H.L. Peek
- Electrical and Electronic Engineering
- Materials Chemistry
- Aerospace Engineering
- Atomic and Molecular Physics, and Optics
- Media Technology top 10%
- Co-authors
- F. C. EversteynP. J. SeverinD. R. WoltersAlbert TheuwissenR. CuppensJ.F. VerweyJ.A. PalsJ.W. Slotboom
- Topics
- CCD and CMOS Imaging Sensors (25 papers)Image Processing Techniques and Applications (10 papers)Infrared Target Detection Methodologies (10 papers)
- Journals
- Journal of The Electrochemical SocietyIEEE Journal of Solid-State CircuitsIEEE Transactions on Electron Devices
- Partner nations
- NetherlandsFinlandUnited States
In The Last Decade
H.L. Peek
32 papers receiving 338 citations
Peers
Comparison fields: 5 of 45
- Electrical and Electronic Engineering 289
- Materials Chemistry 80
- Aerospace Engineering 59
- Atomic and Molecular Physics, and Optics 52
- Media Technology 47
Countries citing papers authored by H.L. Peek
This map shows the geographic impact of H.L. Peek's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.L. Peek with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.L. Peek more than expected).
Fields of papers citing papers by H.L. Peek
This network shows the impact of papers produced by H.L. Peek. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.L. Peek. The network helps show where H.L. Peek may publish in the future.
Co-authorship network of co-authors of H.L. Peek
This figure shows the co-authorship network connecting the top 25 collaborators of H.L. Peek. A scholar is included among the top collaborators of H.L. Peek based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H.L. Peek. H.L. Peek is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 0 | |
| 3 | 6 | |
| 4 | 6 | |
| 5 | 10 | |
| 6 | 2 | |
| 7 | 4 | |
| 8 | 8 | |
| 9 | 0 | |
| 10 | 13 | |
| 11 | 1 | |
| 12 | HDTV image sensor: the pixel structure | 3 |
| 13 | Anomalous Behaviour of Surface Leakage Currents in Heavily-Doped MOS Structures | 1 |
| 14 | 18 | |
| 15 | 2 | |
| 16 | 1 | |
| 17 | 22 | |
| 18 | 7 | |
| 19 | 5 | |
| 20 | 3 |
About H.L. Peek
H.L. Peek is a scholar working on Instrumentation, Media Technology and Electrical and Electronic Engineering, having authored 36 papers that have together received 389 indexed citations. Recurring topics across this work include CCD and CMOS Imaging Sensors (25 papers), Image Processing Techniques and Applications (10 papers) and Infrared Target Detection Methodologies (10 papers). The work is most often cited by research in Instrumentation (20 citations), Media Technology (47 citations) and Electrical and Electronic Engineering (289 citations). H.L. Peek has collaborated with scholars based in Netherlands, Finland and United States. Frequent co-authors include F. C. Eversteyn, P. J. Severin, D. R. Wolters, Albert Theuwissen, R. Cuppens, J.F. Verwey, J.A. Pals, J.W. Slotboom, Laurent Le Cam and Monique J. Beenhakkers. Their work appears in journals such as Journal of The Electrochemical Society, IEEE Journal of Solid-State Circuits and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.