Min-Sun Keel

761 citations
19 papers · 496 · h-index 10

Impact in

Papers in

    • CCD and CMOS Imaging Sensors 7
    • Electrostatic Discharge in Electronics 7
    • Integrated Circuits and Semiconductor Failure Analysis 5
    • Semiconductor materials and devices 5
    • Advanced Memory and Neural Computing 3
    • Radio Frequency Integrated Circuit Design 3
    • Advancements in PLL and VCO Technologies 3
    • Advanced Optical Sensing Technologies 5

Min-Sun Keel

18 papers receiving 468 citations

Peers

Min-Sun Keel
Comparison fields: 5 of 29
  • Instrumentation 68
  • Hardware and Architecture 62
  • Electrical and Electronic Engineering 428
  • Bioengineering 18
  • Ophthalmology 24
Replace J. Doernberg with:
J. Doernberg United States
R.J. van de Plassche Netherlands
Minkyu Song South Korea
Pavan Kumar Hanumolu United States
Khosrow Hajsadeghi Iran
Chorng-Sii Hwang Taiwan
Mozhgan Mansuri United States
Takuji Miki Japan
Lei Xue China
G. Wegmann Switzerland
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Citations per field
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Citations per year

Countries citing papers authored by Min-Sun Keel

Since Specialization
Citations

This map shows the geographic impact of Min-Sun Keel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Min-Sun Keel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Min-Sun Keel more than expected).

Fields of papers citing papers by Min-Sun Keel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Min-Sun Keel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Min-Sun Keel. The network helps show where Min-Sun Keel may publish in the future.

Co-authors

The 25 scholars most cited alongside Min-Sun Keel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Min-Sun Keel Line = papers co-authored together Min-Sun Keel links everyone, so they are left out of the graph.

All Works

19 of 19 papers shown
#Work
1 2000192
2 2014128
3 202126
4 201523
5 201521
6 201916
7 202115
8 201612
9
Custom test chip for system-level ESD investigations
201412
10 202012
11 20209
12 20129
13 20158
14 20166
15 20162
16
ESD-resilient active biasing scheme for high-speed SSTL I/Os
20132
17 20192
18
Design of reliable and energy-efficient high-speed interface circuits
20151
19 20250

About Min-Sun Keel

Min-Sun Keel is a scholar working on Electrical and Electronic Engineering, Instrumentation, Bioengineering, Ophthalmology and Cognitive Neuroscience, having authored 19 papers that have together received 496 indexed citations. Recurring topics across this work include CCD and CMOS Imaging Sensors (7 papers), Electrostatic Discharge in Electronics (7 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Advanced Optical Sensing Technologies (5 papers), Semiconductor materials and devices (5 papers), Advanced Memory and Neural Computing (3 papers), Radio Frequency Integrated Circuit Design (3 papers) and Advancements in PLL and VCO Technologies (3 papers). The work is most often cited by research in Instrumentation (68 citations), Hardware and Architecture (62 citations), Electrical and Electronic Engineering (428 citations), Bioengineering (18 citations) and Ophthalmology (24 citations). Min-Sun Keel has collaborated with scholars based in United States, South Korea and Egypt. Frequent co-authors include Suki Kim, Jae‐Shin Lee, Naresh R. Shanbhag, Mingu Kang, Sean Eilert, Elyse Rosenbaum, Sujan K. Gonugondla, Young-Gu Jin, Youngchan Kim and JungChak Ahn. Their work appears in journals such as IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Circuits and Systems I Regular Papers, IEEE Sensors Journal, Electronics Letters and IEEE Journal of Solid-State Circuits.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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