J.-U. Thiele

857 citations
18 papers · 663 indexed · h-index 11

J.-U. Thiele

18 papers receiving 641 citations

Peers

J.-U. Thiele
Comparison fields: 5 of 51
  • Electronic, Optical and Magnetic Materials 285
  • Atomic and Molecular Physics, and Optics 404
  • Condensed Matter Physics 132
  • Surfaces, Coatings and Films 41
  • Materials Chemistry 223
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M. Cheon United States
E.A. Albanesi Argentina
M. F. Chisholm United States
Eiji Aoyagi Japan
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Citations per year

Countries citing papers authored by J.-U. Thiele

Since Specialization
Citations

This map shows the geographic impact of J.-U. Thiele's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.-U. Thiele with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.-U. Thiele more than expected).

Fields of papers citing papers by J.-U. Thiele

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.-U. Thiele. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.-U. Thiele. The network helps show where J.-U. Thiele may publish in the future.

Co-authorship network

The 25 scholars most cited alongside J.-U. Thiele, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J.-U. Thiele Line = papers co-authored together J.-U. Thiele links everyone, so they are left out of the graph.

All Works

18 of 18 papers shown
#Work
1
Comparison of EMI behavior in inverter and buck-converter operation of power modules by considering the diode reverse recovery effects
20161
2 201614
3 201015
4 20041
5 200313
6 200329
7 200329
8 2002253
9 200224
10 2002203
11 20012
12 20014
13 200021
14 19972
15 19978
16 19937
17 199324
18 199313

About J.-U. Thiele

J.-U. Thiele is a scholar working on Electronic, Optical and Magnetic Materials, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, General Materials Science and Biomedical Engineering, having authored 18 papers that have together received 663 indexed citations. Recurring topics across this work include Magnetic properties of thin films (16 papers), Magnetic Properties and Applications (8 papers), Characterization and Applications of Magnetic Nanoparticles (4 papers), Theoretical and Computational Physics (3 papers), Magnetic Properties of Alloys (2 papers), Physics of Superconductivity and Magnetism (2 papers), Rare-earth and actinide compounds (2 papers) and ZnO doping and properties (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (285 citations), Atomic and Molecular Physics, and Optics (404 citations), Condensed Matter Physics (132 citations), Surfaces, Coatings and Films (41 citations) and Materials Chemistry (223 citations). J.-U. Thiele has collaborated with scholars based in United States, Germany and France. Frequent co-authors include Michael F. Toney, Kevin R. Coffey, A. J. Kellock, Thomas Thomson, Jonathan A. Hedstrom, B. D. Terris, S. Anders, Shouheng Sun, Eric E. Fullerton and Hendrik F. Hamann. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, IEEE Transactions on Magnetics, Journal of the American Chemical Society and Applied Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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