J. Zemek

547 total citations
37 papers, 471 citations indexed

About

J. Zemek is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, J. Zemek has authored 37 papers receiving a total of 471 indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Electrical and Electronic Engineering, 21 papers in Materials Chemistry and 10 papers in Surfaces, Coatings and Films. Recurrent topics in J. Zemek's work include Electron and X-Ray Spectroscopy Techniques (9 papers), Thin-Film Transistor Technologies (9 papers) and Silicon Nanostructures and Photoluminescence (9 papers). J. Zemek is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (9 papers), Thin-Film Transistor Technologies (9 papers) and Silicon Nanostructures and Photoluminescence (9 papers). J. Zemek collaborates with scholars based in Czechia, Bulgaria and Italy. J. Zemek's co-authors include M. Závětovà, Hynek Biederman, L. Martinů, O. Renner, A. Jabłoński, K. Olejník, Wolfgang Werner, V. Čápek, A. Luches and G. Leggieri and has published in prestigious journals such as Journal of Applied Physics, Physical Review B and Sensors and Actuators B Chemical.

In The Last Decade

J. Zemek

37 papers receiving 450 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Zemek Czechia 13 255 215 125 110 69 37 471
T. Miyano Japan 12 123 0.5× 233 1.1× 141 1.1× 165 1.5× 43 0.6× 22 464
H. Ahmed United Kingdom 15 404 1.6× 381 1.8× 173 1.4× 102 0.9× 44 0.6× 57 732
M. J. Hill United Kingdom 12 206 0.8× 158 0.7× 52 0.4× 241 2.2× 31 0.4× 26 585
A. R. Chourasia United States 13 180 0.7× 280 1.3× 58 0.5× 77 0.7× 62 0.9× 51 456
A.S. Nigavekar India 12 142 0.6× 218 1.0× 48 0.4× 124 1.1× 80 1.2× 45 410
V. Sh. Machavariani Israel 8 89 0.3× 253 1.2× 125 1.0× 38 0.3× 70 1.0× 22 479
M. Azizan France 12 235 0.9× 237 1.1× 63 0.5× 151 1.4× 41 0.6× 39 431
Y. Tomokiyo Japan 12 163 0.6× 376 1.7× 37 0.3× 162 1.5× 118 1.7× 45 676
M. Eddrief France 16 483 1.9× 516 2.4× 38 0.3× 221 2.0× 153 2.2× 33 781
M. Falke Germany 15 314 1.2× 377 1.8× 118 0.9× 230 2.1× 80 1.2× 57 743

Countries citing papers authored by J. Zemek

Since Specialization
Citations

This map shows the geographic impact of J. Zemek's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Zemek with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Zemek more than expected).

Fields of papers citing papers by J. Zemek

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Zemek. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Zemek. The network helps show where J. Zemek may publish in the future.

Co-authorship network of co-authors of J. Zemek

This figure shows the co-authorship network connecting the top 25 collaborators of J. Zemek. A scholar is included among the top collaborators of J. Zemek based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Zemek. J. Zemek is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Jabłoński, A. & J. Zemek. (2007). Angle-resolved elastic peak electron spectroscopy: Role of surface excitations. Surface Science. 601(16). 3409–3420. 19 indexed citations
2.
Kuřitka, Ivo, F. Schauer, Petr Sáha, et al.. (2006). UV degradability of polysilanes for nanoresists examined by electron spectroscopies and photoluminescence. Czechoslovak Journal of Physics. 56(1). 41–50. 5 indexed citations
3.
Olejník, K., J. Zemek, & Wolfgang Werner. (2005). Angular-resolved photoelectron spectroscopy of corrugated surfaces. Surface Science. 595(1-3). 212–222. 35 indexed citations
4.
Schauer, F., S. Nešpůrek, Pavel Horváth, J. Zemek, & Vlastimil Fidler. (2000). Luminescence as a tool for crosslinking determination in plasma polysilylenes prepared from organosilanes. Synthetic Metals. 109(1-3). 321–325. 10 indexed citations
5.
Vrňata, Martin, et al.. (2000). The response of tin acetylacetonate and tin dioxide-based gas sensors to hydrogen and alcohol vapours. Sensors and Actuators B Chemical. 71(1-2). 24–30. 31 indexed citations
6.
Horváth, Pavel, F. Schauer, Ivo Kuřitka, et al.. (2000). Luminescence in plasma polysilylenes prepared from organosilanes. Journal of Non-Crystalline Solids. 266-269. 989–993. 3 indexed citations
7.
Lesiak, B., Andrzej S. Kosinski, M. Krawczyk, et al.. (1999). Determination of the electron inelastic mean free path in polyacetylene by elastic peak electron spectroscopy using different spectrometers. Applied Surface Science. 144-145. 168–172. 12 indexed citations
8.
Zemek, J., et al.. (1998). Escape probability of s-photoelectrons leaving aluminium and copper oxides. Surface and Interface Analysis. 26(3). 182–187. 21 indexed citations
9.
Biederman, Hynek, et al.. (1997). Composite metal/C:H films prepared in an unbalanced magnetron. Vacuum. 48(10). 883–886. 13 indexed citations
10.
Luches, A., Anna Paola Caricato, G. Leggieri, et al.. (1996). <title>Laser reactive ablation deposition of carbon nitride thin films</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2789. 293–304. 3 indexed citations
11.
Leggieri, G., A. Luches, A. Perrone, et al.. (1996). Reactive laser ablation deposition of C-N films. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2777. 128–128. 1 indexed citations
12.
Mihãilescu, I. N., V. Crăciun, L. C. Nistor, et al.. (1991). Direct nitridation of a silicon surface by multipulse excimer laser irradiation in a nitrogen-containing ambient gas. Journal of Applied Physics. 70(4). 2123–2131. 7 indexed citations
13.
D’Anna, E., G. Leggieri, A. Luches, et al.. (1990). Surface nitridation by multipulse excimer laser irradiation. Progress in Surface Science. 35(1-4). 129–142. 3 indexed citations
14.
Martinů, L., Hynek Biederman, & J. Zemek. (1985). Metal doped polymer films prepared by simultaneous plasma polymerization of tetrafluoromethane and evaporation of gold. Vacuum. 35(4-5). 171–176. 47 indexed citations
15.
Zemek, J., et al.. (1983). Investigation of in-situ sputtered a-Si(H) by AES. Solar Energy Materials. 9(2). 183–187. 1 indexed citations
16.
Čápek, V., et al.. (1975). On a possibility to estimate the density op states from measurements op δ(T) in amorphous elemental semiconductors. Czechoslovak Journal of Physics. 25(6). 718–722. 4 indexed citations
17.
Závětovà, M., et al.. (1975). Physical properties of amorphous Si: The role of annealing. Czechoslovak Journal of Physics. 25(1). 83–90. 4 indexed citations
18.
Závětovà, M., et al.. (1973). Note on heavily doped amorphous germanium. Czechoslovak Journal of Physics. 23(1). 155–156. 3 indexed citations
19.
Renner, O. & J. Zemek. (1973). Density of amorphous silicon films. Czechoslovak Journal of Physics. 23(11). 1273–1276. 28 indexed citations
20.
Závětovà, M., et al.. (1972). Steep vs. exponential absorption edge in amorphous germanium: Evidence for the efefct of oxygen. Czechoslovak Journal of Physics. 22(5). 429–431. 19 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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