Huitaek Yun
- Electrical and Electronic Engineering top 10%
- Mechanical Engineering top 10%
- Industrial and Manufacturing Engineering top 2%
- Biomedical Engineering
- Control and Systems Engineering top 10%
- Co-authors
- Martin Byung‐Guk JunByung-Kwon MinHang-Eun JoeHan‐Jun KimHaiyue WuJohn W. SutherlandWo Jae LeeYoung Hun Jeong
- Topics
- Industrial Vision Systems and Defect Detection (9 papers)Manufacturing Process and Optimization (6 papers)Advanced machining processes and optimization (5 papers)
- Journals
- ACS Applied Materials & InterfacesComposites Part B EngineeringInternational Journal of Machine Tools and Manufacture
- Partner nations
- United StatesSouth KoreaCanada
In The Last Decade
Huitaek Yun
27 papers receiving 758 citations
Hit Papers
Peers
Comparison fields: 5 of 93
- Electrical and Electronic Engineering 340
- Mechanical Engineering 195
- Industrial and Manufacturing Engineering 163
- Biomedical Engineering 160
- Control and Systems Engineering 128
Countries citing papers authored by Huitaek Yun
This map shows the geographic impact of Huitaek Yun's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Huitaek Yun with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Huitaek Yun more than expected).
Fields of papers citing papers by Huitaek Yun
This network shows the impact of papers produced by Huitaek Yun. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Huitaek Yun. The network helps show where Huitaek Yun may publish in the future.
Co-authorship network of co-authors of Huitaek Yun
This figure shows the co-authorship network connecting the top 25 collaborators of Huitaek Yun. A scholar is included among the top collaborators of Huitaek Yun based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Huitaek Yun. Huitaek Yun is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 4 | |
| 2 | 3 | |
| 3 | 20 | |
| 4 | 27 | |
| 5 | 2 | |
| 6 | 16 | |
| 7 | 7 | |
| 8 | 13 | |
| 9 | 1 | |
| 10 | 7 | |
| 11 | 23 | |
| 12 | 4 | |
| 13 | 5 | |
| 14 | 3 | |
| 15 | 2 | |
| 16 | 142 | |
| 17 | 2 | |
| 18 | A review on optical fiber sensors for environmental monitoringbreakdown → | 307 |
| 19 | 20 | |
| 20 | 48 |
About Huitaek Yun
Huitaek Yun is a scholar working on Industrial and Manufacturing Engineering, Music and Control and Systems Engineering, having authored 27 papers that have together received 799 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (9 papers), Manufacturing Process and Optimization (6 papers) and Advanced machining processes and optimization (5 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (163 citations), Medical Laboratory Technology (20 citations) and Bioengineering (41 citations). Huitaek Yun has collaborated with scholars based in United States, South Korea and Canada. Frequent co-authors include Martin Byung‐Guk Jun, Byung-Kwon Min, Hang-Eun Joe, Han‐Jun Kim, Haiyue Wu, John W. Sutherland, Wo Jae Lee, Young Hun Jeong, Min Kyu Lee and Sang Jo Lee. Their work appears in journals such as ACS Applied Materials & Interfaces, Composites Part B Engineering and International Journal of Machine Tools and Manufacture.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.