Max Haider

867 total citations
21 papers, 591 citations indexed

About

Max Haider is a scholar working on Surfaces, Coatings and Films, Structural Biology and Radiation. According to data from OpenAlex, Max Haider has authored 21 papers receiving a total of 591 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Surfaces, Coatings and Films, 18 papers in Structural Biology and 6 papers in Radiation. Recurrent topics in Max Haider's work include Electron and X-Ray Spectroscopy Techniques (19 papers), Advanced Electron Microscopy Techniques and Applications (18 papers) and Advanced X-ray Imaging Techniques (6 papers). Max Haider is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (19 papers), Advanced Electron Microscopy Techniques and Applications (18 papers) and Advanced X-ray Imaging Techniques (6 papers). Max Haider collaborates with scholars based in Germany, United Kingdom and Japan. Max Haider's co-authors include Stephan Uhlemann, Harald Rose, B. Kabius, K. Urban, Heiko Müller, Joachim Zach, Peter Hartel, Martin Linck, Felix Börrnert and Maarten Bischoff and has published in prestigious journals such as Physical Review Letters, Ultramicroscopy and Microscopy and Microanalysis.

In The Last Decade

Max Haider

18 papers receiving 571 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Max Haider Germany 7 348 298 152 152 112 21 591
Daniele Zanaga Belgium 15 108 0.3× 99 0.3× 442 2.9× 146 1.0× 22 0.2× 19 736
Sylvain Labouré France 9 66 0.2× 54 0.2× 168 1.1× 83 0.5× 186 1.7× 15 506
Wilbur C. Bigelow United States 12 138 0.4× 121 0.4× 229 1.5× 54 0.4× 11 0.1× 28 571
Ioanna Mantouvalou Germany 20 34 0.1× 214 0.7× 167 1.1× 67 0.4× 686 6.1× 62 1.2k
Cyril Guilloud France 6 53 0.2× 43 0.1× 116 0.8× 63 0.4× 118 1.1× 7 318
Francesco Tatti Italy 9 95 0.3× 65 0.2× 69 0.5× 92 0.6× 11 0.1× 24 343
F. Cerrina United States 16 27 0.1× 163 0.5× 178 1.2× 458 3.0× 171 1.5× 45 907
Misjaël N. Lebbink Netherlands 9 147 0.4× 92 0.3× 83 0.5× 45 0.3× 12 0.1× 11 392
Y. Dabin France 8 45 0.1× 40 0.1× 163 1.1× 80 0.5× 113 1.0× 16 435
M Hayles Netherlands 8 169 0.5× 133 0.4× 36 0.2× 51 0.3× 49 0.4× 9 320

Countries citing papers authored by Max Haider

Since Specialization
Citations

This map shows the geographic impact of Max Haider's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Max Haider with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Max Haider more than expected).

Fields of papers citing papers by Max Haider

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Max Haider. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Max Haider. The network helps show where Max Haider may publish in the future.

Co-authorship network of co-authors of Max Haider

This figure shows the co-authorship network connecting the top 25 collaborators of Max Haider. A scholar is included among the top collaborators of Max Haider based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Max Haider. Max Haider is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Watanabe, Masashi, Giulio Guzzinati, Martin Linck, et al.. (2024). Instrument Optimization of a High-Energy Electron Energy-loss Spectrometry System in an Aberration-Corrected Scanning Transmission Electron Microscope. Microscopy and Microanalysis. 30(Supplement_1). 1 indexed citations
2.
Watanabe, Masashi, Giulio Guzzinati, Martin Linck, et al.. (2023). Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope. Microscopy and Microanalysis. 29(Supplement_1). 416–417. 1 indexed citations
3.
Linck, Martin, et al.. (2020). On the Benefit of Aberration Correction in Cryo Electron Microscopy. Microscopy and Microanalysis. 26(S2). 2156–2157. 2 indexed citations
4.
Linck, Martin, Peter Hartel, Stephan Uhlemann, et al.. (2016). Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV. Physical Review Letters. 117(7). 76101–76101. 95 indexed citations
5.
Börrnert, Felix, Heiko Müller, Thomas Riedel, et al.. (2014). A flexible multi-stimuli in situ (S)TEM: Concept, optical performance, and outlook. Ultramicroscopy. 151. 31–36. 5 indexed citations
6.
Uhlemann, Stephan, Heiko Müller, Joachim Zach, & Max Haider. (2014). Thermal magnetic field noise: Electron optics and decoherence. Ultramicroscopy. 151. 199–210. 16 indexed citations
7.
Haider, Max, Stephan Uhlemann, Peter Hartel, & Heiko Müller. (2014). Towards High Resolution in TEM and STEM: What are the Limitations and Achievements. Microscopy and Microanalysis. 20(S3). 378–379. 1 indexed citations
8.
Müller, Heiko, Stephan Uhlemann, Peter Hartel, Joachim Zach, & Max Haider. (2014). Overview of Commercially Available CEOS Hexapole-type Aberration Correctors. Microscopy and Microanalysis. 20(S3). 934–935. 2 indexed citations
9.
Hartel, Peter, et al.. (2014). On Proper Phase Contrast Imaging in Aberration Corrected TEM. Microscopy and Microanalysis. 20(S3). 926–927. 2 indexed citations
10.
Uhlemann, Stephan, Heiko Müller, Peter Hartel, Joachim Zach, & Max Haider. (2013). Thermal Magnetic Field Noise Limits Resolution in Transmission Electron Microscopy. Physical Review Letters. 111(4). 46101–46101. 72 indexed citations
11.
Haider, Max, et al.. (2010). Advances in Environmental Research. 77 indexed citations
12.
Lichte, Hannes, Dorin Geiger, Michael H. Lehmann, Max Haider, & Bert Freitag. (2004). Electron Holography with Cs-corrected TEM. Microscopy and Microanalysis. 10(S03). 40–41.
13.
Haider, Max & Heiko Müller. (2004). Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens. Microscopy and Microanalysis. 10(S03). 2–3. 1 indexed citations
14.
Sawada, Hidetaka, Takeshi Tomita, Peter Hartel, et al.. (2004). Cs Corrector for Illumination. Microscopy and Microanalysis. 10(S02). 1004–1005. 1 indexed citations
15.
Lichte, Hannes, Dorin Geiger, Michael Lehmann, Max Haider, & Bert Freitag. (2004). Electron Holography with Cs-corrected TEM. Microscopy and Microanalysis. 10(S02). 112–113. 2 indexed citations
16.
Benner, G., et al.. (2003). State of the first aberration-corrected, monochromized 200kV FEG-TEM. Microscopy and Microanalysis. 9(S02). 938–939. 2 indexed citations
17.
Benner, G., et al.. (2003). State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM. Microscopy and Microanalysis. 9(S03). 38–39. 4 indexed citations
18.
Kabius, B., et al.. (2002). First application of a spherical‐aberration corrected transmission electron microscope in materials science. Journal of Electron Microscopy. 51(suppl 1). S51–S58. 18 indexed citations
19.
Uhlemann, Stephan & Max Haider. (2002). Experimental Set-up of a Purely Electrostatic Monochromator for High Resolution and Analytical Purposes of a 200 KV TEM. Microscopy and Microanalysis. 8(S02). 584–585. 8 indexed citations
20.
Haider, Max, et al.. (1998). A spherical-aberration-corrected 200kV transmission electron microscope. Ultramicroscopy. 75(1). 53–60. 281 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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