Mounira Berkani France 10 672 65 47 47 39 24 775
Vincent W. Antonetti United States 9 77 0.1× 143 2.2× 9 0.2× 26 0.6× 4 0.1× 11 290
G. Mitić Germany 12 371 0.6× 99 1.5× 18 0.4× 26 0.6× 28 579
Chingchi Chen United States 17 866 1.3× 49 0.8× 119 2.5× 2 0.0× 62 955
Huaping Jiang China 19 1.2k 1.8× 112 1.7× 70 1.5× 2 0.0× 77 1.2k
Koichi Kibe Japan 12 309 0.5× 53 0.8× 31 0.7× 3 0.1× 20 470
Bo Yuan China 15 181 0.3× 367 5.6× 27 0.6× 10 0.2× 54 636
Marcus Schukar Germany 11 416 0.6× 28 0.4× 6 0.1× 6 0.1× 1 0.0× 35 585
Yuxiang Chen United States 14 543 0.8× 104 1.6× 44 0.9× 35 589

Countries citing papers authored by Mounira Berkani

Since Specialization
Citations

This map shows the geographic impact of Mounira Berkani's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mounira Berkani with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mounira Berkani more than expected).

Fields of papers citing papers by Mounira Berkani

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mounira Berkani. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mounira Berkani. The network helps show where Mounira Berkani may publish in the future.

Co-authorship network of co-authors of Mounira Berkani

This figure shows the co-authorship network connecting the top 25 collaborators of Mounira Berkani. A scholar is included among the top collaborators of Mounira Berkani based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Mounira Berkani. Mounira Berkani is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Chamoin, Ludovic, et al.. (2022). Iterative PGD model reduction for the strongly-coupled thermomechanical analysis of crack propagation in power electronic modules. Computational Mechanics. 70(2). 407–424. 1 indexed citations
2.
Khatir, Zoubir, et al.. (2022). Microstructural evolution during the crack propagation at the bond-wire contact area of IGBT power modules upon power cycling. Microelectronics Reliability. 138. 114635–114635. 2 indexed citations
3.
Khatir, Zoubir, et al.. (2022). A combined physicochemical-microstructural approach to predict the crack path at the topside interconnections in IGBT power devices. Microelectronics Reliability. 132. 114516–114516. 7 indexed citations
4.
Chamoin, Ludovic, et al.. (2022). A Reduced Model Based on Proper Generalized Decomposition for the Fast Analysis of IGBT Power Modules Lifetime. Journal of Electronic Packaging. 144(3). 3 indexed citations
5.
Berkani, Mounira, et al.. (2020). Reliability study of PCB-embedded power dies using solderless pressed metal foam. Microelectronics Reliability. 114. 113904–113904. 3 indexed citations
6.
Berkani, Mounira, et al.. (2018). Aluminum metallization and wire bonding aging in power MOSFET modules. Materials Today Proceedings. 5(6). 14641–14651. 12 indexed citations
7.
Berkani, Mounira, et al.. (2017). Mechanisms of power module source metal degradation during electro-thermal aging. Microelectronics Reliability. 76-77. 507–511. 7 indexed citations
8.
Ruffilli, Roberta, et al.. (2015). In-depth investigation of metallization aging in power MOSFETs. Microelectronics Reliability. 55(9-10). 1966–1970. 11 indexed citations
9.
Lefebvre, Stéphane, et al.. (2014). Distributed and coupled 2D electro-thermal model of power semiconductor devices. The European Physical Journal Applied Physics. 66(2). 20102–20102. 2 indexed citations
10.
Lefebvre, Stéphane, et al.. (2013). Robustness of 1.2kV SiC MOSFET devices. Microelectronics Reliability. 53(9-11). 1735–1738. 52 indexed citations
11.
Berkani, Mounira, Sébastien Lefebvre, & Zoubir Khatir. (2012). Saturation Current and On-Resistance Correlation during During Repetitive Short-Circuit Conditions on SiC JFET Transistors. IEEE Transactions on Power Electronics. 28(2). 621–624. 11 indexed citations
12.
Berkani, Mounira, et al.. (2012). Comparison study on performances and robustness between SiC MOSFET & JFET devices – Abilities for aeronautics application. Microelectronics Reliability. 52(9-10). 1859–1864. 35 indexed citations
13.
Kociniewski, T., et al.. (2012). New Investigation Possibilities on Forward Biased Power Devices Using Cross Sections. IEEE Electron Device Letters. 33(4). 576–578. 4 indexed citations
14.
Smet, Vanessa, F. Forest, J.-J. Huselstein, et al.. (2011). Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling. IEEE Transactions on Industrial Electronics. 58(10). 4931–4941. 489 indexed citations breakdown →
15.
Oukaour, Amrane, et al.. (2010). Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. Microelectronics Reliability. 51(2). 386–391. 36 indexed citations
16.
Capderou, André, Mounira Berkani, M.H. Becquemin, & Marc Zelter. (2010). Reconsidering the arm span–height relationship in patients referred for spirometry. European Respiratory Journal. 37(1). 157–163. 18 indexed citations
17.
Berkani, Mounira, et al.. (2010). Ageing of SiC JFET transistors under repetitive current limitation conditions. Microelectronics Reliability. 50(9-11). 1532–1537. 12 indexed citations
18.
Berkani, Mounira, et al.. (2009). Estimation of SiC JFET temperature during short-circuit operations. Microelectronics Reliability. 49(9-11). 1358–1362. 4 indexed citations
19.
Berkani, Mounira, Frédéric Lofaso, C. Chouaïd, et al.. (1998). CPAP titration by an auto-CPAP device based on snoring detection: a clinical trial and economic considerations. European Respiratory Journal. 12(4). 759–763. 43 indexed citations
20.
Berkani, Mounira, et al.. (1986). [Results of a therapeutic trial comparing a 6-month regimen to a 12-month regimen in the treatment of pulmonary tuberculosis in the Algerian Sahara. Final report: results 3 years after the onset of treatment].. PubMed. 3(2). 73–85. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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