Jeff Gelb

3.6k total citations
82 papers, 3.0k citations indexed

About

Jeff Gelb is a scholar working on Materials Chemistry, Radiation and Electrical and Electronic Engineering. According to data from OpenAlex, Jeff Gelb has authored 82 papers receiving a total of 3.0k indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Materials Chemistry, 24 papers in Radiation and 23 papers in Electrical and Electronic Engineering. Recurrent topics in Jeff Gelb's work include Electron and X-Ray Spectroscopy Techniques (22 papers), Advanced X-ray Imaging Techniques (21 papers) and Advanced Electron Microscopy Techniques and Applications (12 papers). Jeff Gelb is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (22 papers), Advanced X-ray Imaging Techniques (21 papers) and Advanced Electron Microscopy Techniques and Applications (12 papers). Jeff Gelb collaborates with scholars based in United States, United Kingdom and China. Jeff Gelb's co-authors include Paul R. Shearing, Nigel P. Brandon, Philip J. Withers, Dan J. L. Brett, Shawn Litster, Arno Merkle, William K. Epting, Samuel J. Cooper, Robert S. Bradley and Allen Gu and has published in prestigious journals such as Proceedings of the National Academy of Sciences, Advanced Functional Materials and Applied and Environmental Microbiology.

In The Last Decade

Jeff Gelb

77 papers receiving 2.9k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jeff Gelb United States 31 1.0k 1.0k 543 498 448 82 3.0k
Beat Münch Switzerland 30 1.1k 1.0× 619 0.6× 137 0.3× 473 0.9× 355 0.8× 51 3.7k
Lorenz Holzer Switzerland 42 2.1k 2.0× 1.0k 1.0× 236 0.4× 471 0.9× 692 1.5× 94 6.0k
Wilson K. S. Chiu United States 37 1.6k 1.5× 1.3k 1.3× 189 0.3× 1.0k 2.1× 816 1.8× 177 3.9k
Yanan Fu China 34 1.5k 1.5× 492 0.5× 397 0.7× 461 0.9× 1.9k 4.3× 171 3.9k
Daniel S. Hussey United States 38 1.0k 1.0× 2.9k 2.9× 512 0.9× 645 1.3× 408 0.9× 214 4.6k
Jacob M. LaManna United States 27 422 0.4× 1.4k 1.4× 260 0.5× 261 0.5× 149 0.3× 96 2.2k
Pavel Trtik Switzerland 32 830 0.8× 317 0.3× 92 0.2× 665 1.3× 379 0.8× 135 3.7k
Kejun Dong China 36 1.3k 1.2× 747 0.7× 133 0.2× 326 0.7× 1.2k 2.7× 252 4.1k
Lang Zhou China 33 1.9k 1.8× 2.2k 2.2× 228 0.4× 643 1.3× 799 1.8× 266 4.2k
Martin Müller Germany 42 1.8k 1.7× 2.7k 2.6× 728 1.3× 453 0.9× 831 1.9× 215 5.4k

Countries citing papers authored by Jeff Gelb

Since Specialization
Citations

This map shows the geographic impact of Jeff Gelb's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeff Gelb with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeff Gelb more than expected).

Fields of papers citing papers by Jeff Gelb

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jeff Gelb. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeff Gelb. The network helps show where Jeff Gelb may publish in the future.

Co-authorship network of co-authors of Jeff Gelb

This figure shows the co-authorship network connecting the top 25 collaborators of Jeff Gelb. A scholar is included among the top collaborators of Jeff Gelb based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jeff Gelb. Jeff Gelb is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Keleṣ, Özgür, et al.. (2018). Stochastic fracture of additively manufactured porous composites. Scientific Reports. 8(1). 15437–15437. 33 indexed citations
2.
Gelb, Jeff, et al.. (2018). A novel micro-double cantilever beam (micro-DCB) test in an X-ray microscope to study crack propagation in materials and structures. Materials Today Communications. 16. 293–299. 10 indexed citations
3.
Andrew, Matthew, et al.. (2016). Non-Invasive Multi-Scale Imaging and Modelling Using X-Ray Microscopy. Microscopy and Microanalysis. 22(S3). 108–109. 2 indexed citations
4.
Merkle, Arno, et al.. (2014). Fusing Multi-scale and Multi-modal 3D Imaging and Characterization. Microscopy and Microanalysis. 20(S3). 820–821. 3 indexed citations
5.
Merkle, Arno, et al.. (2014). X-ray Microscopy: The Cornerstone for Correlative Characterization Methods in Materials Research and Life Science. Microscopy and Microanalysis. 20(S3). 986–987. 2 indexed citations
6.
Carlson, David B., et al.. (2013). Laboratory-Based Cryogenic Soft X-Ray Tomography with Correlative Cryo-Light and Electron Microscopy. Microscopy and Microanalysis. 19(1). 22–29. 23 indexed citations
7.
Manickam, Seetha S, Jeff Gelb, & Jeffrey R. McCutcheon. (2013). Pore structure characterization of asymmetric membranes: Non-destructive characterization of porosity and tortuosity. Journal of Membrane Science. 454. 549–554. 75 indexed citations
8.
Tariq, Farid, Vladimir Yufit, Masashi Kishimoto, et al.. (2013). Three-dimensional high resolution X-ray imaging and quantification of lithium ion battery mesocarbon microbead anodes. Journal of Power Sources. 248. 1014–1020. 71 indexed citations
9.
Merkle, Arno & Jeff Gelb. (2013). The Ascent of 3D X-ray Microscopy in the Laboratory. Microscopy Today. 21(2). 10–15. 58 indexed citations
10.
Merkle, Arno & Jeff Gelb. (2013). Recent Advancements in Laboratory X-ray Microscopes enabling 3D and 4D Science. Microscopy and Microanalysis. 19(S2). 1314–1315. 5 indexed citations
11.
Priester, John H., Yuan Ge, Randall E. Mielke, et al.. (2012). Soybean susceptibility to manufactured nanomaterials with evidence for food quality and soil fertility interruption. Proceedings of the National Academy of Sciences. 109(37). E2451–6. 371 indexed citations
12.
Gelb, Jeff. (2012). Functionality to Failure: Materials Engineering in the 4th Dimension. AM&P Technical Articles. 170(10). 14–18. 3 indexed citations
13.
Yuan, Qingxi, Kai Zhang, Youli Hong, et al.. (2012). A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF. Journal of Synchrotron Radiation. 19(6). 1021–1028. 85 indexed citations
14.
Andrews, Joy C., Eduardo Almeida, Marjolein C. H. van der Meulen, et al.. (2010). Nanoscale X-Ray Microscopic Imaging of Mammalian Mineralized Tissue. Microscopy and Microanalysis. 16(3). 327–336. 71 indexed citations
15.
Yin, Leilei, et al.. (2010). High-resolution 3D imaging of polymerized photonic crystals by lab-based x-ray nanotomography with 50-nm resolution. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7804. 78040R–78040R. 1 indexed citations
16.
Guan, Yong, Yunhui Gong, Gang Liu, et al.. (2010). The study of the reconstructed three-dimensional structure of a solid-oxide fuel-cell cathode by X-ray nanotomography. Journal of Synchrotron Radiation. 17(6). 782–785. 15 indexed citations
17.
Andrews, Joy C., S. Brennan, Yijin Liu, et al.. (2009). Full-field transmission x-ray microscopy for bio-imaging. Journal of Physics Conference Series. 186. 12081–12081. 22 indexed citations
18.
Shearing, Paul R., Jeff Gelb, & Nigel P. Brandon. (2009). Characterization of SOFC Electrode Microstructure Using Nano-Scale X-ray Computed Tomography and Focused Ion Beam Techniques: a Comparative Study. ECS Transactions. 19(17). 51–57. 11 indexed citations
19.
Wang, Steve, Jeff Gelb, S. H. Lau, & Wenbing Yun. (2009). Metrology of 3D IC with X-ray Microscopy and nano-scale X-ray CT. 63. 131–133. 4 indexed citations
20.
Feser, Michael, Jeff Gelb, Huibin Chang, et al.. (2008). Sub-micron resolution CT for failure analysis and process development. Measurement Science and Technology. 19(9). 94001–94001. 73 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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