Kenneth A. Parulski
- Computer Vision and Pattern Recognition top 5%
- Media Technology top 5%
- Electrical and Electronic Engineering
- Aerospace Engineering
- Atomic and Molecular Physics, and Optics
- Co-authors
- Kevin E. SpauldingJames E. AdamsPeter D. BurnsKenichiro MasaokaM. HadleyJames R. MilchC. AnagnostopoulosTimothy J. Tredwell
- Topics
- CCD and CMOS Imaging Sensors (9 papers)Infrared Target Detection Methodologies (7 papers)Advanced Data Compression Techniques (4 papers)
- Partner nations
- United StatesJapanFrance
In The Last Decade
Kenneth A. Parulski
14 papers receiving 249 citations
Peers
Comparison fields: 5 of 55
- Computer Vision and Pattern Recognition 185
- Media Technology 90
- Electrical and Electronic Engineering 73
- Aerospace Engineering 53
- Atomic and Molecular Physics, and Optics 34
Countries citing papers authored by Kenneth A. Parulski
This map shows the geographic impact of Kenneth A. Parulski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kenneth A. Parulski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kenneth A. Parulski more than expected).
Fields of papers citing papers by Kenneth A. Parulski
This network shows the impact of papers produced by Kenneth A. Parulski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kenneth A. Parulski. The network helps show where Kenneth A. Parulski may publish in the future.
Co-authorship network of co-authors of Kenneth A. Parulski
This figure shows the co-authorship network connecting the top 25 collaborators of Kenneth A. Parulski. A scholar is included among the top collaborators of Kenneth A. Parulski based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kenneth A. Parulski. Kenneth A. Parulski is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 13 | |
| 2 | 1 | |
| 3 | 2 | |
| 4 | 4 | |
| 5 | Using Metadata to Simplify Digital Photography. | 1 |
| 6 | 173 | |
| 7 | 2 | |
| 8 | 3 | |
| 9 | 8 | |
| 10 | 4 | |
| 11 | 7 | |
| 12 | 5 | |
| 13 | 8 | |
| 14 | 53 |
About Kenneth A. Parulski
Kenneth A. Parulski is a scholar working on Computer Vision and Pattern Recognition, Aerospace Engineering and Electrical and Electronic Engineering, having authored 14 papers that have together received 284 indexed citations. Recurring topics across this work include CCD and CMOS Imaging Sensors (9 papers), Infrared Target Detection Methodologies (7 papers) and Advanced Data Compression Techniques (4 papers). The work is most often cited by research in Media Technology (90 citations), Computer Vision and Pattern Recognition (185 citations) and Aerospace Engineering (53 citations). Kenneth A. Parulski has collaborated with scholars based in United States, Japan and France. Frequent co-authors include Kevin E. Spaulding, James E. Adams, Peter D. Burns, Kenichiro Masaoka, M. Hadley, James R. Milch, C. Anagnostopoulos and Timothy J. Tredwell. Their work appears in journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Electron Devices and IEEE Micro.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.