M. Broekaart

1.0k total citations
14 papers, 673 citations indexed

About

M. Broekaart is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanics of Materials. According to data from OpenAlex, M. Broekaart has authored 14 papers receiving a total of 673 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 5 papers in Atomic and Molecular Physics, and Optics and 3 papers in Mechanics of Materials. Recurrent topics in M. Broekaart's work include Quantum and electron transport phenomena (5 papers), Semiconductor materials and devices (5 papers) and Semiconductor Quantum Structures and Devices (4 papers). M. Broekaart is often cited by papers focused on Quantum and electron transport phenomena (5 papers), Semiconductor materials and devices (5 papers) and Semiconductor Quantum Structures and Devices (4 papers). M. Broekaart collaborates with scholars based in France, Switzerland and Netherlands. M. Broekaart's co-authors include J. Williamson, C. T. Foxon, B. J. van Wees, H. van Houten, J. J. Harris, C. W. J. Beenakker, C.E. Timmering, C. J. P. M. Harmans, L. P. Kouwenhoven and J. E. Mooij and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Surface Science.

In The Last Decade

M. Broekaart

14 papers receiving 648 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Broekaart France 8 580 368 136 106 43 14 673
B. P. Van der Gaag United States 15 538 0.9× 456 1.2× 121 0.9× 124 1.2× 22 0.5× 33 654
J.S. Roberts United Kingdom 14 444 0.8× 467 1.3× 63 0.5× 69 0.7× 28 0.7× 49 597
CR Stanley United Kingdom 10 436 0.8× 375 1.0× 72 0.5× 200 1.9× 24 0.6× 40 602
Kees M. Schep Netherlands 13 600 1.0× 212 0.6× 240 1.8× 134 1.3× 219 5.1× 23 679
Y. Jompol United Kingdom 4 247 0.4× 116 0.3× 93 0.7× 210 2.0× 17 0.4× 9 449
Kunihiro Arai Japan 15 603 1.0× 594 1.6× 164 1.2× 102 1.0× 32 0.7× 47 785
Toshiyuki Takizawa Japan 10 185 0.3× 252 0.7× 179 1.3× 156 1.5× 54 1.3× 23 391
W. Szymańska Poland 11 420 0.7× 348 0.9× 44 0.3× 166 1.6× 35 0.8× 15 528
A. Schremer United States 13 306 0.5× 450 1.2× 288 2.1× 98 0.9× 116 2.7× 27 610
Benjamin Pigeau France 12 493 0.8× 180 0.5× 126 0.9× 88 0.8× 90 2.1× 15 551

Countries citing papers authored by M. Broekaart

Since Specialization
Citations

This map shows the geographic impact of M. Broekaart's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Broekaart with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Broekaart more than expected).

Fields of papers citing papers by M. Broekaart

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Broekaart. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Broekaart. The network helps show where M. Broekaart may publish in the future.

Co-authorship network of co-authors of M. Broekaart

This figure shows the co-authorship network connecting the top 25 collaborators of M. Broekaart. A scholar is included among the top collaborators of M. Broekaart based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Broekaart. M. Broekaart is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

14 of 14 papers shown
1.
Broekaart, M., et al.. (2013). Distortion Free Wafer Bonding Technology for Backside Illumination Image Sensors. ECS Transactions. 50(7). 371–377. 1 indexed citations
2.
Broekaart, M., et al.. (2013). Mechanism of Edge Bonding Void Formation in Hydrophilic Direct Wafer Bonding. ECS Solid State Letters. 2(6). P47–P50. 20 indexed citations
3.
Broekaart, M., et al.. (2011). Edge Bonding Void Free Low Temperature Oxide-Oxide Direct Bonding Process. ECS Transactions. 35(2). 145–151. 4 indexed citations
4.
Gouraud, P., et al.. (2005). Comparison between organic spin-on BARC and carbon-containing CVD stack for 65-nm gate patterning. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5753. 708–708. 2 indexed citations
5.
6.
Pain, L., F. Leverd, M. Broekaart, et al.. (2005). Electron beam direct write lithography flexibility for ASIC manufacturing: an opportunity for cost reduction (Keynote Paper). Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5751. 35–35. 8 indexed citations
7.
Chapelon, L.L., et al.. (2004). Characterization and integration of a CVD porous SiOCH (k<2.5) with enhanced mechanical properties for 65 nm CMOS interconnects and below. Microelectronic Engineering. 76(1-4). 1–7. 29 indexed citations
8.
Besling, W.F.A., M. Broekaart, V. Arnal, & J. Torrès. (2004). Line resistance behaviour in narrow lines patterned by a TiN hard mask spacer for 45 nm node interconnects. Microelectronic Engineering. 76(1-4). 167–174. 8 indexed citations
9.
Broekaart, M., et al.. (2003). Advanced patterning studies using shaped e-beam lithography for 65-nm CMOS preproduction. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5037. 560–560. 4 indexed citations
10.
Williamson, J., H. van Houten, C. W. J. Beenakker, et al.. (1990). Hot-electron spectrometry with quantum point contacts. Physical review. B, Condensed matter. 41(2). 1207–1210. 29 indexed citations
11.
Williamson, J., H. van Houten, C. W. J. Beenakker, et al.. (1990). Injection of ballistic hot electrons and cool holes in a two-dimensional electron gas. Surface Science. 229(1-3). 303–306. 7 indexed citations
12.
Houten, H. van, C. W. J. Beenakker, J. Williamson, et al.. (1989). Coherent electron focusing with quantum point contacts in a two-dimensional electron gas. Physical review. B, Condensed matter. 39(12). 8556–8575. 252 indexed citations
13.
Wees, B. J. van, L. P. Kouwenhoven, C. J. P. M. Harmans, et al.. (1989). Observation of zero-dimensional states in a one-dimensional electron interferometer. Physical Review Letters. 62(21). 2523–2526. 248 indexed citations
14.
Houten, H. van, J. Williamson, M. Broekaart, C. T. Foxon, & J. J. Harris. (1988). Magnetoresistance in a GaAs-AlxGa1−xAs heterostructure with double subband occupancy. Physical review. B, Condensed matter. 37(5). 2756–2758. 59 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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