Mirjam Witthaut

423 total citations
12 papers, 384 citations indexed

About

Mirjam Witthaut is a scholar working on Mechanics of Materials, Electrical and Electronic Engineering and Condensed Matter Physics. According to data from OpenAlex, Mirjam Witthaut has authored 12 papers receiving a total of 384 indexed citations (citations by other indexed papers that have themselves been cited), including 9 papers in Mechanics of Materials, 8 papers in Electrical and Electronic Engineering and 4 papers in Condensed Matter Physics. Recurrent topics in Mirjam Witthaut's work include Metal and Thin Film Mechanics (9 papers), Semiconductor materials and devices (7 papers) and GaN-based semiconductor devices and materials (4 papers). Mirjam Witthaut is often cited by papers focused on Metal and Thin Film Mechanics (9 papers), Semiconductor materials and devices (7 papers) and GaN-based semiconductor devices and materials (4 papers). Mirjam Witthaut collaborates with scholars based in Germany. Mirjam Witthaut's co-authors include R. Cremer, D. Neuschütz, T. Leyendecker, G. Erkens, C. Trappe, Martin Laurenzis, H. Kurz and Edwin Zimmermann and has published in prestigious journals such as Thin Solid Films, Surface and Coatings Technology and Surface and Interface Analysis.

In The Last Decade

Mirjam Witthaut

12 papers receiving 369 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Mirjam Witthaut Germany	10	237	237	169	98	86	12	384
Denis Kurapov Germany	12	324 1.4×	279 1.2×	137 0.8×	59 0.6×	94 1.1×	13	384
Fred Fietzke Germany	10	322 1.4×	247 1.0×	213 1.3×	67 0.7×	73 0.8×	21	431
J. S. Chun United States	10	227 1.0×	202 0.9×	125 0.7×	54 0.6×	159 1.8×	16	402
Katsuya Akamatsu Japan	12	300 1.3×	304 1.3×	101 0.6×	38 0.4×	177 2.1×	30	454
Markus Pohler Austria	15	475 2.0×	392 1.7×	118 0.7×	79 0.8×	163 1.9×	30	533
F. Nahif Germany	11	339 1.4×	261 1.1×	135 0.8×	66 0.7×	182 2.1×	16	473
J. Hangas United States	10	93 0.4×	180 0.8×	129 0.8×	72 0.7×	227 2.6×	24	412
P. Rödhammer Austria	8	283 1.2×	306 1.3×	66 0.4×	30 0.3×	111 1.3×	11	376
Rongtie Huang China	12	159 0.7×	220 0.9×	67 0.4×	129 1.3×	160 1.9×	36	389
M. Ahlgren Sweden	13	340 1.4×	426 1.8×	97 0.6×	32 0.3×	160 1.9×	32	525

Countries citing papers authored by Mirjam Witthaut

Since Specialization

Citations

This map shows the geographic impact of Mirjam Witthaut's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mirjam Witthaut with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mirjam Witthaut more than expected).

Fields of papers citing papers by Mirjam Witthaut

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mirjam Witthaut. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mirjam Witthaut. The network helps show where Mirjam Witthaut may publish in the future.

Co-authorship network of co-authors of Mirjam Witthaut

This figure shows the co-authorship network connecting the top 25 collaborators of Mirjam Witthaut. A scholar is included among the top collaborators of Mirjam Witthaut based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Mirjam Witthaut. Mirjam Witthaut is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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12 of 12 papers shown

Witthaut, Mirjam, et al.. (2000). Characterization of ternary Al–B–N films. Thin Solid Films. 377-378. 478–483. 15 indexed citations

Witthaut, Mirjam, et al.. (2000). Electron spectroscopy of single-phase (Al,B)N films. Surface and Interface Analysis. 30(1). 580–584. 17 indexed citations

Witthaut, Mirjam, et al.. (2000). Preparation of Cr 2 O 3 -Al 2 O 3 Solid Solutions by Reactive Magnetron Sputtering. Microchimica Acta. 133(1-4). 191–196. 54 indexed citations

Cremer, R., et al.. (2000). Deposition and Characterization of Metastable Cu 3 N Layers for Applications in Optical Data Storage. Microchimica Acta. 133(1-4). 299–302. 69 indexed citations

Cremer, R., Mirjam Witthaut, & D. Neuschütz. (1999). Electron spectroscopy applied to metastable ceramic solution phases. Fresenius Journal of Analytical Chemistry. 365(1-3). 28–37. 5 indexed citations

Cremer, R., et al.. (1999). Comparative characterization of alumina coatings deposited by RF, DC and pulsed reactive magnetron sputtering. Surface and Coatings Technology. 120-121. 213–218. 77 indexed citations

Cremer, R., et al.. (1999). Surface and interface analysis of PVD Al-O-N and γ-Al 2 O 3 diffusion barriers. Fresenius Journal of Analytical Chemistry. 365(1-3). 158–162. 14 indexed citations

Zimmermann, Edwin, et al.. (1998). Interdiffusion paths in the diffusion couple Ti-SiC. RWTH Publications (RWTH Aachen). 5 indexed citations

Cremer, R., et al.. (1998). Determination of the cubic to hexagonal structure transition in the metastable system TiN-AlN. Fresenius Journal of Analytical Chemistry. 361(6-7). 642–645. 14 indexed citations

10.

Cremer, R., et al.. (1998). Composition, binding states, structure, and morphology of the corrosion layer of an oxidized Ti0.46Al0.54N film. Thin Solid Films. 312(1-2). 190–194. 28 indexed citations

11.

Cremer, R., et al.. (1998). Thermal stability of Al–O–N PVD diffusion barriers. Surface and Coatings Technology. 108-109. 48–58. 70 indexed citations

12.

Witthaut, Mirjam, et al.. (1998). Improvement of the oxidation behavior of Ti 1-x Al x N hard coatings by optimization of the Ti/Al ratio. Fresenius Journal of Analytical Chemistry. 361(6-7). 639–641. 16 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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