Jeff Kemp
- Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis 2
- Advanced X-ray Imaging Techniques 1
- Nuclear Physics and Applications 1
- Archeology top 10%
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- Electron and X-Ray Spectroscopy Techniques 2
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- Spectroscopy and Quantum Chemical Studies 1
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- Medical Imaging Techniques and Applications 1
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- RFID technology advancements 1
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- Advanced Antenna and Metasurface Technologies 1
- Co-authors
- G. AndermannKerry JacobsJ. Louise JonesPierre SabourouxJames L. JonesL. ZeitzRedha AbdeddaïmScott Bergeson
- Journals
- Analytical Chemistry (2 papers)Accounting Auditing & Accountability Journal (1 paper)IEEE Antennas and Propagation Magazine (1 paper)
- Partner nations
- United StatesFranceUnited Kingdom
In The Last Decade
Jeff Kemp
6 papers receiving 221 citations
Peers
Comparison fields: 5 of 79
- Radiation 140
- Radiological and Ultrasound Technology 20
- Management Information Systems 32
- Archeology 26
- Geochemistry and Petrology 15
Countries citing papers authored by Jeff Kemp
This map shows the geographic impact of Jeff Kemp's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeff Kemp with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeff Kemp more than expected).
Fields of papers citing papers by Jeff Kemp
This network shows the impact of papers produced by Jeff Kemp. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeff Kemp. The network helps show where Jeff Kemp may publish in the future.
Co-authorship network
The 10 scholars most cited alongside Jeff Kemp, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 6 | |
| 2 | EUV Spectrometers for Source Development, Characterization and Optimization | 2008 | 1 |
| 3 | 2002 | 55 | |
| 4 | 1958 | 207 | |
| 5 | 1956 | 4 | |
| 6 | 1955 | 5 | |
| 7 | 1952 | 11 |
About Jeff Kemp
Jeff Kemp is a scholar working on Radiation, Surfaces, Coatings and Films and Electrochemistry, having authored 7 papers that have together received 289 indexed citations. Recurring topics across this work include X-ray Spectroscopy and Fluorescence Analysis (2 papers), Electron and X-Ray Spectroscopy Techniques (2 papers), Spectroscopy and Quantum Chemical Studies (1 paper), Medical Imaging Techniques and Applications (1 paper), RFID technology advancements (1 paper), Advanced Antenna and Metasurface Technologies (1 paper), Advanced X-ray Imaging Techniques (1 paper) and Nuclear Physics and Applications (1 paper). The work is most often cited by research in Radiation (140 citations), Radiological and Ultrasound Technology (20 citations) and Management Information Systems (32 citations). Jeff Kemp has collaborated with scholars based in United States, France and United Kingdom. Frequent co-authors include G. Andermann, Kerry Jacobs, J. Louise Jones, Pierre Sabouroux, James L. Jones, L. Zeitz, Redha Abdeddaïm, Scott Bergeson, Larry V. Knight and A. P. Shevelko. Their work appears in journals such as Analytical Chemistry, Accounting Auditing & Accountability Journal, IEEE Antennas and Propagation Magazine, Journal of the Optical Society of America and Spectrochimica Acta.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.