M. Beaudoin

427 total citations
28 papers, 350 citations indexed

About

M. Beaudoin is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, M. Beaudoin has authored 28 papers receiving a total of 350 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 16 papers in Atomic and Molecular Physics, and Optics and 7 papers in Materials Chemistry. Recurrent topics in M. Beaudoin's work include Semiconductor Quantum Structures and Devices (14 papers), Semiconductor Lasers and Optical Devices (8 papers) and Advanced Semiconductor Detectors and Materials (8 papers). M. Beaudoin is often cited by papers focused on Semiconductor Quantum Structures and Devices (14 papers), Semiconductor Lasers and Optical Devices (8 papers) and Advanced Semiconductor Detectors and Materials (8 papers). M. Beaudoin collaborates with scholars based in Canada, United States and Israel. M. Beaudoin's co-authors include T. Tiedje, S. R. Johnson, Stephen K. O’Leary, Michael Brian Whitwick, J. Boucart, Michael M. Adachi, Mirette Fawzy, Fahmid Kabir, Ribwar Ahmadi and Amin Abnavi and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Advanced Functional Materials.

In The Last Decade

M. Beaudoin

28 papers receiving 324 citations

Peers

M. Beaudoin

EEE

AMPO

EOMM

S. C. Shen China

K. Seibert Germany

S. Zerlauth Austria

F. R. Keßler Germany

В. И. Зубков Russia

S. Habermehl United States

D. Daineka France

C. Rosenblad Switzerland

S. K. Noh South Korea

Jianrong Dong China

S. C. Shen China

M. Beaudoin

291 ×1.2

EEE

108 ×0.7

187 ×1.4

AMPO

57 ×1.1

25 ×0.8

EOMM

Citations per year, relative to M. Beaudoin M. Beaudoin (= 1×) peers S. C. Shen

Countries citing papers authored by M. Beaudoin

Since Specialization

Citations

This map shows the geographic impact of M. Beaudoin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Beaudoin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Beaudoin more than expected).

Fields of papers citing papers by M. Beaudoin

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Beaudoin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Beaudoin. The network helps show where M. Beaudoin may publish in the future.

Co-authorship network of co-authors of M. Beaudoin

This figure shows the co-authorship network connecting the top 25 collaborators of M. Beaudoin. A scholar is included among the top collaborators of M. Beaudoin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Beaudoin. M. Beaudoin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Abnavi, Amin, Ribwar Ahmadi, Mirette Fawzy, et al.. (2022). Flexible High‐Performance Photovoltaic Devices based on 2D MoS₂ Diodes with Geometrically Asymmetric Contact Areas. Advanced Functional Materials. 33(7). 48 indexed citations

Andrews, Jeff J., M. Beaudoin, Stephen K. O’Leary, et al.. (2021). The impact of processing on the optical absorption onset of CdTe thin-films and solar cells. Journal of Applied Physics. 129(16). 8 indexed citations

Beaudoin, M., Ryan B. Lewis, Jeff J. Andrews, et al.. (2015). Bandedge optical properties of MBE grown GaAsBi films measured by photoluminescence and photothermal deflection spectroscopy. Journal of Crystal Growth. 425. 245–249. 10 indexed citations

Beaudoin, M., et al.. (2009). Extension of the Rosencwaig–Gersho–Fernelius photothermal deflection spectroscopy model to account for multiple reflections in epitaxial samples. Journal of Applied Physics. 106(10). 5 indexed citations

Beaudoin, M., T. Tiedje, Michael Brian Whitwick, et al.. (2008). Bandedge absorption of GaAsN films measured by the photothermal deflection spectroscopy. Journal of Crystal Growth. 311(7). 1662–1665. 9 indexed citations

Boucart, J., R. Pathak, Dongxu Zhang, et al.. (2003). Long wavelength MEMS tunable VCSEL with InP-InAlGaAs bottom DBR. IEEE Photonics Technology Letters. 15(9). 1186–1188. 27 indexed citations

Sadeghi, Seyed M., J. Meyer, T. Tiedje, & M. Beaudoin. (2000). Multilevel infrared coupling of excitons in quantum-well semiconductors. IEEE Journal of Quantum Electronics. 36(11). 1267–1271. 3 indexed citations

Nabiev, R.F., J. Boucart, R. Stone, et al.. (2000). High-performance 1.6/spl mu/m single-epitaxy top-emitting VCSEL. 34. 676–677. 2 indexed citations

Beaudoin, M., E. Grassi, S. R. Johnson, et al.. (2000). Real-time composition control of InAlAs grown on InP using spectroscopic ellipsometry. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 18(3). 1435–1438. 1 indexed citations

10.

Grassi, E., S. R. Johnson, M. Beaudoin, & Konstantinos Tsakalis. (1999). Modeling of optical constants of InGaAs and InAlAs measured by spectroscopic ellipsometry. Journal of Crystal Growth. 201-202. 1081–1084. 3 indexed citations

11.

Johnson, S. R., et al.. (1999). Closed-loop control of composition and temperature during the growth of InGaAs lattice matched to InP. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 17(3). 1237–1240. 3 indexed citations

12.

Beaudoin, M., M. Adamcyk, Yaakov Levy, et al.. (1999). In situ real time monitoring of thickness and composition in MBE using alpha particle energy loss. Journal of Crystal Growth. 201-202. 26–30. 3 indexed citations

13.

Grassi, E., S. R. Johnson, M. Beaudoin, & K. Tsakalis. (1999). Temperature-composition determination based on modeling of optical constants of III-V compound semiconductors measured by spectroscopic ellipsometry. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 17(3). 1223–1226. 4 indexed citations

14.

Beaudoin, M., P. Kelkar, Wolfgang Braun, et al.. (1999). Growth of resonant-cavity enhanced photodetectors by MBE with in situ feedback control using spectroscopic ellipsometry. Journal of Crystal Growth. 201-202. 990–993. 2 indexed citations

15.

Johnson, S. R., et al.. (1999). Feedback control of substrate temperature during the growth of near-lattice-matched InGaAs on InP using diffuse reflection spectroscopy. Journal of Crystal Growth. 201-202. 40–44. 3 indexed citations

16.

Beaudoin, M., M. Adamcyk, U. Giesen, et al.. (1998). Film thickness and composition monitoring during growth by molecular beam epitaxy using alpha particle energy loss. Applied Physics Letters. 72(25). 3288–3290. 5 indexed citations

17.

Beaudoin, M., U. Giesen, I. Kelson, et al.. (1997). In situ thickness measurements in molecular beam epitaxy using alpha particle energy loss. Surface and Coatings Technology. 94-95. 374–378. 6 indexed citations

18.

Kelson, I., et al.. (1997). The applicability of implanted -sources to thickness and stoichiometry measurements of thin films. Journal of Physics D Applied Physics. 30(1). 131–136. 6 indexed citations

19.

DeCorby, R. G., et al.. (1997). Elimination of low frequency gain in InAlAs/InGaAs metal-semiconductor-metal photodetectors by silicon nitride passivation. Journal of Electronic Materials. 26(12). L25–L28. 8 indexed citations

20.

Beaudoin, M., et al.. (1996). Temperature Dependence of the Optical Absorption Edge in Indium Phosphide. MRS Proceedings. 421. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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