Jens Emmerlich

2.9k total citations
45 papers, 2.6k citations indexed

About

Jens Emmerlich is a scholar working on Materials Chemistry, Mechanics of Materials and Ceramics and Composites. According to data from OpenAlex, Jens Emmerlich has authored 45 papers receiving a total of 2.6k indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Materials Chemistry, 24 papers in Mechanics of Materials and 14 papers in Ceramics and Composites. Recurrent topics in Jens Emmerlich's work include MXene and MAX Phase Materials (31 papers), Metal and Thin Film Mechanics (23 papers) and Advanced ceramic materials synthesis (14 papers). Jens Emmerlich is often cited by papers focused on MXene and MAX Phase Materials (31 papers), Metal and Thin Film Mechanics (23 papers) and Advanced ceramic materials synthesis (14 papers). Jens Emmerlich collaborates with scholars based in Germany, Sweden and Spain. Jens Emmerlich's co-authors include Jochen M. Schneider, Hans Högberg, Lars Hultman, Per Eklund, Ulf Jansson, O. Wilhelmsson, J.-P. Palmquist, Per O. Å. Persson, Denis Mušić and Rajeev Ahuja and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Physical Review B.

In The Last Decade

Jens Emmerlich

44 papers receiving 2.5k citations

Peers

Jens Emmerlich

EEE

C. Tromas France

P. Polcik Germany

G.J. Zhang China

S.K. Mishra India

M. Bartosik Austria

R. Daniel Austria

H. Riedl Austria

Dongchan Jang South Korea

Bernhard Sartory Austria

C. Tromas France

Jens Emmerlich

1.3k ×0.6

893 ×0.7

905 ×0.9

411 ×0.6

338 ×0.8

EEE

Citations per year, relative to Jens Emmerlich Jens Emmerlich (= 1×) peers C. Tromas

Countries citing papers authored by Jens Emmerlich

Since Specialization

Citations

This map shows the geographic impact of Jens Emmerlich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jens Emmerlich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jens Emmerlich more than expected).

Fields of papers citing papers by Jens Emmerlich

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jens Emmerlich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jens Emmerlich. The network helps show where Jens Emmerlich may publish in the future.

Co-authorship network of co-authors of Jens Emmerlich

This figure shows the co-authorship network connecting the top 25 collaborators of Jens Emmerlich. A scholar is included among the top collaborators of Jens Emmerlich based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jens Emmerlich. Jens Emmerlich is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Herdrich, Georg, et al.. (2024). Characterization of a radially emitting spray jet in a cylindrical inertial electrostatic confinement plasma source based on particle in cell simulation. Vacuum. 228. 113480–113480. 1 indexed citations

Emmerlich, Jens, et al.. (2024). Influence of electrode transparency on the plasma properties of a cylindrical IEC plasma source. Vacuum. 230. 113711–113711. 1 indexed citations

Hofmann, Patrick, Jens Emmerlich, Yung-An Chan, et al.. (2021). Cylindrical inertial electrostatic confinement plasma source for surface treatment. Vacuum. 193. 110502–110502. 9 indexed citations

Emmerlich, Jens, et al.. (2013). Stability, elastic properties and fracture toughness of Al_0.75X_0.75B₁₄(X=Sc, Ti, V, Cr, Y, Zr, Nb, Mo) investigated usingab initiocalculations. Journal of Physics Condensed Matter. 25(33). 335501–335501. 11 indexed citations

Mráz, Stanislav, et al.. (2013). Angle-resolved evolution of the composition of Cr–Al–C thin films deposited by sputtering of a compound target. Journal of Physics D Applied Physics. 46(13). 135501–135501. 22 indexed citations

Bolvardi, Hamid, et al.. (2012). Systematic study on the electronic structure and mechanical properties of X₂BC (X = Mo, Ti, V, Zr, Nb, Hf, Ta and W). Journal of Physics Condensed Matter. 25(4). 45501–45501. 49 indexed citations

Mušić, Denis, et al.. (2009). Phase stability of AlYB₁₄sputtered thin films. Journal of Physics Condensed Matter. 21(35). 355006–355006. 10 indexed citations

Emmerlich, Jens, et al.. (2009). A proposal for an unusually stiff and moderately ductile hard coating material: Mo₂BC. Journal of Physics D Applied Physics. 42(18). 185406–185406. 76 indexed citations

Emmerlich, Jens, et al.. (2007). Systematic study on the pressure dependence ofM2AlCphases(M=Ti,V,Cr,Zr,Nb,Mo,Hf,Ta,W). Physical Review B. 76(22). 68 indexed citations

10.

Baumgärtner, Werner, Friederike Saxe, Agnes Weth, et al.. (2007). The sandfish’s skin: Morphology, chemistry and reconstruction. Journal of Bionic Engineering. 4(1). 1–9. 49 indexed citations

11.

Schneider, Jochen M., et al.. (2007). Elastic properties of Cr2AlC thin films probed by nanoindentation and ab initio molecular dynamics. Scripta Materialia. 57(12). 1137–1140. 85 indexed citations

12.

Emmerlich, Jens, Gert Gassner, Per Eklund, Hans Högberg, & Lars Hultman. (2007). Micro and macroscale tribological behavior of epitaxial Ti3SiC2 thin films. Wear. 264(11-12). 914–919. 36 indexed citations

13.

Emmerlich, Jens. (2006). MAX phase thin films : unique multifunctional ceramics with the elements Ti, Si, Ge, Sn, and C. 1 indexed citations

14.

Högberg, Hans, Jens Emmerlich, Per Eklund, et al.. (2006). Growth and Property Characterization of Epitaxial MAX-Phase Thin Films from the Ti<sub>n+1</sub>(Si, Ge, Sn)C<sub>n</sub> Systems. Advances in science and technology. 45. 2648–2655. 22 indexed citations

15.

Alami, Jones, Per Eklund, Jens Emmerlich, et al.. (2006). High-power impulse magnetron sputtering of Ti–Si–C thin films from a Ti3SiC2 compound target. Thin Solid Films. 515(4). 1731–1736. 93 indexed citations

16.

Magnuson, Martin, Maurizio Mattesini, O. Wilhelmsson, et al.. (2006). Electronic structure and chemical bonding inTi4SiC3investigated by soft x-ray emission spectroscopy and first-principles theory. Physical Review B. 74(20). 42 indexed citations

17.

Magnuson, Martin, J.-P. Palmquist, Maurizio Mattesini, et al.. (2005). Electronic structure investigation ofTi3AlC2,Ti3SiC2, andTi3GeC2by soft x-ray emission spectroscopy. Physical Review B. 72(24). 62 indexed citations

18.

Eklund, Per, Jens Emmerlich, Hans Högberg, et al.. (2005). Structural, electrical, and mechanical properties of nc-TiC∕a-SiC nanocomposite thin films. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 23(6). 2486–2495. 68 indexed citations

19.

Högberg, Hans, Per Eklund, Jens Emmerlich, Jens Birch, & L. Hultman. (2005). Epitaxial Ti₂GeC, Ti₃GeC₂, and Ti₄GeC₃ MAX-phase thin films grown by magnetron sputtering. Journal of materials research/Pratt's guide to venture capital sources. 20(4). 779–782. 131 indexed citations

20.

Riascos, Henry, J. Neidhardt, G. Radnóczi, et al.. (2005). Structure and properties of pulsed-laser deposited carbon nitride thin films. Thin Solid Films. 497(1-2). 1–6. 34 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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