Hitoshi Ueyama

598 total citations
10 papers, 459 citations indexed

About

Hitoshi Ueyama is a scholar working on Atomic and Molecular Physics, and Optics, Biomedical Engineering and Electrical and Electronic Engineering. According to data from OpenAlex, Hitoshi Ueyama has authored 10 papers receiving a total of 459 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Atomic and Molecular Physics, and Optics, 7 papers in Biomedical Engineering and 6 papers in Electrical and Electronic Engineering. Recurrent topics in Hitoshi Ueyama's work include Force Microscopy Techniques and Applications (10 papers), Near-Field Optical Microscopy (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). Hitoshi Ueyama is often cited by papers focused on Force Microscopy Techniques and Applications (10 papers), Near-Field Optical Microscopy (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). Hitoshi Ueyama collaborates with scholars based in Japan. Hitoshi Ueyama's co-authors include Makoto Ohta, Yasuhiro Sugawara, Seizo Morita, Seizo Morita Seizo Morita, Takayuki Uchihashi, Shuzo Mishima, M. Suzuki, Masayuki Abe, Yasuhiro Sugawara and Satoru Fujisawa and has published in prestigious journals such as Science, Applied Surface Science and Thin Solid Films.

In The Last Decade

Hitoshi Ueyama

10 papers receiving 434 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Hitoshi Ueyama Japan 7 450 224 163 55 24 10 459
Seizo Morita Seizo Morita Japan 9 312 0.7× 122 0.5× 146 0.9× 67 1.2× 13 0.5× 20 337
Markus Herz Germany 7 253 0.6× 82 0.4× 148 0.9× 36 0.7× 12 0.5× 10 285
C. Andreoli Switzerland 6 354 0.8× 144 0.6× 284 1.7× 28 0.5× 2 0.1× 8 431
M. O. Tanner United States 11 215 0.5× 94 0.4× 338 2.1× 99 1.8× 3 0.1× 19 388
Mark van Dal Belgium 10 204 0.5× 60 0.3× 256 1.6× 56 1.0× 8 0.3× 26 285
A. S. Deryabin Russia 12 245 0.5× 82 0.4× 235 1.4× 139 2.5× 4 0.2× 45 327
M. Schwartzkopff Germany 7 128 0.3× 263 1.2× 249 1.5× 330 6.0× 7 0.3× 18 406
Leonhard Prechtel Germany 6 195 0.4× 182 0.8× 197 1.2× 165 3.0× 5 0.2× 8 353
G.R. Trott United States 8 115 0.3× 59 0.3× 148 0.9× 29 0.5× 17 229
Y. Temko Germany 12 348 0.8× 85 0.4× 220 1.3× 132 2.4× 4 0.2× 22 372

Countries citing papers authored by Hitoshi Ueyama

Since Specialization
Citations

This map shows the geographic impact of Hitoshi Ueyama's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hitoshi Ueyama with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hitoshi Ueyama more than expected).

Fields of papers citing papers by Hitoshi Ueyama

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Hitoshi Ueyama. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hitoshi Ueyama. The network helps show where Hitoshi Ueyama may publish in the future.

Co-authorship network of co-authors of Hitoshi Ueyama

This figure shows the co-authorship network connecting the top 25 collaborators of Hitoshi Ueyama. A scholar is included among the top collaborators of Hitoshi Ueyama based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hitoshi Ueyama. Hitoshi Ueyama is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

10 of 10 papers shown
1.
Sugawara, Yasuhiro, Hitoshi Ueyama, Takayuki Uchihashi, et al.. (1997). True atomic resolution imaging with noncontact atomic force microscopy. Applied Surface Science. 113-114. 364–370. 34 indexed citations
2.
Abe, Masayuki, Takayuki Uchihashi, Makoto Ohta, et al.. (1997). Measurement of the evanescent field using noncontact mode atomic force microscope. Optical Review. 4(1). 232–235. 5 indexed citations
3.
Abe, Masayuki, Takayuki Uchihashi, Makoto Ohta, et al.. (1997). Measurement of the evanescent field using noncontact mode atomic force microscope. Optical Review. 4(1). A232–A235. 4 indexed citations
4.
Abe, Masayuki, Takayuki Uchihashi, Makoto Ohta, et al.. (1997). Detection mechanism of an optical evanescent field using a noncontact mode atomic force microscope with a frequency modulation detection method. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 15(4). 1512–1515. 8 indexed citations
5.
Morita, Seizo, et al.. (1996). Contact and non-contact mode imaging by atomic force microscopy. Thin Solid Films. 273(1-2). 138–142. 9 indexed citations
6.
Morita, Seizo, Yasuhiro Sugawara, Satoru Fujisawa, Makoto Ohta, & Hitoshi Ueyama. (1996). Frictional Force Microscopy. Explanation of Microscopic Frictional Force.. Hyomen Kagaku. 17(1). 22–26. 1 indexed citations
7.
Sugawara, Yasuhiro, Makoto Ohta, Hitoshi Ueyama, & Seizo Morita. (1995). Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy. Science. 270(5242). 1646–1648. 245 indexed citations
8.
Ohta, Makoto, et al.. (1995). Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force Microscope. Japanese Journal of Applied Physics. 34(12B). L1692–L1692. 26 indexed citations
9.
Ueyama, Hitoshi, Makoto Ohta, Yasuhiro Sugawara, & Seizo Morita Seizo Morita. (1995). Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope. Japanese Journal of Applied Physics. 34(8B). L1086–L1086. 120 indexed citations
10.
Sugawara, Yasuhiro, Makoto Ohta, Hitoshi Ueyama, & Seizo Morita Seizo Morita. (1995). Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM). Japanese Journal of Applied Physics. 34(4A). L462–L462. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Seizo Morita Seizo Morita Breakdown of academic impact, for papers by Markus Herz Breakdown of academic impact, for papers by C. Andreoli Breakdown of academic impact, for papers by M. O. Tanner Breakdown of academic impact, for papers by Mark van Dal Breakdown of academic impact, for papers by A. S. Deryabin Breakdown of academic impact, for papers by M. Schwartzkopff Breakdown of academic impact, for papers by Leonhard Prechtel Breakdown of academic impact, for papers by G.R. Trott Breakdown of academic impact, for papers by Y. Temko
Rankless by CCL
2026