L. Howald

3.0k total citations · 1 hit paper
44 papers, 2.2k citations indexed

About

L. Howald is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, L. Howald has authored 44 papers receiving a total of 2.2k indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Atomic and Molecular Physics, and Optics, 10 papers in Electrical and Electronic Engineering and 10 papers in Biomedical Engineering. Recurrent topics in L. Howald's work include Force Microscopy Techniques and Applications (37 papers), Mechanical and Optical Resonators (21 papers) and Surface and Thin Film Phenomena (9 papers). L. Howald is often cited by papers focused on Force Microscopy Techniques and Applications (37 papers), Mechanical and Optical Resonators (21 papers) and Surface and Thin Film Phenomena (9 papers). L. Howald collaborates with scholars based in Switzerland, United States and Japan. L. Howald's co-authors include Ernst Meyer, R. Lüthi, René M. Overney, Jane Frommer, H. Haefke, D. Brodbeck, H.‐J. Güntherodt, H.‐J. Güntherodt, H.‐J. Güntherodt and Hajime Takano and has published in prestigious journals such as Nature, Science and Physical Review Letters.

In The Last Decade

L. Howald

43 papers receiving 2.1k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Friction measurements on phase-separated thin films with a modified atomic force microscope

1992 404 citations René M. Overney, Ernst Meyer et al. Nature profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
L. Howald Switzerland	24	1.8k	733	608	542	504	44	2.2k
R. Lüthi Switzerland	28	2.1k 1.1×	879 1.2×	789 1.3×	582 1.1×	683 1.4×	50	2.6k
J. Cousty France	26	931 0.5×	680 0.9×	585 1.0×	124 0.2×	777 1.5×	64	1.8k
Akihiro Hashimoto Japan	26	1.3k 0.7×	972 1.3×	735 1.2×	432 0.8×	1.7k 3.4×	185	3.6k
Nobuyuki Nakagiri Japan	22	944 0.5×	883 1.2×	696 1.1×	99 0.2×	360 0.7×	64	1.5k
P. E. Russell United States	22	610 0.3×	802 1.1×	453 0.7×	208 0.4×	491 1.0×	91	1.5k
J. E. Gerbi United States	17	610 0.3×	719 1.0×	289 0.5×	945 1.7×	1.9k 3.7×	27	2.2k
S. F. Yoon Singapore	23	591 0.3×	994 1.4×	266 0.4×	553 1.0×	1.3k 2.6×	156	2.0k
Krister Svensson Sweden	24	755 0.4×	676 0.9×	614 1.0×	212 0.4×	700 1.4×	69	1.9k
Amin Abdolvand United Kingdom	23	688 0.4×	798 1.1×	675 1.1×	178 0.3×	502 1.0×	111	1.8k
Luiz Fernando Zagonel Brazil	24	376 0.2×	544 0.7×	501 0.8×	257 0.5×	1.0k 2.0×	72	1.7k

Countries citing papers authored by L. Howald

Since Specialization

Citations

This map shows the geographic impact of L. Howald's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Howald with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Howald more than expected).

Fields of papers citing papers by L. Howald

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. Howald. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Howald. The network helps show where L. Howald may publish in the future.

Co-authorship network of co-authors of L. Howald

This figure shows the co-authorship network connecting the top 25 collaborators of L. Howald. A scholar is included among the top collaborators of L. Howald based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with L. Howald. L. Howald is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Parrat, D., Sébastian Gautsch, L. Howald, et al.. (2006). THE FAMARS INSTRUMENT: AN ATOMIC FORCE MICROSCOPE FOR THE PHOENIX MISSION. 1323. 8047. 4 indexed citations

Staufer, U., Takeo Akiyama, H.‐R. Hidber, et al.. (2003). Technological and Scientific challenges of Atomic Force Microscopy on Mars. Infoscience (Ecole Polytechnique Fédérale de Lausanne). 2 indexed citations

Gautsch, Sébastian, U. Staufer, H.‐R. Hidber, et al.. (2001). Miniaturized atomic force microscope for planetary exploration. ESASP. 480. 11–16. 3 indexed citations

Akiyama, Takeo, Sébastian Gautsch, Ν. F. de Rooij, et al.. (2001). Atomic force microscope for planetary applications. Sensors and Actuators A Physical. 91(3). 321–325. 17 indexed citations

Akiyama, Takeo, U. Staufer, Ν. F. de Rooij, L. Howald, & L. Scandella. (2001). Lithographically defined polymer tips for quartz tuning fork based scanning force microscopes. Microelectronic Engineering. 57-58. 769–773. 8 indexed citations

Pike, W. T., M. H. Hecht, M. S. Anderson, et al.. (2000). Atomic Force Microscope for Imaging and Spectroscopy. 3 indexed citations

Meyer, Ernst, R. Lüthi, L. Howald, et al.. (1996). Friction force microscopy on well defined surfaces. Nanotechnology. 7(4). 340–344. 8 indexed citations

Scandella, L., Ernst Meyer, L. Howald, et al.. (1996). Friction forces on hydrogen passivated (110) silicon and silicon dioxide studied by scanning force microscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(2). 1255–1258. 14 indexed citations

Terashima, Kazuo, et al.. (1996). Development of a mesoscale/nanoscale plasma generator. Thin Solid Films. 281-282. 634–636. 31 indexed citations

10.

Meyer, Ernst, et al.. (1995). Nanotribology: an UHV-SFM study on thin films of AgBr(001). Tribology Letters. 1(1). 23–33. 1 indexed citations

11.

Howald, L., H. Haefke, R. Lüthi, et al.. (1994). Ultrahigh-vacuum scanning force microscopy: Atomic-scale resolution at monatomic cleavage steps. Physical review. B, Condensed matter. 49(8). 5651–5656. 41 indexed citations

12.

Howald, L., R. Lüthi, Ernst Meyer, et al.. (1994). Friction force microscopy on clean surfaces of NaCl, NaF, and AgBr. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(3). 2227–2230. 24 indexed citations

13.

Lüthi, R., Ernst Meyer, H. Haefke, et al.. (1994). Sled-Type Motion on the Nanometer Scale: Determination of Dissipation and Cohesive Energies of C ₆₀. Science. 266(5193). 1979–1981. 148 indexed citations

14.

Meyer, Ernst, L. Howald, R. Lüthi, et al.. (1994). Scanning probe microscopy on the surface of Si(111). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(3). 2060–2063. 13 indexed citations

15.

Lüthi, R., Ernst Meyer, L. Howald, et al.. (1994). Progress in noncontact dynamic force microscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(3). 1673–1676. 33 indexed citations

16.

Meyer, Ernst, L. Howald, René M. Overney, et al.. (1992). Structure and dynamics of solid surfaces observed by atomic force microscopy. Ultramicroscopy. 42-44. 274–280. 19 indexed citations

17.

Overney, René M., L. Howald, Jane Frommer, et al.. (1992). Molecular surface structure of organic crystals observed by atomic force microscopy. Ultramicroscopy. 42-44. 983–988. 13 indexed citations

18.

Overney, René M., Ernst Meyer, Jane Frommer, et al.. (1992). Friction measurements on phase-separated thin films with a modified atomic force microscope. Nature. 359(6391). 133–135. 404 indexed citations breakdown →

19.

Meyer, Ernst, H. Heinzelmann, D. Brodbeck, et al.. (1991). Atomic resolution on the surface of LiF(100) by atomic force microscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(2). 1329–1332. 40 indexed citations

20.

Overney, René M., L. Howald, Jane Frommer, Ernst Meyer, & H.‐J. Güntherodt. (1991). Molecular surface structure of tetracene mapped by the atomic force microscope. The Journal of Chemical Physics. 94(12). 8441–8443. 24 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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