L. Reimer
Impact in
- Structural Biology top 0.2%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 0.2%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 72
-
- Advancements in Photolithography Techniques 8
- Integrated Circuits and Semiconductor Failure Analysis 7
- Semiconductor materials and devices 6
- Co-authors
- H. J. Drescher (1 shared paper)Manfred Kässens (7 shared papers)P. B. Hirsch (5 shared papers)Marianne Riepenhausen (3 shared papers)Roland Herrmann (1 shared paper)M. Wächter (1 shared paper)Ulrich Plate (2 shared papers)Э. И. Рау (1 shared paper)
- Journals
- Ultramicroscopy (15 papers)Journal of Microscopy (13 papers)Die Naturwissenschaften (5 papers)Scanning (35 papers)Journal of Physics D Applied Physics (3 papers)
- Partner nations
- GermanyUnited KingdomRussia
In The Last Decade
L. Reimer
96 papers receiving 1.6k citations
Peers
Comparison fields: 5 of 118
- Structural Biology 514
- Surfaces, Coatings and Films 1.1k
- Radiation 386
- Electrical and Electronic Engineering 625
- Computational Mechanics 192
Countries citing papers authored by L. Reimer
This map shows the geographic impact of L. Reimer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Reimer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Reimer more than expected).
Fields of papers citing papers by L. Reimer
This network shows the impact of papers produced by L. Reimer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Reimer. The network helps show where L. Reimer may publish in the future.
Co-authors
The 25 scholars most cited alongside L. Reimer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 97 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1980 | 109 | |
| 2 | 1977 | 76 | |
| 3 | 1984 | 72 | |
| 4 | 2000 | 70 | |
| 5 | 1993 | 68 | |
| 6 | 1988 | 62 | |
| 7 | 1994 | 53 | |
| 8 | 1986 | 43 | |
| 9 | 1992 | 43 | |
| 10 | IRRADIATION CHANGES IN ORGANIC AND INORGANIC OBJECTS. | 1965 | 43 |
| 11 | 1968 | 40 | |
| 12 | 1974 | 38 | |
| 13 | 1984 | 37 | |
| 14 | 1978 | 36 | |
| 15 | 1979 | 36 | |
| 16 | 1989 | 34 | |
| 17 | 1990 | 30 | |
| 18 | Shape from Shading Using Multiple Detector Signals in Scanning Electron Microscopy | 1987 | 29 |
| 19 | 1992 | 27 | |
| 20 | 1985 | 27 |
About L. Reimer
L. Reimer is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Structural Biology, Radiation and Materials Chemistry, having authored 97 papers that have together received 1.7k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (72 papers), Advanced Electron Microscopy Techniques and Applications (26 papers), X-ray Spectroscopy and Fluorescence Analysis (17 papers), Ion-surface interactions and analysis (11 papers), Surface and Thin Film Phenomena (9 papers), Advancements in Photolithography Techniques (8 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Semiconductor materials and devices (6 papers). The work is most often cited by research in Structural Biology (514 citations), Surfaces, Coatings and Films (1.1k citations), Radiation (386 citations), Electrical and Electronic Engineering (625 citations) and Computational Mechanics (192 citations). L. Reimer has collaborated with scholars based in Germany, United Kingdom and Russia. Frequent co-authors include H. J. Drescher, Manfred Kässens, P. B. Hirsch, Marianne Riepenhausen, Roland Herrmann, M. Wächter, Ulrich Plate, Э. И. Рау, A. Boyde and R.H. Barckhaus. Their work appears in journals such as Ultramicroscopy, Journal of Microscopy, Die Naturwissenschaften, Scanning and Journal of Physics D Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.