M. Escher

933 total citations
36 papers, 726 citations indexed

About

M. Escher is a scholar working on Surfaces, Coatings and Films, Structural Biology and Electrical and Electronic Engineering. According to data from OpenAlex, M. Escher has authored 36 papers receiving a total of 726 indexed citations (citations by other indexed papers that have themselves been cited), including 31 papers in Surfaces, Coatings and Films, 15 papers in Structural Biology and 15 papers in Electrical and Electronic Engineering. Recurrent topics in M. Escher's work include Electron and X-Ray Spectroscopy Techniques (31 papers), Advanced Electron Microscopy Techniques and Applications (15 papers) and Advancements in Photolithography Techniques (12 papers). M. Escher is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (31 papers), Advanced Electron Microscopy Techniques and Applications (15 papers) and Advancements in Photolithography Techniques (12 papers). M. Escher collaborates with scholars based in Germany, France and Ukraine. M. Escher's co-authors include M. Merkel, N. Weber, D. Funnemann, B. Krömker, G. Schönhense, O. Renault, N. Barrett, Claus M. Schneider, Hermann Engelhard and J. Kirschner and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Physical Review B.

In The Last Decade

M. Escher

36 papers receiving 708 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Escher Germany 15 323 300 279 253 204 36 726
M. Merkel Germany 14 200 0.6× 224 0.7× 283 1.0× 178 0.7× 145 0.7× 36 627
A. W. Ellis United States 6 148 0.5× 188 0.6× 264 0.9× 189 0.7× 113 0.6× 6 577
D. Funnemann Germany 11 217 0.7× 199 0.7× 174 0.6× 147 0.6× 117 0.6× 14 470
Vance R. Morrison Canada 5 232 0.7× 97 0.3× 225 0.8× 270 1.1× 176 0.9× 6 690
Ch. Ziethen Germany 11 191 0.6× 198 0.7× 127 0.5× 103 0.4× 138 0.7× 17 421
Dmytro Kutnyakhov Germany 15 320 1.0× 106 0.4× 254 0.9× 103 0.4× 125 0.6× 35 579
O. Andreyev Germany 11 414 1.3× 80 0.3× 177 0.6× 352 1.4× 94 0.5× 13 761
M. Fabrizioli Italy 9 262 0.8× 103 0.3× 123 0.4× 98 0.4× 111 0.5× 14 454
B. Krömker Germany 9 205 0.6× 134 0.4× 153 0.5× 130 0.5× 99 0.5× 13 385
Lutz Baumgarten Germany 15 670 2.1× 182 0.6× 272 1.0× 286 1.1× 62 0.3× 27 988

Countries citing papers authored by M. Escher

Since Specialization
Citations

This map shows the geographic impact of M. Escher's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Escher with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Escher more than expected).

Fields of papers citing papers by M. Escher

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Escher. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Escher. The network helps show where M. Escher may publish in the future.

Co-authorship network of co-authors of M. Escher

This figure shows the co-authorship network connecting the top 25 collaborators of M. Escher. A scholar is included among the top collaborators of M. Escher based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Escher. M. Escher is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lubin, C., et al.. (2024). Ferroelastic Twin Angles at the Surface of CaTiO3 Quantified by Photoemission Electron Microscopy. Physical Review Letters. 132(5). 56201–56201. 2 indexed citations
2.
Escher, M., et al.. (2023). 2D imaging spin-filter for NanoESCA based on Au/Ir(001) or Fe(001)-p(1×1)O. Ultramicroscopy. 253. 113814–113814. 3 indexed citations
3.
Schneider, Claus M., C. Wiemann, Vitaliy Feyer, et al.. (2012). Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES. Journal of Electron Spectroscopy and Related Phenomena. 185(10). 330–339. 55 indexed citations
4.
Bailly, Aude, O. Renault, N. Barrett, et al.. (2009). Aspects of lateral resolution in energy-filtered core level photoelectron emission microscopy. Journal of Physics Condensed Matter. 21(31). 314002–314002. 12 indexed citations
5.
Lin, Jingquan, A. Wirth, M. Escher, et al.. (2009). Time of flight-photoemission electron microscope for ultrahigh spatiotemporal probing of nanoplasmonic optical fields. Journal of Physics Condensed Matter. 21(31). 314005–314005. 29 indexed citations
6.
Escher, M., et al.. (2009). Applications of high lateral and energy resolution imaging XPS with a double hemispherical analyser based spectromicroscope. Journal of Electron Spectroscopy and Related Phenomena. 178-179. 303–316. 56 indexed citations
7.
Lin, Jingquan, N. Weber, M. Escher, et al.. (2008). Three-dimensional characterization of extreme ultraviolet mask blank defects by interference contrast photoemission electron microscopy. Optics Express. 16(20). 15343–15343. 4 indexed citations
8.
Krömker, B., et al.. (2008). Development of a momentum microscope for time resolved band structure imaging. Review of Scientific Instruments. 79(5). 53702–53702. 110 indexed citations
9.
Lin, Jingquan, et al.. (2008). Inspection of EUVL mask blank defects and patterned masks using EUV photoemission electron microscopy. Microelectronic Engineering. 85(5-6). 922–924. 2 indexed citations
10.
Weber, N., M. Escher, M. Merkel, A. Oelsner, & G. Schönhense. (2008). Energy- and time-resolved microscopy using PEEM: recent developments and state-of-the-art. Journal of Physics Conference Series. 100(7). 72031–72031. 5 indexed citations
11.
Yu, Dehong, et al.. (2007). Characterisation and application of a SPLEED-based spin polarisation analyser. Surface Science. 601(24). 5803–5808. 41 indexed citations
12.
Lin, Jingquan, U. Heinzmann, N. Weber, et al.. (2007). Actinic inspection of EUVL mask blank defects by photoemission electron microscopy: Effect of inspection wavelength variation. Microelectronic Engineering. 84(5-8). 1011–1014. 2 indexed citations
13.
Lin, Jingquan, U. Kleineberg, U. Heinzmann, et al.. (2006). Actinic extreme ultraviolet lithography mask blank defect inspection by photoemission electron microscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 24(6). 2631–2635. 7 indexed citations
14.
Ott, U., M. Escher, N. Weber, et al.. (2006). Trace element analysis in pre-solar stardust grains via full-field imaging XPS (Nano-ESCA). Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 246(1). 275–280. 6 indexed citations
15.
Neuhäusler, U., A. Oelsner, Andreas Wonisch, et al.. (2006). High-resolution actinic defect inspection for extreme ultraviolet lithography multilayer mask blanks by photoemission electron microscopy. Applied Physics Letters. 88(5). 6 indexed citations
16.
Schmidt, Stefan, N. Weber, H. J. Elmers, et al.. (2005). Quantitative microscopy of magnetic domains in Fe(100) by core-level x-ray photoelectron spectroscopy. Physical Review B. 72(6). 3 indexed citations
17.
Escher, M., N. Weber, M. Merkel, et al.. (2005). NanoESCA: imaging UPS and XPS with high energy resolution. Journal of Electron Spectroscopy and Related Phenomena. 144-147. 1179–1182. 36 indexed citations
18.
Nepijko, S. A., et al.. (2002). Use of emission electron microscope for potential mapping in semiconductor microelectronics. Journal of Microscopy. 206(2). 132–138. 11 indexed citations
19.
Nepijko, S. A., et al.. (2000). Resolution deterioration in emission electron microscopy due to object roughness. Annalen der Physik. 512(6). 441–451. 3 indexed citations
20.
Schmidt, O., Ch. Ziethen, Gerhard H. Fecher, et al.. (1998). Chemical microanalysis by selected-area ESCA using an electron energy filter in a photoemission microscope. Journal of Electron Spectroscopy and Related Phenomena. 88-91. 1009–1014. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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