J. Knoth

1.2k citations

43 papers · 874 indexed · h-index 18

Impact in

Radiation top 1%
- X-ray Spectroscopy and Fluorescence Analysis
- Nuclear Physics and Applications
- Advanced X-ray Imaging Techniques
Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques

Papers in ⓘ

Radiation 40
- X-ray Spectroscopy and Fluorescence Analysis 36
- Nuclear Physics and Applications 17
- Advanced X-ray Imaging Techniques 10
- Radiation Detection and Scintillator Technologies 3
Surfaces, Coatings and Films 15
- Electron and X-Ray Spectroscopy Techniques 15

Co-authors: H. Schwenke (41 shared papers)A. Prange (7 shared papers)R. Klockenkämper (2 shared papers)P.A. Beaven (8 shared papers)R. Bormann (6 shared papers)C. Michaelsen (4 shared papers)U. Reus (3 shared papers)W. Michaelis (1 shared paper)
Journals: Spectrochimica Acta Part B Atomic Spectroscopy (15 papers)Analytical Chemistry (2 papers)Analytica Chimica Acta (2 papers)Review of Scientific Instruments (2 papers)Applied Physics A (2 papers)
Partner nations: Germany Slovakia Netherlands

In The Last Decade

J. Knoth

43 papers receiving 715 citations

Peers

Countries citing papers authored by J. Knoth

Since Specialization

Citations

This map shows the geographic impact of J. Knoth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Knoth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Knoth more than expected).

Fields of papers citing papers by J. Knoth

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Knoth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Knoth. The network helps show where J. Knoth may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Knoth, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Knoth Line = papers co-authored together J. Knoth links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level Fresenius Zeitschrift für Analytische Chemie ·J. Knoth, H. Schwenke	1978	86
2	Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis Applied Physics A ·U. Weisbrod, R. Gutschke, J. Knoth, H. Schwenke	1991	80
3	A new totally reflecting X-ray fluorescence spectrometer with detection limits below 10−11 g Fresenius Zeitschrift für Analytische Chemie ·J. Knoth, H. Schwenke	1980	76
4	Total-reflection x-ray fluorescence Analytical Chemistry ·R. Klockenkämper, J. Knoth, A. Prange, H. Schwenke	1992	55
5	A highly sensitive energy-dispersive X-ray spectrometer with multiple total reflection of the exciting beam Nuclear Instruments and Methods in Physics Research ·H. Schwenke, J. Knoth	1982	52
6	Analysis of small droplets with a new detector for liquid chromatography based on laser-induced breakdown spectroscopy Spectrochimica Acta Part B Atomic Spectroscopy ·Christoph Janzen, Rüdiger Fleige, Reinhard Noll, H. Schwenke, W. Lahmann, J. Knoth, P.A. Beaven, Eckard Jantzen, Andreas Oest, Peter Koke	2005	52
7	Total reflection X-ray fluorescence spectrometry for surface analysis Spectrochimica Acta Part B Atomic Spectroscopy ·J. Knoth, H. Schwenke, U. Weisbrod	1989	35
8	X-ray induced fluorescence spectrometry at grazing incidence for quantitative surface and layer analysis Analytical and Bioanalytical Chemistry ·U. Weisbrod, R. Gutschke, J. Knoth, H. Schwenke	1991	33
9	Trace Analytical Capabilities of Total-Reflection X-ray Fluorescence Analysis Advances in X-ray Analysis ·W. Michaelis, J. Knoth, A. Prange, H. Schwenke	1984	32
10	Treatment of roughness and concentration gradients in total Reflection X-ray fluorescence analysis of surfaces Applied Physics A ·H. Schwenke, R. Gutschke, J. Knoth, Matthias Köck	1992	25
11	Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis Fresenius Journal of Analytical Chemistry ·H. Schwenke, P.A. Beaven, J. Knoth	1999	23
12	How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF Advances in X-ray Analysis ·H. Schwenke, W. Berneike, J. Knoth, U. Weisbrod	1988	21
13	Total-Reflection X-Ray Fluorescence Spectroscopy Analytical Chemistry ·R. Klockenkämper, J. Knoth, Andreas Prange, H. Schwenke	1992	21
14	Trace element enrichment on a quartz glass surface used as a sample support of an X-ray spectrometer for the subnanogram range Fresenius Zeitschrift für Analytische Chemie ·J. Knoth, H. Schwenke	1979	21
15	Optimization of TXRF measurements by variable incident angles Spectrochimica Acta Part B Atomic Spectroscopy ·A. Prange, U. Reus, H. Schwenke, J. Knoth	1999	20
16	Surface analysis for Si-wafers using total reflection X-ray fluorescence analysis Fresenius Zeitschrift für Analytische Chemie ·W. Berneike, J. Knoth, H. Schwenke, U. Weisbrod	1989	19
17	Examination of layered structures by total-reflection X-ray fluorescence analysis Spectrochimica Acta Part B Atomic Spectroscopy ·J. Knoth, R. Bormann, R. Gutschke, C. Michaelsen, H. Schwenke	1993	19
18	Measurement of Shallow Arsenic Impurity Profiles in Semiconductor Silicon Using Time‐of‐Flight Secondary Ion Mass Spectrometry and Total Reflection X‐Ray Fluorescence Spectrometry Journal of The Electrochemical Society ·H. Schwenke, J. Knoth, L. Fabry, S. Pahlke, Roland W. Scholz, L. Frey	1997	17
19	Determination of trace elements in the water cycle by total-reflection x-ray fluorescence spectrometry Analytica Chimica Acta ·A. Prange, J. Knoth, R.-P. Stöβel, Helga Böddeker, K. Kramer	1987	17
20	Variable X-ray excitation for total reflection X-ray fluorescence spectrometry using an Mo/W alloy anode and a tunable double multilayer monochromator Spectrochimica Acta Part B Atomic Spectroscopy ·J. Knoth, A. Prange, H. Schneider, H. Schwenke	1997	13

About J. Knoth

J. Knoth is a scholar working on Radiation, Surfaces, Coatings and Films, Computational Mechanics, Materials Chemistry and Biomedical Engineering, having authored 43 papers that have together received 874 indexed citations. Recurring topics across this work include X-ray Spectroscopy and Fluorescence Analysis (36 papers), Nuclear Physics and Applications (17 papers), Electron and X-Ray Spectroscopy Techniques (15 papers), Advanced X-ray Imaging Techniques (10 papers), Ion-surface interactions and analysis (8 papers), X-ray Diffraction in Crystallography (6 papers), Advanced X-ray and CT Imaging (4 papers) and Radiation Detection and Scintillator Technologies (3 papers). The work is most often cited by research in Radiation (631 citations), Surfaces, Coatings and Films (231 citations), Analytical Chemistry (171 citations), Radiological and Ultrasound Technology (52 citations) and Archeology (99 citations). J. Knoth has collaborated with scholars based in Germany, Slovakia and Netherlands. Frequent co-authors include H. Schwenke, A. Prange, R. Klockenkämper, P.A. Beaven, R. Bormann, C. Michaelsen, U. Reus, W. Michaelis, George Wiener and H. Schneider. Their work appears in journals such as Spectrochimica Acta Part B Atomic Spectroscopy, Analytical Chemistry, Analytica Chimica Acta, Review of Scientific Instruments and Applied Physics A.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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