Matthias R. Schweizer
- Atomic and Molecular Physics, and Optics top 10%
- Instrumentation top 5%
- Electrical and Electronic Engineering
- Computer Vision and Pattern Recognition top 10%
- Electronic, Optical and Magnetic Materials
- Co-authors
- B. HillebrandsThierry OggierPeter MetzlerR. KaufmannMichael RichterMichael LehmannNicolas BlancSascha Keller
- Topics
- Magnetic properties of thin films (6 papers)Quantum and electron transport phenomena (5 papers)Advanced Optical Sensing Technologies (4 papers)
- Cited by
- InstrumentationAtomic and Molecular Physics, and OpticsComputer Vision and Pattern Recognition
- Partner nations
- GermanySwitzerlandUnited States
In The Last Decade
Matthias R. Schweizer
14 papers receiving 372 citations
Peers
Comparison fields: 5 of 54
- Atomic and Molecular Physics, and Optics 174
- Instrumentation 126
- Electrical and Electronic Engineering 115
- Computer Vision and Pattern Recognition 108
- Electronic, Optical and Magnetic Materials 70
Countries citing papers authored by Matthias R. Schweizer
This map shows the geographic impact of Matthias R. Schweizer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Matthias R. Schweizer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Matthias R. Schweizer more than expected).
Fields of papers citing papers by Matthias R. Schweizer
This network shows the impact of papers produced by Matthias R. Schweizer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Matthias R. Schweizer. The network helps show where Matthias R. Schweizer may publish in the future.
Co-authorship network of co-authors of Matthias R. Schweizer
This figure shows the co-authorship network connecting the top 25 collaborators of Matthias R. Schweizer. A scholar is included among the top collaborators of Matthias R. Schweizer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Matthias R. Schweizer. Matthias R. Schweizer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 4 | |
| 5 | 3 | |
| 6 | 35 | |
| 7 | 28 | |
| 8 | 65 | |
| 9 | 27 | |
| 10 | 7 | |
| 11 | 29 | |
| 12 | 171 | |
| 13 | 8 | |
| 14 | 14 |
About Matthias R. Schweizer
Matthias R. Schweizer is a scholar working on Instrumentation, Atomic and Molecular Physics, and Optics and Media Technology, having authored 14 papers that have together received 397 indexed citations. Recurring topics across this work include Magnetic properties of thin films (6 papers), Quantum and electron transport phenomena (5 papers) and Advanced Optical Sensing Technologies (4 papers). The work is most often cited by research in Instrumentation (126 citations), Atomic and Molecular Physics, and Optics (174 citations) and Computer Vision and Pattern Recognition (108 citations). Matthias R. Schweizer has collaborated with scholars based in Germany, Switzerland and United States. Frequent co-authors include B. Hillebrands, Thierry Oggier, Peter Metzler, R. Kaufmann, Michael Richter, Michael Lehmann, Nicolas Blanc, Sascha Keller, Felix Lustenberger and Evangelos Th. Papaioannou. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Physics Condensed Matter.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.