Jonas Haunschild

1.1k total citations
52 papers, 873 citations indexed

About

Jonas Haunschild is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Jonas Haunschild has authored 52 papers receiving a total of 873 indexed citations (citations by other indexed papers that have themselves been cited), including 46 papers in Electrical and Electronic Engineering, 10 papers in Atomic and Molecular Physics, and Optics and 10 papers in Materials Chemistry. Recurrent topics in Jonas Haunschild's work include Silicon and Solar Cell Technologies (45 papers), Thin-Film Transistor Technologies (33 papers) and Integrated Circuits and Semiconductor Failure Analysis (18 papers). Jonas Haunschild is often cited by papers focused on Silicon and Solar Cell Technologies (45 papers), Thin-Film Transistor Technologies (33 papers) and Integrated Circuits and Semiconductor Failure Analysis (18 papers). Jonas Haunschild collaborates with scholars based in Germany, United Kingdom and Netherlands. Jonas Haunschild's co-authors include Stefan Rein, Markus Glatthaar, Martin Käsemann, Matthias Demant, Eicke R. Weber, Wilhelm Warta, Hannes Höffler, Johannes Giesecke, Thorsten Trupke and Bernhard Michl and has published in prestigious journals such as Journal of Applied Physics, Solar Energy Materials and Solar Cells and Progress in Photovoltaics Research and Applications.

In The Last Decade

Jonas Haunschild

49 papers receiving 836 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jonas Haunschild Germany 15 834 195 166 127 75 52 873
K. Petter Germany 13 708 0.8× 204 1.0× 190 1.1× 159 1.3× 12 0.2× 38 759
Oliver Kunz Australia 16 756 0.9× 55 0.3× 198 1.2× 358 2.8× 32 0.4× 54 842
Adeline Sugianto Australia 13 558 0.7× 179 0.9× 98 0.6× 130 1.0× 8 0.1× 32 576
Hannes Höffler Germany 12 391 0.5× 107 0.5× 99 0.6× 55 0.4× 20 0.3× 43 410
Stephan Großer Germany 17 1.1k 1.4× 227 1.2× 561 3.4× 170 1.3× 8 0.1× 37 1.2k
Vinodh Shanmugam Singapore 16 612 0.7× 225 1.2× 143 0.9× 125 1.0× 5 0.1× 39 661
Sina Swatek Germany 8 532 0.6× 64 0.3× 351 2.1× 59 0.5× 10 0.1× 11 589
M. Hejjo Al Rifai Germany 6 355 0.4× 57 0.3× 128 0.8× 101 0.8× 16 0.2× 9 423
Fabian Fertig Germany 15 708 0.8× 186 1.0× 258 1.6× 119 0.9× 9 0.1× 46 751
Kenta Matsuyama Japan 6 1.0k 1.2× 276 1.4× 125 0.8× 371 2.9× 6 0.1× 7 1.1k

Countries citing papers authored by Jonas Haunschild

Since Specialization
Citations

This map shows the geographic impact of Jonas Haunschild's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jonas Haunschild with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jonas Haunschild more than expected).

Fields of papers citing papers by Jonas Haunschild

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jonas Haunschild. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jonas Haunschild. The network helps show where Jonas Haunschild may publish in the future.

Co-authorship network of co-authors of Jonas Haunschild

This figure shows the co-authorship network connecting the top 25 collaborators of Jonas Haunschild. A scholar is included among the top collaborators of Jonas Haunschild based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jonas Haunschild. Jonas Haunschild is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Schmitz, Jurriaan, et al.. (2025). Inline Mapping of Amorphous Silicon Layer Thickness of Heterojunction Precursors Using Multispectral Imaging. University of Twente Research Information. 2. 1 indexed citations
2.
Vahlman, Henri, et al.. (2023). Monitoring of porous silicon layers for epitaxial wafer production using inline reflectance spectroscopy. AIP conference proceedings. 2826. 120004–120004. 1 indexed citations
3.
Vahlman, Henri, et al.. (2022). Monitoring of Porous Silicon Layers Used for Epitaxial Wafer Production With Inline Reflectance Spectroscopy. IEEE Journal of Photovoltaics. 12(4). 989–998. 2 indexed citations
4.
Höffler, Hannes, et al.. (2017). Comparison of line-wise pl-imaging and area-wise pl-imaging. Energy Procedia. 124. 66–75. 5 indexed citations
5.
Haunschild, Jonas, et al.. (2017). Predicting bulk lifetime values by applying wet chemistry H-termination for inline quality control of silicon wafers. Energy Procedia. 124. 2–9. 1 indexed citations
6.
Höffler, Hannes, Jonas Haunschild, & Stefan Rein. (2016). Influence of external contacting on electroluminescence and fill factor measurements. Solar Energy Materials and Solar Cells. 152. 180–186. 6 indexed citations
7.
Demant, Matthias, et al.. (2015). Inline quality rating of multi‐crystalline wafers based on photoluminescence images. Progress in Photovoltaics Research and Applications. 24(12). 1533–1546. 22 indexed citations
8.
Höffler, Hannes, Otwin Breitenstein, & Jonas Haunschild. (2014). Short-Circuit Current Density Imaging Via PL Image Evaluation Based on Implied Voltage Distribution. IEEE Journal of Photovoltaics. 5(2). 613–618. 9 indexed citations
9.
Höffler, Hannes, Johannes Greulich, Jonas Haunschild, & Stefan Rein. (2014). Simulation of luminescence intensity combining PC1D electrical simulation with analytical optical models. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 124–128.
10.
Demant, Matthias, Johannes Greulich, Markus Glatthaar, Jonas Haunschild, & Stefan Rein. (2012). Modelling of Physically Relevant Features in Photoluminescence Images. Energy Procedia. 27. 247–252. 7 indexed citations
11.
Haunschild, Jonas, et al.. (2012). A Method to Detect Defective Solder Joints by RS-Electroluminescence Imaging. Energy Procedia. 27. 652–657. 6 indexed citations
12.
Zimmer, Martin, et al.. (2012). Relation between solar cell efficiency and crystal defect etching induced by acidic texturization on multicrystalline silicon material. Solar Energy Materials and Solar Cells. 105. 159–166. 14 indexed citations
13.
Sinton, Ronald A., Jonas Haunschild, Matthias Demant, & Stefan Rein. (2012). Comparing lifetime and photoluminescence imaging pattern recognition methodologies for predicting solar cell results based on as‐cut wafer properties. Progress in Photovoltaics Research and Applications. 21(8). 1634–1639. 6 indexed citations
14.
Trupke, Thorsten, et al.. (2011). Luminescence imaging for inline characterisation in silicon photovoltaics. physica status solidi (RRL) - Rapid Research Letters. 5(4). 131–137. 48 indexed citations
15.
Glatthaar, Markus, Jonas Haunschild, Matthias Demant, et al.. (2010). Evaluating luminescence based voltage images of silicon solar cells. Journal of Applied Physics. 108(1). 85 indexed citations
16.
Haunschild, Jonas, Markus Glatthaar, Matthias Demant, et al.. (2010). Quality control of as-cut multicrystalline silicon wafers using photoluminescence imaging for solar cell production. Solar Energy Materials and Solar Cells. 94(12). 2007–2012. 78 indexed citations
17.
Specht, J., Maximilian Pospischil, D. Erath, et al.. (2010). High Aspect Ratio Front Contacts by Single Step Dispensing of Metal Pastes. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1867–1870. 13 indexed citations
18.
Rentsch, J., Roland Ackermann, Jonas Haunschild, et al.. (2009). Wet Chemical Processing for c-Si Solar Cells - Status and Perspectives. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1113–1117. 9 indexed citations
19.
Glatthaar, Markus, et al.. (2009). Spatially resolved determination of the dark saturation current of silicon solar cells from electroluminescence images. Journal of Applied Physics. 105(11). 40 indexed citations
20.
Haunschild, Jonas, Markus Glatthaar, Martin Käsemann, Stefan Rein, & Eicke R. Weber. (2009). Fast series resistance imaging for silicon solar cells using electroluminescence. physica status solidi (RRL) - Rapid Research Letters. 3(7-8). 227–229. 93 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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