M. Vanzi

2.5k citations

116 papers · 1.8k indexed · 1 hit paper · h-index 17

Impact in

Structural Biology top 1%
- Advanced Electron Microscopy Techniques and Applications
Condensed Matter Physics top 5%
- GaN-based semiconductor devices and materials

Papers in ⓘ

Electrical and Electronic Engineering 94
- Semiconductor materials and devices 34
- Integrated Circuits and Semiconductor Failure Analysis 31
- Advancements in Semiconductor Devices and Circuit Design 17
- Semiconductor Lasers and Optical Devices 15
- Electrostatic Discharge in Electronics 13
Atomic and Molecular Physics, and Optics 43
- Semiconductor Quantum Structures and Devices 27
- Semiconductor materials and interfaces 12

Co-authors: C. Lombardi (4 shared papers)Stefano Manzini (1 shared paper)Antonio Saporito (1 shared paper)G. Mura (44 shared papers)Enrico Zanoni (24 shared papers)Gaudenzio Meneghesso (19 shared papers)Matteo Meneghini (13 shared papers)F. Fantini (17 shared papers)
Journals: Microelectronics Reliability (41 papers)Electronics Letters (3 papers)IEEE Transactions on Device and Materials Reliability (3 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (3 papers)IEEE Transactions on Electron Devices (3 papers)
Partner nations: Italy France United States

In The Last Decade

M. Vanzi

108 papers receiving 1.7k citations

Hit Papers

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A physically based mobility model for numerical simulation of nonplanar devices 1988 · 592 citations

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if any of the following hold:

it has ≥500 total citations;
it reaches ≥1.5× the top-1% citation threshold for papers in the same subfield and year (the threshold is the minimum needed to enter the top 1%, not the average within it);
it reaches the top citation threshold in at least one of its specific research topics.

1988 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Peers

Countries citing papers authored by M. Vanzi

Since Specialization

Citations

This map shows the geographic impact of M. Vanzi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Vanzi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Vanzi more than expected).

Fields of papers citing papers by M. Vanzi

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Vanzi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Vanzi. The network helps show where M. Vanzi may publish in the future.

Co-authors

The 25 scholars most cited alongside M. Vanzi, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Vanzi Line = papers co-authored together M. Vanzi links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 116 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	A physically based mobility model for numerical simulation of nonplanar devices IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·C. Lombardi, Stefano Manzini, Antonio Saporito, M. Vanzi Hit paper breakdown →	1988	592
2	Accelerated Life Test of High Brightness Light Emitting Diodes IEEE Transactions on Device and Materials Reliability ·Lorenzo Roberto Trevisanello, Matteo Meneghini, G. Mura, M. Vanzi, M. Pavesi, Gaudenzio Meneghesso, Enrico Zanoni	2008	122
3	Electron Holographic Observations of the Electrostatic Field Associated with Thin Reverse-Biasedp−nJunctions Physical Review Letters ·Stefano Frabboni, Gioṙgio Matteucci, Giulio Pozzi, M. Vanzi	1985	115
4	High temperature electro-optical degradation of InGaN/GaN HBLEDs Microelectronics Reliability ·Matteo Meneghini, Lorenzo Roberto Trevisanello, Carla Sanna, G. Mura, M. Vanzi, Gaudenzio Meneghesso, Enrico Zanoni	2007	63
5	Electron holography of long-range electric and magnetic fields Journal of Applied Physics ·Giorgio Matteucci, G.F. Missiroli, E. Nichelatti, A. Migliori, M. Vanzi, Giulio Pozzi	1991	58
6	Failure Analysis-assisted FMEA Microelectronics Reliability ·G. Cassanelli, G. Mura, F. Fantini, M. Vanzi, Bernard Plano	2006	53
7	Phosphors for LED-based light sources: Thermal properties and reliability issues Microelectronics Reliability ·M. Dal Lago, Matteo Meneghini, Nicola Trivellin, G. Mura, M. Vanzi, Gaudenzio Meneghesso, Enrico Zanoni	2012	51
8	Failure Modes and Mechanisms of DC-Aged GaN LEDs physica status solidi (a) ·Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, S. Podda, G. Mura, M. Vanzi, A. Cavallini, A. Castaldini, S. Du, I. Eliashevich	2002	45
9	Chip and package-related degradation of high power white LEDs Microelectronics Reliability ·Matteo Meneghini, M. Dal Lago, Nicola Trivellin, G. Mura, M. Vanzi, Gaudenzio Meneghesso, Enrico Zanoni	2011	44
10	High brightness GaN LEDs degradation during dc and pulsed stress Microelectronics Reliability ·Matteo Meneghini, S. Podda, Alessio Morelli, Ruggero Pintus, Lorenzo Roberto Trevisanello, Gaudenzio Meneghesso, M. Vanzi, Enrico Zanoni	2006	40
11	Reliability of visible GaN LEDs in plastic package Microelectronics Reliability ·Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, Gaetano Scamarcio, G. Mura, S. Podda, M. Vanzi, Shaowu Du, I. Eliashevich	2003	37
12	Thermal stability analysis of high brightness LED during high temperature and electrical aging Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Lorenzo Roberto Trevisanello, Matteo Meneghini, G. Mura, Carla Sanna, Simone Buso, G. Spiazzi, M. Vanzi, Gaudenzio Meneghesso, Enrico Zanoni	2007	34
13	Sulfur-contamination of high power white LED Microelectronics Reliability ·G. Mura, G. Cassanelli, F. Fantini, M. Vanzi	2008	22
14	Metal–GaAs interaction and contact degradation in microwave MESFETs Quality and Reliability Engineering International ·Enrico Zanoni, Alessandro Callegari, Claudio Canali, F. Fantini, H.L. Hartnagel, F. Magistrali, A. Paccagnella, M. Vanzi	1990	22
15	Mapping of microelectrostatic fields by means of electron holography: Theoretical and experimental results Physical review. A, General physics ·J. W. Chen, Gioṙgio Matteucci, A. Migliori, G.F. Missiroli, E. Nichelatti, G. Pozzi, M. Vanzi	1989	17
16	An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy IEEE Transactions on Instrumentation and Measurement ·Ruggero Pintus, S. Podda, M. Vanzi	2008	16
17	Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs Microelectronics Reliability ·Gaudenzio Meneghesso, S. Podda, M. Vanzi	2001	16
18	Reliability predictions in electronic industrial applications Microelectronics Reliability ·G. Cassanelli, G. Mura, F. Cesaretti, M. Vanzi, F. Fantini	2005	16
19	The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis Microelectronics Reliability ·G. Mura, M. Vanzi	2010	15
20	Hot electrons in MOS transistors: Lateral distribution of the trapped oxide charge IEEE Electron Device Letters ·C. Lombardi, P. Olivo, B. Riccò, E. Sangiorgi, M. Vanzi	1982	13

About M. Vanzi

M. Vanzi is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Surfaces, Coatings and Films and Materials Chemistry, having authored 116 papers that have together received 1.8k indexed citations. Recurring topics across this work include Semiconductor materials and devices (34 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers), Semiconductor Quantum Structures and Devices (27 papers), GaN-based semiconductor devices and materials (20 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Semiconductor Lasers and Optical Devices (15 papers), Electrostatic Discharge in Electronics (13 papers) and Semiconductor materials and interfaces (12 papers). The work is most often cited by research in Structural Biology (159 citations), Condensed Matter Physics (466 citations), Electrical and Electronic Engineering (1.4k citations), Surfaces, Coatings and Films (111 citations) and Atomic and Molecular Physics, and Optics (417 citations). M. Vanzi has collaborated with scholars based in Italy, France and United States. Frequent co-authors include C. Lombardi, Stefano Manzini, Antonio Saporito, G. Mura, Enrico Zanoni, Gaudenzio Meneghesso, Matteo Meneghini, F. Fantini, Giulio Pozzi and Lorenzo Roberto Trevisanello. Their work appears in journals such as Microelectronics Reliability, Electronics Letters, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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