J. Knoth

1.2k total citations
43 papers, 874 citations indexed

About

J. Knoth is a scholar working on Radiation, Surfaces, Coatings and Films and Computational Mechanics. According to data from OpenAlex, J. Knoth has authored 43 papers receiving a total of 874 indexed citations (citations by other indexed papers that have themselves been cited), including 40 papers in Radiation, 15 papers in Surfaces, Coatings and Films and 8 papers in Computational Mechanics. Recurrent topics in J. Knoth's work include X-ray Spectroscopy and Fluorescence Analysis (36 papers), Nuclear Physics and Applications (17 papers) and Electron and X-Ray Spectroscopy Techniques (15 papers). J. Knoth is often cited by papers focused on X-ray Spectroscopy and Fluorescence Analysis (36 papers), Nuclear Physics and Applications (17 papers) and Electron and X-Ray Spectroscopy Techniques (15 papers). J. Knoth collaborates with scholars based in Germany, Slovakia and Bulgaria. J. Knoth's co-authors include H. Schwenke, A. Prange, R. Klockenkämper, P.A. Beaven, R. Bormann, C. Michaelsen, U. Reus, W. Michaelis, H. Schneider and George Wiener and has published in prestigious journals such as Analytical Chemistry, Journal of The Electrochemical Society and Analytica Chimica Acta.

In The Last Decade

J. Knoth

43 papers receiving 715 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Knoth Germany 18 631 231 171 157 137 43 874
Eugene P. Bertin France 6 307 0.5× 99 0.4× 74 0.4× 169 1.1× 31 0.2× 15 603
S. Pahlke Germany 17 341 0.5× 191 0.8× 89 0.5× 89 0.6× 67 0.5× 33 585
Ž. Šmit Slovenia 20 795 1.3× 369 1.6× 45 0.3× 112 0.7× 148 1.1× 111 1.2k
Tom Schoonjans Belgium 17 583 0.9× 96 0.4× 57 0.3× 181 1.2× 35 0.3× 25 953
J. W. Criss United States 7 422 0.7× 154 0.7× 48 0.3× 207 1.3× 21 0.2× 13 600
Ch. Zarkadas Greece 16 362 0.6× 98 0.4× 40 0.2× 103 0.7× 55 0.4× 38 594
P. A. Pella United States 12 308 0.5× 85 0.4× 69 0.4× 187 1.2× 18 0.1× 50 606
Laurent Pichon France 23 687 1.1× 180 0.8× 45 0.3× 71 0.5× 132 1.0× 78 1.3k
D. Legnini United States 12 447 0.7× 62 0.3× 37 0.2× 106 0.7× 19 0.1× 43 840
A. Saint Australia 16 174 0.3× 131 0.6× 65 0.4× 89 0.6× 242 1.8× 46 617

Countries citing papers authored by J. Knoth

Since Specialization
Citations

This map shows the geographic impact of J. Knoth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Knoth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Knoth more than expected).

Fields of papers citing papers by J. Knoth

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Knoth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Knoth. The network helps show where J. Knoth may publish in the future.

Co-authorship network of co-authors of J. Knoth

This figure shows the co-authorship network connecting the top 25 collaborators of J. Knoth. A scholar is included among the top collaborators of J. Knoth based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Knoth. J. Knoth is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Schwenke, H., et al.. (2004). A laser plasma X-ray source for the analysis of wafer surfaces by grazing emission X-ray fluorescence spectrometry. Spectrochimica Acta Part B Atomic Spectroscopy. 59(8). 1159–1164. 8 indexed citations
2.
Schwenke, H., P.A. Beaven, & J. Knoth. (1999). Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis. Fresenius Journal of Analytical Chemistry. 365(1-3). 19–27. 23 indexed citations
3.
Prange, A., U. Reus, H. Schwenke, & J. Knoth. (1999). Optimization of TXRF measurements by variable incident angles. Spectrochimica Acta Part B Atomic Spectroscopy. 54(10). 1505–1511. 20 indexed citations
4.
Knoth, J., P.A. Beaven, C. Michaelsen, H. Schneider, & H. Schwenke. (1999). A tunable focusing monochromator for total reflection x-ray fluorescence spectrometers. X-Ray Spectrometry. 28(2). 110–114. 7 indexed citations
5.
Knoth, J., et al.. (1998). Optimization of curved x-ray multilayer mirrors for total reflection x-ray fluorescence spectrometry. X-Ray Spectrometry. 27(3). 166–172. 7 indexed citations
6.
Neidhart, B., J. Knoth, & H. Schwenke. (1998). The potential of TXRF as a primary method in chemical metrology. Accreditation and Quality Assurance. 3(11). 470–472. 3 indexed citations
7.
Wiener, George, Robert Günther, C. Michaelsen, et al.. (1997). Ion beam sputtering techniques for high-resolution concentration depth profiling with glancing-incidence X-ray fluorescence spectrometry. Spectrochimica Acta Part B Atomic Spectroscopy. 52(7). 813–821. 9 indexed citations
8.
Knoth, J., A. Prange, H. Schneider, & H. Schwenke. (1997). Variable X-ray excitation for total reflection X-ray fluorescence spectrometry using an Mo/W alloy anode and a tunable double multilayer monochromator. Spectrochimica Acta Part B Atomic Spectroscopy. 52(7). 907–913. 13 indexed citations
9.
Schwenke, H., J. Knoth, Robert Günther, George Wiener, & R. Bormann. (1997). Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering. Spectrochimica Acta Part B Atomic Spectroscopy. 52(7). 795–803. 7 indexed citations
10.
Günther, Robert, George Wiener, J. Knoth, H. Schwenke, & R. Bormann. (1996). Determination of concentration depth profiles using total-reflection x-ray fluorescence spectrometry in combination with ion-beam etching. Review of Scientific Instruments. 67(6). 2332–2336. 8 indexed citations
11.
Schwenke, H. & J. Knoth. (1993). Total reflection XRF. 12 indexed citations
12.
Klockenkämper, R., J. Knoth, A. Prange, & H. Schwenke. (1992). Total-reflection x-ray fluorescence. Analytical Chemistry. 64(23). 1115A–1123A. 55 indexed citations
13.
Schwenke, H., et al.. (1992). Treatment of roughness and concentration gradients in total Reflection X-ray fluorescence analysis of surfaces. Applied Physics A. 54(5). 460–465. 25 indexed citations
14.
Klockenkämper, R., J. Knoth, Andreas Prange, & H. Schwenke. (1992). Total-Reflection X-Ray Fluorescence Spectroscopy. Analytical Chemistry. 64(23). 1115A–1123A. 21 indexed citations
15.
Knoth, J., et al.. (1989). Total reflection X-ray fluorescence spectrometry for surface analysis. Spectrochimica Acta Part B Atomic Spectroscopy. 44(5). 477–481. 35 indexed citations
16.
Schwenke, H., et al.. (1988). How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF. Advances in X-ray Analysis. 32. 105–114. 21 indexed citations
17.
18.
Schwenke, H. & J. Knoth. (1982). A highly sensitive energy-dispersive X-ray spectrometer with multiple total reflection of the exciting beam. Nuclear Instruments and Methods in Physics Research. 193(1-2). 239–243. 52 indexed citations
19.
Knoth, J. & H. Schwenke. (1980). A new totally reflecting X-ray fluorescence spectrometer with detection limits below 10−11 g. Fresenius Zeitschrift für Analytische Chemie. 301(1). 7–9. 76 indexed citations
20.
Knoth, J. & H. Schwenke. (1978). An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level. Fresenius Zeitschrift für Analytische Chemie. 291(3). 200–204. 86 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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