J. E. Yehoda

622 total citations
16 papers, 455 citations indexed

About

J. E. Yehoda is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Mechanics of Materials. According to data from OpenAlex, J. E. Yehoda has authored 16 papers receiving a total of 455 indexed citations (citations by other indexed papers that have themselves been cited), including 9 papers in Electrical and Electronic Engineering, 7 papers in Materials Chemistry and 4 papers in Mechanics of Materials. Recurrent topics in J. E. Yehoda's work include Diamond and Carbon-based Materials Research (5 papers), Thin-Film Transistor Technologies (5 papers) and Semiconductor materials and devices (3 papers). J. E. Yehoda is often cited by papers focused on Diamond and Carbon-based Materials Research (5 papers), Thin-Film Transistor Technologies (5 papers) and Semiconductor materials and devices (3 papers). J. E. Yehoda collaborates with scholars based in United States and Sweden. J. E. Yehoda's co-authors include R. Messier, K. Vedam, P. J. McMarr, L. J. Pilione, J. S. Lannin, Bakhtier Farouk, Bing Yang, Milton Ohring, C. R. Guarnieri and Robert Pfeffer and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

J. E. Yehoda

16 papers receiving 439 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. E. Yehoda United States 10 240 196 135 121 78 16 455
A. H. Eltoukhy United States 12 258 1.1× 284 1.4× 187 1.4× 231 1.9× 112 1.4× 18 518
M. F. C. Willemsen Netherlands 13 189 0.8× 429 2.2× 139 1.0× 73 0.6× 36 0.5× 22 539
G.N. van Wyk South Africa 14 262 1.1× 140 0.7× 89 0.7× 182 1.5× 70 0.9× 42 543
G. F. Doughty United Kingdom 6 166 0.7× 260 1.3× 123 0.9× 223 1.8× 32 0.4× 15 451
H. Kheyrandish United Kingdom 13 201 0.8× 244 1.2× 162 1.2× 159 1.3× 43 0.6× 57 509
Pavel Moskovkin Belgium 14 238 1.0× 148 0.8× 157 1.2× 80 0.7× 29 0.4× 30 427
Wei Chu United States 11 176 0.7× 172 0.9× 52 0.4× 139 1.1× 80 1.0× 38 445
Matthew Pelliccione United States 7 255 1.1× 159 0.8× 70 0.5× 114 0.9× 75 1.0× 12 465
Naokichi Hosokawa Japan 14 220 0.9× 307 1.6× 138 1.0× 65 0.5× 37 0.5× 37 468
Adli A. Saleh United States 11 179 0.7× 143 0.7× 91 0.7× 31 0.3× 53 0.7× 26 385

Countries citing papers authored by J. E. Yehoda

Since Specialization
Citations

This map shows the geographic impact of J. E. Yehoda's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. E. Yehoda with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. E. Yehoda more than expected).

Fields of papers citing papers by J. E. Yehoda

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. E. Yehoda. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. E. Yehoda. The network helps show where J. E. Yehoda may publish in the future.

Co-authorship network of co-authors of J. E. Yehoda

This figure shows the co-authorship network connecting the top 25 collaborators of J. E. Yehoda. A scholar is included among the top collaborators of J. E. Yehoda based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. E. Yehoda. J. E. Yehoda is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

16 of 16 papers shown
1.
Weiland, James D., et al.. (2013). Chip-scale packaging for bioelectronic implants. 5 indexed citations
2.
Sood, Ashok K., Yash R. Puri, Meimei Z. Tidrow, et al.. (2006). Development of high-performance radiation-hardened antireflection coatings for LWIR and multicolor IR focal plane arrays. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6206. 620615–620615. 9 indexed citations
3.
Farouk, Bakhtier, et al.. (2000). Thermal Conductivity Measurement of CVD Diamond Films Using a Modified Thermal Comparator Method. Journal of Heat Transfer. 122(4). 808–816. 13 indexed citations
4.
Pfeffer, Robert, et al.. (1996). Reactions between tungsten and molybdenum thin films and polycrystalline diamond substrates. Diamond and Related Materials. 5(10). 1195–1203. 11 indexed citations
5.
Olsson, Jörgen, et al.. (1996). Electrical characterisation of silicon pn-junctions terminated with diamond. Diamond and Related Materials. 5(12). 1457–1461. 3 indexed citations
6.
Whitehair, S. J., et al.. (1993). Polycrystalline Diamond Films for X-Ray Lithography. MRS Proceedings. 306. 1 indexed citations
7.
Yehoda, J. E., et al.. (1992). Enhanced nucleation and growth of diamond on SiC by plasma enhanced chemical vapor deposition using thin metal films. Applied Physics Letters. 60(23). 2865–2867. 12 indexed citations
8.
Yehoda, J. E., et al.. (1988). Investigation of the void structure in amorphous germanium thin films as a function of low-energy ion bombardment. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 6(3). 1631–1635. 73 indexed citations
9.
Pilione, L. J., K. Vedam, J. E. Yehoda, R. Messier, & P. J. McMarr. (1987). Thickness dependence of optical gap and void fraction for sputtered amorphous germanium. Physical review. B, Condensed matter. 35(17). 9368–9371. 38 indexed citations
10.
Yang, Bing, L. J. Pilione, J. E. Yehoda, K. Vedam, & R. Messier. (1987). Nonuniformity in void concentration between the initial and final growth stage of sputtereda-Ge films studied using spectroscopic ellipsometry. Physical review. B, Condensed matter. 36(11). 6206–6208. 8 indexed citations
11.
McMarr, P. J., et al.. (1986). Density of amorphous germanium films by spectroscopic ellipsometry. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 4(3). 577–582. 34 indexed citations
12.
Yehoda, J. E. & R. Messier. (1986). Quantitative Analysis Of Thin Film Morphology Evolution. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 678. 32–32. 5 indexed citations
13.
Yehoda, J. E.. (1985). Are thin film physical structures fractals?. Applied Surface Science. 22-23. 590–595. 3 indexed citations
14.
Messier, R. & J. E. Yehoda. (1985). Geometry of thin-film morphology. Journal of Applied Physics. 58(10). 3739–3746. 184 indexed citations
15.
Yehoda, J. E. & R. Messier. (1985). Are thin film physical structures fractals?. Applications of Surface Science. 22-23. 590–595. 45 indexed citations
16.
Yehoda, J. E. & J. S. Lannin. (1983). Trilayer Raman scattering of variably ordered amorphous Ge. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 1(2). 392–394. 11 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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