Ill Ryu
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Automotive Engineering top 2%
- Mechanical Engineering top 10%
- Electronic, Optical and Magnetic Materials top 10%
- Co-authors
- William D. NixJang Wook ChoiYi CuiSeok Woo LeeHuajian GaoMatthew T. McDowellHui WuWei Cai
- Topics
- Microstructure and mechanical properties (19 papers)Metal and Thin Film Mechanics (10 papers)Force Microscopy Techniques and Applications (9 papers)
- Cited by
- Automotive EngineeringElectronic, Optical and Magnetic MaterialsElectrical and Electronic Engineering
- Partner nations
- United StatesSouth KoreaPoland
In The Last Decade
Ill Ryu
27 papers receiving 1.2k citations
Hit Papers
Peers
Comparison fields: 5 of 42
- Electrical and Electronic Engineering 839
- Materials Chemistry 364
- Automotive Engineering 332
- Mechanical Engineering 304
- Electronic, Optical and Magnetic Materials 279
Countries citing papers authored by Ill Ryu
This map shows the geographic impact of Ill Ryu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ill Ryu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ill Ryu more than expected).
Fields of papers citing papers by Ill Ryu
This network shows the impact of papers produced by Ill Ryu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ill Ryu. The network helps show where Ill Ryu may publish in the future.
Co-authorship network of co-authors of Ill Ryu
This figure shows the co-authorship network connecting the top 25 collaborators of Ill Ryu. A scholar is included among the top collaborators of Ill Ryu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ill Ryu. Ill Ryu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 1 | |
| 4 | 8 | |
| 5 | 3 | |
| 6 | 6 | |
| 7 | 9 | |
| 8 | 9 | |
| 9 | 15 | |
| 10 | 5 | |
| 11 | 1 | |
| 12 | 117 | |
| 13 | 48 | |
| 14 | 17 | |
| 15 | 70 | |
| 16 | 40 | |
| 17 | 286 | |
| 18 | 2 | |
| 19 | Size-dependent fracture of Si nanowire battery anodesbreakdown → | 356 |
| 20 | 26 |
About Ill Ryu
Ill Ryu is a scholar working on Mechanics of Materials, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 28 papers that have together received 1.2k indexed citations. Recurring topics across this work include Microstructure and mechanical properties (19 papers), Metal and Thin Film Mechanics (10 papers) and Force Microscopy Techniques and Applications (9 papers). The work is most often cited by research in Automotive Engineering (332 citations), Electronic, Optical and Magnetic Materials (279 citations) and Electrical and Electronic Engineering (839 citations). Ill Ryu has collaborated with scholars based in United States, South Korea and Poland. Frequent co-authors include William D. Nix, Jang Wook Choi, Yi Cui, Seok Woo Lee, Huajian Gao, Yi Cui, Matthew T. McDowell, Hui Wu, Wei Cai and Hyun‐Wook Lee. Their work appears in journals such as Nature Communications, Nano Letters and Journal of Power Sources.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.