J. Haemers

1.1k citations
35 papers · 920 indexed · h-index 19

J. Haemers

35 papers receiving 878 citations

Peers

J. Haemers
Comparison fields: 5 of 46
  • Mechanics of Materials 482
  • Electrical and Electronic Engineering 646
  • Materials Chemistry 489
  • Polymers and Plastics 147
  • Catalysis 67
Replace Werner Puff with:
Werner Puff Austria
D. Lubben United States
T. Szörényi Hungary
B. Agius France
Kevin M. Hubbard United States
S. Eichler Germany
Johan Nijs Netherlands
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K. Macák Sweden
D. Frankel United States
J. Haemers relative to Werner Puff Austria Werner Puff's profile →
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Citations per year

Countries citing papers authored by J. Haemers

Since Specialization
Citations

This map shows the geographic impact of J. Haemers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Haemers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Haemers more than expected).

Fields of papers citing papers by J. Haemers

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Haemers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Haemers. The network helps show where J. Haemers may publish in the future.

Co-authorship network

The 22 scholars most cited alongside J. Haemers, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Haemers Line = papers co-authored together J. Haemers links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 201227
2 200969
3 20099
4 20094
5 200818
6 2007156
7 200711
8 200631
9 200631
10 200598
11
Characterization of the Electron Movement in Varying Magnetic Fields and the Resulting Anomalous Erosion
20041
12 200425
13 200343
14
Influence of recapture of secondary electrons on the magnetron sputtering deposition process.
20021
15 199831
16 199719
17 199623
18
Statistical analysis of a V2O5/TiO2 model catalyst, prepared by magnetron sputtering
19932
19 19743
20 197383

About J. Haemers

J. Haemers is a scholar working on Mechanics of Materials, Catalysis and Electrical and Electronic Engineering, having authored 35 papers that have together received 920 indexed citations. Recurring topics across this work include Metal and Thin Film Mechanics (19 papers), Plasma Diagnostics and Applications (16 papers), Semiconductor materials and devices (10 papers), Particle accelerators and beam dynamics (4 papers), Acoustic Wave Resonator Technologies (4 papers), Catalysis and Oxidation Reactions (4 papers), Catalytic Processes in Materials Science (3 papers) and Transition Metal Oxide Nanomaterials (3 papers). The work is most often cited by research in Mechanics of Materials (482 citations), Electrical and Electronic Engineering (646 citations) and Materials Chemistry (489 citations). J. Haemers has collaborated with scholars based in Belgium, China and Poland. Frequent co-authors include Roger De Gryse, Diederik Depla, Guy Buyle, Stijn Mahieu, Jan Musschoot, J. Vénnik, Karin Eufinger, Christophe Detavernier, Veerle De Bosscher and Wouter Leroy. Their work appears in journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Journal of Physics D Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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