Heng Lai

728 citations
31 papers · 630 · h-index 14

Impact in

Papers in

Heng Lai

30 papers receiving 617 citations

Peers

Heng Lai
Comparison fields: 5 of 59
  • Electronic, Optical and Magnetic Materials 318
  • Electrical and Electronic Engineering 486
  • Automotive Engineering 91
  • Materials Chemistry 149
  • Electrochemistry 17
Replace Gene M. Nolis with:
Gene M. Nolis United States
Suk Hyun Kang South Korea
Diana M. Lutz United States
Yongseok Lee South Korea
Lulu Si China
Markus Valkeapää Finland
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Heng Lai relative to Gene M. Nolis United States Gene M. Nolis's profile →
Citations per field
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Citations per year

Countries citing papers authored by Heng Lai

Since Specialization
Citations

This map shows the geographic impact of Heng Lai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Heng Lai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Heng Lai more than expected).

Fields of papers citing papers by Heng Lai

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Heng Lai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Heng Lai. The network helps show where Heng Lai may publish in the future.

Co-authors

The 25 scholars most cited alongside Heng Lai, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Heng Lai Line = papers co-authored together Heng Lai links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2012140
2 201470
3 201460
4 201340
5 201434
6 200834
7 200627
8 201823
9 201421
10 201319
11 201118
12 201218
13 201215
14 201514
15 201613
16 201412
17 201612
18 201811
19 200610
20 20068

About Heng Lai

Heng Lai is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Automotive Engineering, Atomic and Molecular Physics, and Optics and Mechanical Engineering, having authored 31 papers that have together received 630 indexed citations. Recurring topics across this work include Advancements in Battery Materials (15 papers), Advanced Battery Technologies Research (8 papers), Supercapacitor Materials and Fabrication (8 papers), Advanced Battery Materials and Technologies (7 papers), Magnetic properties of thin films (6 papers), Magnetic Properties and Applications (5 papers), Magnetic Properties of Alloys (3 papers) and Metallic Glasses and Amorphous Alloys (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (318 citations), Electrical and Electronic Engineering (486 citations), Automotive Engineering (91 citations), Materials Chemistry (149 citations) and Electrochemistry (17 citations). Heng Lai has collaborated with scholars based in China and Taiwan. Frequent co-authors include Jiaxin Li, Zhigao Huang, Zhigao Huang, Yingbin Lin, Zhigao Chen, Mingzhong Zou, Lunhui Guan, Luzhuo Chen, Yi Zhao and Yanmin Yang. Their work appears in journals such as Rare Metals, Journal of Magnetism and Magnetic Materials, Journal of Alloys and Compounds, Journal of Power Sources and Journal of Energy Chemistry.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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