Jien-Wei Yeh
- Electrical and Electronic Engineering top 10%
- Materials Chemistry
- Electronic, Optical and Magnetic Materials top 10%
- Mechanical Engineering
- Renewable Energy, Sustainability and the Environment
- Co-authors
- Han C. ShihMeng-Lun LeeJin‐Ming ChenShih‐Chieh LiaoArnold C.‐M. YangYu HuangYu-Han LiYen‐Fa Liao
- Topics
- ZnO doping and properties (7 papers)Advancements in Battery Materials (5 papers)Ga2O3 and related materials (5 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsAutomotive EngineeringElectrical and Electronic Engineering
- Partner nations
- TaiwanIndiaUnited States
In The Last Decade
Jien-Wei Yeh
21 papers receiving 555 citations
Peers
Comparison fields: 5 of 31
- Electrical and Electronic Engineering 378
- Materials Chemistry 253
- Electronic, Optical and Magnetic Materials 214
- Mechanical Engineering 125
- Renewable Energy, Sustainability and the Environment 83
Countries citing papers authored by Jien-Wei Yeh
This map shows the geographic impact of Jien-Wei Yeh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jien-Wei Yeh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jien-Wei Yeh more than expected).
Fields of papers citing papers by Jien-Wei Yeh
This network shows the impact of papers produced by Jien-Wei Yeh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jien-Wei Yeh. The network helps show where Jien-Wei Yeh may publish in the future.
Co-authorship network of co-authors of Jien-Wei Yeh
This figure shows the co-authorship network connecting the top 25 collaborators of Jien-Wei Yeh. A scholar is included among the top collaborators of Jien-Wei Yeh based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jien-Wei Yeh. Jien-Wei Yeh is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 7 | |
| 3 | 118 | |
| 4 | 26 | |
| 5 | 2 | |
| 6 | 2 | |
| 7 | 39 | |
| 8 | 22 | |
| 9 | 32 | |
| 10 | 28 | |
| 11 | 12 | |
| 12 | 22 | |
| 13 | 26 | |
| 14 | 28 | |
| 15 | 30 | |
| 16 | 17 | |
| 17 | 25 | |
| 18 | 12 | |
| 19 | 39 | |
| 20 | 75 |
About Jien-Wei Yeh
Jien-Wei Yeh is a scholar working on Electronic, Optical and Magnetic Materials, Metals and Alloys and Automotive Engineering, having authored 21 papers that have together received 566 indexed citations. Recurring topics across this work include ZnO doping and properties (7 papers), Advancements in Battery Materials (5 papers) and Ga2O3 and related materials (5 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (214 citations), Automotive Engineering (80 citations) and Electrical and Electronic Engineering (378 citations). Jien-Wei Yeh has collaborated with scholars based in Taiwan, India and United States. Frequent co-authors include Han C. Shih, Meng-Lun Lee, Jin‐Ming Chen, Shih‐Chieh Liao, Arnold C.‐M. Yang, Yu Huang, Yu-Han Li, Yen‐Fa Liao, Han‐Yi Chen and Ming‐Hsien Lin. Their work appears in journals such as ACS Nano, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.