M. Shiozaki
- Mechanical Engineering top 10%
- Electronic, Optical and Magnetic Materials top 10%
- Electrical and Electronic Engineering
- Materials Chemistry
- Mechanics of Materials
- Co-authors
- Yousuke KurosakiHiroyasu FujiiTakeshi KubotaK. KawasakiHidetoshi FujiiShinsuke YamazakiHitome KobayashiM. J. O’Hara
- Topics
- Magnetic Properties and Applications (9 papers)Microstructure and Mechanical Properties of Steels (8 papers)Non-Destructive Testing Techniques (4 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsMechanical EngineeringElectrical and Electronic Engineering
- Journals
- Journal of Applied PhysicsJournal of Magnetism and Magnetic MaterialsIEEE Transactions on Magnetics
- Partner nations
- Japan
In The Last Decade
M. Shiozaki
11 papers receiving 348 citations
Peers
Comparison fields: 5 of 23
- Mechanical Engineering 329
- Electronic, Optical and Magnetic Materials 290
- Electrical and Electronic Engineering 94
- Materials Chemistry 66
- Mechanics of Materials 40
Countries citing papers authored by M. Shiozaki
This map shows the geographic impact of M. Shiozaki's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Shiozaki with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Shiozaki more than expected).
Fields of papers citing papers by M. Shiozaki
This network shows the impact of papers produced by M. Shiozaki. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Shiozaki. The network helps show where M. Shiozaki may publish in the future.
Co-authorship network of co-authors of M. Shiozaki
This figure shows the co-authorship network connecting the top 25 collaborators of M. Shiozaki. A scholar is included among the top collaborators of M. Shiozaki based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Shiozaki. M. Shiozaki is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 128 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 26 | |
| 5 | 8 | |
| 6 | 22 | |
| 7 | 14 | |
| 8 | 9 | |
| 9 | 113 | |
| 10 | 25 | |
| 11 | 24 |
About M. Shiozaki
M. Shiozaki is a scholar working on Electronic, Optical and Magnetic Materials, Mechanical Engineering and Aerospace Engineering, having authored 11 papers that have together received 372 indexed citations. Recurring topics across this work include Magnetic Properties and Applications (9 papers), Microstructure and Mechanical Properties of Steels (8 papers) and Non-Destructive Testing Techniques (4 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (290 citations), Mechanical Engineering (329 citations) and Electrical and Electronic Engineering (94 citations). M. Shiozaki has collaborated with scholars based in Japan. Frequent co-authors include Yousuke Kurosaki, Hiroyasu Fujii, Takeshi Kubota, K. Kawasaki, Hidetoshi Fujii, Shinsuke Yamazaki, Hitome Kobayashi, M. J. O’Hara and Hisashi Kobayashi. Their work appears in journals such as Journal of Applied Physics, Journal of Magnetism and Magnetic Materials and IEEE Transactions on Magnetics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.