M. Wahl

547 total citations
43 papers, 320 citations indexed

About

M. Wahl is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering. According to data from OpenAlex, M. Wahl has authored 43 papers receiving a total of 320 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Hardware and Architecture, 10 papers in Electrical and Electronic Engineering and 9 papers in Industrial and Manufacturing Engineering. Recurrent topics in M. Wahl's work include VLSI and Analog Circuit Testing (11 papers), Manufacturing Process and Optimization (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). M. Wahl is often cited by papers focused on VLSI and Analog Circuit Testing (11 papers), Manufacturing Process and Optimization (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). M. Wahl collaborates with scholars based in Germany, United States and Netherlands. M. Wahl's co-authors include Ulrich Bröckel, H. J. Feise, Lothar Brendel, Stefan Trapp, Michael Bottlinger, Bernhard H. Weigl, J. Schwedes, Roland Ulber, K. Scherer and Peter Conradi and has published in prestigious journals such as International Journal of Production Research, Materials and Powder Technology.

In The Last Decade

M. Wahl

34 papers receiving 303 citations

Peers

M. Wahl
M. Wahl
Citations per year, relative to M. Wahl M. Wahl (= 1×) peers Giovanni Petrecca

Countries citing papers authored by M. Wahl

Since Specialization
Citations

This map shows the geographic impact of M. Wahl's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Wahl with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Wahl more than expected).

Fields of papers citing papers by M. Wahl

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Wahl. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Wahl. The network helps show where M. Wahl may publish in the future.

Co-authorship network of co-authors of M. Wahl

This figure shows the co-authorship network connecting the top 25 collaborators of M. Wahl. A scholar is included among the top collaborators of M. Wahl based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Wahl. M. Wahl is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wahl, M., et al.. (2025). Yield prediction in semiconductor manufacturing using two-step machine learning. International Journal of Production Research. 1–18.
2.
Scherer, K., et al.. (2022). Optimizing Luminous Transmittance of a Three-Dimensional-Printed Fixed Bed Photobioreactor. 3D Printing and Additive Manufacturing. 11(2). 467–475. 2 indexed citations
3.
Scherer, K., et al.. (2022). Influence of wettability and surface design on the adhesion of terrestrial cyanobacteria to additive manufactured biocarriers. Bioprocess and Biosystems Engineering. 45(5). 931–941. 9 indexed citations
4.
Wahl, M., et al.. (2022). Strength Properties of 316L and 17-4 PH Stainless Steel Produced with Additive Manufacturing. Materials. 15(18). 6278–6278. 50 indexed citations
6.
Scherer, K., Judith Stiefelmaier, Dorina Strieth, M. Wahl, & Roland Ulber. (2020). Development of a lightweight multi-skin sheet photobioreactor for future cultivation of phototrophic biofilms on facades. Journal of Biotechnology. 320. 28–35. 10 indexed citations
7.
Wahl, M., et al.. (2019). Einfluss einer zusätzlichen Glasscheibe auf ein optisches 3D-Messsystem. tm - Technisches Messen. 87(7-8). 477–494.
8.
Stiefelmaier, Judith, Dorina Strieth, K. Scherer, M. Wahl, & Roland Ulber. (2018). Kultivierung terrestrischer Cyanobakterien in emersen Photobioreaktoren. Chemie Ingenieur Technik. 90(9). 1256–1256.
9.
Vermeulen, Bart, et al.. (2014). Startup error detection and containment to improve the robustness of hybrid FlexRay networks. Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014. 1–6. 1 indexed citations
10.
Wahl, M., et al.. (2006). Verbackungsverhalten von Harnstoffprills. Chemie Ingenieur Technik. 78(6). 743–746. 1 indexed citations
11.
Brendel, Lothar, et al.. (2006). Modeling of Caked Contacts in DEMs. Chemical Engineering & Technology. 29(11). 1355–1359. 6 indexed citations
12.
Brück, Rainer, et al.. (2006). A MEMS-EDA-methodology Based On Process Management. 198–201. 1 indexed citations
13.
Bröckel, Ulrich, et al.. (2006). Formation and Growth of Crystal Bridges in Bulk Solids. Chemical Engineering & Technology. 29(6). 691–695. 38 indexed citations
14.
Wahl, M., et al.. (2004). The P1500 DFT disclosure document: a standard to communicate mergeable core DFT data. 1. 998–1007. 1 indexed citations
15.
Wahl, M., et al.. (2002). A model based universal cost optimizer. 55–59. 1 indexed citations
16.
Wahl, M., et al.. (2001). From DFT to systems test-a model based cost optimisation tool. Design, Automation, and Test in Europe. 302–306. 1 indexed citations
17.
Wahl, M., et al.. (2000). The VHDL Reference: A Practical Guide to Computer-Aided Integrated Circuit Design including VHDL-AMS. 15 indexed citations
18.
Riedel, Till, et al.. (1999). Effective testability design for the product life-cycle. 607–612. 2 indexed citations
19.
Conradi, Peter, et al.. (1998). A systematic analysis of reuse strategies for design of electronic circuits. Design, Automation, and Test in Europe. 292–296. 13 indexed citations
20.
Pfeifer, Johannes, et al.. (1989). Data exchange formats for testing. Microprocessing and Microprogramming. 27(1-5). 687–693. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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