J. S. Vermaak
- Materials Chemistry top 5%
- Atomic and Molecular Physics, and Optics top 5%
- Electrical and Electronic Engineering top 10%
- Atmospheric Science top 5%
- Biomedical Engineering
- Co-authors
- D. Kuhlmann‐WilsdorfHarvey J. WassermanC.W. MaysJ. H. van der MerweF.D. AuretA.W.R. LeitchJ. PetruzzelloLukas W. Snyman
- Topics
- Semiconductor Quantum Structures and Devices (12 papers)Semiconductor materials and interfaces (7 papers)nanoparticles nucleation surface interactions (7 papers)
- Partner nations
- South AfricaUnited StatesCanada
In The Last Decade
J. S. Vermaak
39 papers receiving 1.3k citations
Peers
Comparison fields: 5 of 51
- Materials Chemistry 750
- Atomic and Molecular Physics, and Optics 517
- Electrical and Electronic Engineering 393
- Atmospheric Science 387
- Biomedical Engineering 218
Countries citing papers authored by J. S. Vermaak
This map shows the geographic impact of J. S. Vermaak's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. S. Vermaak with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. S. Vermaak more than expected).
Fields of papers citing papers by J. S. Vermaak
This network shows the impact of papers produced by J. S. Vermaak. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. S. Vermaak. The network helps show where J. S. Vermaak may publish in the future.
Co-authorship network of co-authors of J. S. Vermaak
This figure shows the co-authorship network connecting the top 25 collaborators of J. S. Vermaak. A scholar is included among the top collaborators of J. S. Vermaak based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. S. Vermaak. J. S. Vermaak is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 14 | |
| 3 | 5 | |
| 4 | 2 | |
| 5 | 23 | |
| 6 | 59 | |
| 7 | 25 | |
| 8 | 1 | |
| 9 | 1 | |
| 10 | 9 | |
| 11 | 1 | |
| 12 | 5 | |
| 13 | 3 | |
| 14 | 8 | |
| 15 | 27 | |
| 16 | 33 | |
| 17 | 27 | |
| 18 | 17 | |
| 19 | 38 | |
| 20 | 36 |
About J. S. Vermaak
J. S. Vermaak is a scholar working on Atomic and Molecular Physics, and Optics, General Materials Science and Electrical and Electronic Engineering, having authored 40 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor Quantum Structures and Devices (12 papers), Semiconductor materials and interfaces (7 papers) and nanoparticles nucleation surface interactions (7 papers). The work is most often cited by research in Atmospheric Science (387 citations), Atomic and Molecular Physics, and Optics (517 citations) and Materials Chemistry (750 citations). J. S. Vermaak has collaborated with scholars based in South Africa, United States and Canada. Frequent co-authors include D. Kuhlmann‐Wilsdorf, Harvey J. Wasserman, C.W. Mays, J. H. van der Merwe, F.D. Auret, A.W.R. Leitch, J. Petruzzello, Lukas W. Snyman, G.H. Olsen and H. C. Snyman. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and The Journal of Physical Chemistry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.