M. Koutsoureli

638 total citations
58 papers, 518 citations indexed

About

M. Koutsoureli is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. Koutsoureli has authored 58 papers receiving a total of 518 indexed citations (citations by other indexed papers that have themselves been cited), including 54 papers in Electrical and Electronic Engineering, 37 papers in Biomedical Engineering and 22 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. Koutsoureli's work include Advanced MEMS and NEMS Technologies (42 papers), Acoustic Wave Resonator Technologies (30 papers) and Semiconductor materials and devices (23 papers). M. Koutsoureli is often cited by papers focused on Advanced MEMS and NEMS Technologies (42 papers), Acoustic Wave Resonator Technologies (30 papers) and Semiconductor materials and devices (23 papers). M. Koutsoureli collaborates with scholars based in Greece, France and United States. M. Koutsoureli's co-authors include G. Papaioannou, L. Michalas, E. Papandreou, John Papapolymerou, Negar Tavassolian, A. Ziaei, S. Bansropun, Г. Ставринидис, F. Coccetti and P. Pons and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Microwave Theory and Techniques.

In The Last Decade

M. Koutsoureli

57 papers receiving 503 citations

Peers

M. Koutsoureli

EEE

AMPO

EOMM

Mengqi Fu China

Usama Zaghloul France

Ming-ta Hsieh United States

Jiale Su China

Frédéric Dross Belgium

K. Reimann Netherlands

Weiquan Yang United States

Yohei Otani Japan

L. Mathew United States

L. M. Landsberger Canada

Mengqi Fu China

M. Koutsoureli

298 ×0.6

EEE

255 ×0.8

146 ×0.8

AMPO

247 ×2.7

29 ×1.0

EOMM

Citations per year, relative to M. Koutsoureli M. Koutsoureli (= 1×) peers Mengqi Fu

Countries citing papers authored by M. Koutsoureli

Since Specialization

Citations

This map shows the geographic impact of M. Koutsoureli's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Koutsoureli with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Koutsoureli more than expected).

Fields of papers citing papers by M. Koutsoureli

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Koutsoureli. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Koutsoureli. The network helps show where M. Koutsoureli may publish in the future.

Co-authorship network of co-authors of M. Koutsoureli

This figure shows the co-authorship network connecting the top 25 collaborators of M. Koutsoureli. A scholar is included among the top collaborators of M. Koutsoureli based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Koutsoureli. M. Koutsoureli is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Koutsoureli, M., et al.. (2020). Thermally activated discharging mechanisms in SiNx films with embedded CNTs for RF MEMS capacitive switches. Microelectronic Engineering. 223. 111230–111230. 5 indexed citations

Koutsoureli, M., et al.. (2020). A study of material stoichiometry on charging properties of SiNx films for potential application in RF MEMS capacitive switches. Microelectronics Reliability. 114. 113759–113759. 4 indexed citations

Czarnecki, P., et al.. (2016). Assessment of dielectric charging in capacitive MEMS switches fabricated on Si substrate with thin oxide film. Microelectronic Engineering. 159. 209–214. 7 indexed citations

Koutsoureli, M., et al.. (2016). Conduction mechanisms in conductive multi-walled carbon nanotube filled polydimethylsiloxane nanocomposites. Microelectronic Engineering. 159. 198–201. 4 indexed citations

Koutsoureli, M., et al.. (2016). Field emission in actuation pads of radio frequency microelectromechanical systems ohmic switches: A potential contamination mechanism. Applied Physics Letters. 108(4). 1 indexed citations

Koutsoureli, M., et al.. (2016). An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches. Microelectronics Reliability. 64. 688–692. 13 indexed citations

Blokhina, Elena, et al.. (2015). Modelling of the dynamical behaviour of floating electrode MEMS. 1322–1325.

Koutsoureli, M., L. Michalas, E. Papandreou, & G. Papaioannou. (2015). Induced charging phenomena on SiNx dielectric films used in RF MEMS capacitive switches. Microelectronics Reliability. 55(9-10). 1911–1915. 10 indexed citations

Michalas, L., M. Koutsoureli, & G. Papaioannou. (2014). Probing contactless injection dielectric charging in RF MEMS capacitive switches. Electronics Letters. 50(10). 766–768. 22 indexed citations

10.

Michalas, L., Thomas Maroutian, Guillaume Agnus, et al.. (2014). Temperature dependence of the conduction mechanisms through a Pb(Zr,Ti)O3 thin film. Thin Solid Films. 563. 32–35. 8 indexed citations

11.

Michalas, L., M. Koutsoureli, E. Papandreou, et al.. (2013). Electrical characterization of undoped diamond films for RF MEMS application. HAL (Le Centre pour la Communication Scientifique Directe). 6B.3.1–6B.3.7. 9 indexed citations

12.

Koutsoureli, M., L. Michalas, & G. Papaioannou. (2013). Assessment of dielectric charging in micro-electro-mechanical system capacitive switches. Facta universitatis - series Electronics and Energetics. 26(3). 239–245. 2 indexed citations

13.

Michalas, L., M. Koutsoureli, G. Papaioannou, Г. Ставринидис, & G. Konstantinidis. (2012). Dielectric less and dimple less MEMS capacitive switches: The actuation mechanism. European Microwave Integrated Circuit Conference. 445–448. 1 indexed citations

14.

Koutsoureli, M., L. Michalas, & G. Papaioannou. (2012). Charge collection mechanism in MEMS capacitive switches. ME.2.1–ME.2.5. 18 indexed citations

15.

Koutsoureli, M., E. Papandreou, L. Michalas, & G. Papaioannou. (2011). Investigation of silicon nitride charging. Microelectronic Engineering. 90. 145–148. 22 indexed citations

16.

Tavassolian, Negar, et al.. (2010). Dielectric charging in capacitive RF MEMS switches: The effect of electric stress. Asia-Pacific Microwave Conference. 1833–1836. 7 indexed citations

17.

Zaghloul, Usama, M. Koutsoureli, F. Coccetti, et al.. (2010). Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. Microelectronics Reliability. 50(9-11). 1615–1620. 26 indexed citations

18.

Ruan, Jiangjun, E. Papandreou, M. Koutsoureli, et al.. (2008). Alpha particle radiation effects in RF MEMS capacitive switches. Microelectronics Reliability. 48(8-9). 1241–1244. 9 indexed citations

19.

Papandreou, E., et al.. (2008). Effect of deposition conditions on charging processes in SiNx: Application to RF-MEMS capacitive switches. Microelectronic Engineering. 86(3). 404–407. 43 indexed citations

20.

Tavassolian, Negar, et al.. (2008). Dependence of dielectric charging on film thickness and deposition conditions. 71. 1–4. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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