Haihua Cui
- Computer Vision and Pattern Recognition top 5%
- Aerospace Engineering
- Mechanical Engineering
- Geology top 5%
- Media Technology top 5%
- Co-authors
- Xiaosheng ChengTao JiangNing DaiLiao Wen-heYufei LiWei YinSukun TianZhimin Zhao
- Topics
- Optical measurement and interference techniques (21 papers)Advanced Measurement and Metrology Techniques (9 papers)Image Processing Techniques and Applications (8 papers)
- Journals
- The International Journal of Advanced Manufacturing TechnologyIEEE Transactions on Instrumentation and MeasurementMeasurement Science and Technology
- Partner nations
- ChinaUnited KingdomUnited States
In The Last Decade
Haihua Cui
32 papers receiving 294 citations
Peers
Comparison fields: 5 of 39
- Computer Vision and Pattern Recognition 232
- Aerospace Engineering 69
- Mechanical Engineering 68
- Geology 66
- Media Technology 64
Countries citing papers authored by Haihua Cui
This map shows the geographic impact of Haihua Cui's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Haihua Cui with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Haihua Cui more than expected).
Fields of papers citing papers by Haihua Cui
This network shows the impact of papers produced by Haihua Cui. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Haihua Cui. The network helps show where Haihua Cui may publish in the future.
Co-authorship network of co-authors of Haihua Cui
This figure shows the co-authorship network connecting the top 25 collaborators of Haihua Cui. A scholar is included among the top collaborators of Haihua Cui based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Haihua Cui. Haihua Cui is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 3 | |
| 3 | 1 | |
| 4 | 12 | |
| 5 | 1 | |
| 6 | 40 | |
| 7 | 39 | |
| 8 | 16 | |
| 9 | 11 | |
| 10 | 27 | |
| 11 | 9 | |
| 12 | 4 | |
| 13 | 1 | |
| 14 | 3 | |
| 15 | 10 | |
| 16 | 1 | |
| 17 | 25 | |
| 18 | 25 | |
| 19 | 6 | |
| 20 | 5 |
About Haihua Cui
Haihua Cui is a scholar working on Computer Vision and Pattern Recognition, Media Technology and Geology, having authored 32 papers that have together received 320 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (21 papers), Advanced Measurement and Metrology Techniques (9 papers) and Image Processing Techniques and Applications (8 papers). The work is most often cited by research in Geology (66 citations), Computer Vision and Pattern Recognition (232 citations) and Media Technology (64 citations). Haihua Cui has collaborated with scholars based in China, United Kingdom and United States. Frequent co-authors include Xiaosheng Cheng, Tao Jiang, Ning Dai, Liao Wen-he, Yufei Li, Wei Yin, Ning Dai, Sukun Tian, Zhimin Zhao and Wei Tian. Their work appears in journals such as The International Journal of Advanced Manufacturing Technology, IEEE Transactions on Instrumentation and Measurement and Measurement Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.