G.S. May

1.7k total citations
98 papers, 1.3k citations indexed

About

G.S. May is a scholar working on Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Control and Systems Engineering. According to data from OpenAlex, G.S. May has authored 98 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 58 papers in Electrical and Electronic Engineering, 28 papers in Industrial and Manufacturing Engineering and 19 papers in Control and Systems Engineering. Recurrent topics in G.S. May's work include Industrial Vision Systems and Defect Detection (23 papers), Semiconductor materials and devices (15 papers) and Fault Detection and Control Systems (14 papers). G.S. May is often cited by papers focused on Industrial Vision Systems and Defect Detection (23 papers), Semiconductor materials and devices (15 papers) and Fault Detection and Control Systems (14 papers). G.S. May collaborates with scholars based in United States, South Korea and India. G.S. May's co-authors include Sang Jeen Hong, Byungwhan Kim, Costas J. Spanos, Seung-Soo Han, Tae Seon Kim, A. Erbil, John Papapolymerou, Wasif Tanveer Khan, George E. Ponchak and Ilgu Yun and has published in prestigious journals such as IEEE Transactions on Industrial Electronics, IEEE Transactions on Microwave Theory and Techniques and IEEE Transactions on Electron Devices.

In The Last Decade

G.S. May

90 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
G.S. May United States 19 649 331 257 255 183 98 1.3k
Sang Jeen Hong South Korea 15 416 0.6× 185 0.6× 125 0.5× 183 0.7× 91 0.5× 136 832
Dong Ni China 18 250 0.4× 153 0.5× 201 0.8× 177 0.7× 132 0.7× 67 933
Stephanie Watts Butler United States 14 283 0.4× 240 0.7× 276 1.1× 566 2.2× 38 0.2× 44 1.1k
Steven R. LeClair United States 17 400 0.6× 168 0.5× 143 0.6× 67 0.3× 143 0.8× 61 1.1k
M. Hayes Ireland 17 269 0.4× 48 0.1× 295 1.1× 157 0.6× 41 0.2× 84 1.4k
Cong Hu China 18 630 1.0× 44 0.1× 93 0.4× 190 0.7× 71 0.4× 94 1.4k
Teng Jiang China 18 240 0.4× 59 0.2× 238 0.9× 210 0.8× 66 0.4× 68 1.0k
Lijun Zhou China 20 981 1.5× 137 0.4× 273 1.1× 303 1.2× 38 0.2× 155 1.4k
Joel A. Paulson United States 25 356 0.5× 24 0.1× 140 0.5× 927 3.6× 178 1.0× 95 1.8k

Countries citing papers authored by G.S. May

Since Specialization
Citations

This map shows the geographic impact of G.S. May's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G.S. May with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G.S. May more than expected).

Fields of papers citing papers by G.S. May

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G.S. May. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G.S. May. The network helps show where G.S. May may publish in the future.

Co-authorship network of co-authors of G.S. May

This figure shows the co-authorship network connecting the top 25 collaborators of G.S. May. A scholar is included among the top collaborators of G.S. May based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G.S. May. G.S. May is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
May, G.S., et al.. (2010). Neural networks for advanced process control. 36. 137–142. 4 indexed citations
2.
May, G.S., et al.. (2006). Run-to-Run Failure Detection and Diagnosis Using Neural Networks and Dempster–Shafer Theory: An Application to Excimer Laser Ablation. IEEE Transactions on Electronics Packaging Manufacturing. 29(1). 42–49. 6 indexed citations
3.
Staiculescu, D., et al.. (2005). Modeling and sensitivity analysis of circuit parameters for flip-chip interconnects using neural networks. IEEE Transactions on Advanced Packaging. 28(1). 71–78. 17 indexed citations
4.
Kim, Tae Seon, et al.. (2005). Real-time predictive control of semiconductor manufacturing processes using neural networks. 2. 1240–1244. 3 indexed citations
5.
May, G.S., et al.. (2005). Hybrid Neural Network Modeling of Anion Exchange at the Interfaces of Mixed Anion III–V Heterostructures Grown by Molecular Beam Epitaxy. IEEE Transactions on Semiconductor Manufacturing. 18(4). 614–621. 7 indexed citations
6.
Sarkar, S., et al.. (2004). Novel modeling and layout optimization technique for highly compact planar bandpass filters on LCP. DSpace - NTUA (National Technical University of Athens). 3. 1381–1384. 1 indexed citations
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Bhattacharya, Swapan Kumar, Kyoung‐sik Moon, Rao Tummala, & G.S. May. (2003). Meniscus coating: a low-cost polymer deposition method for system-on-package (SOP) substrates. IEEE Transactions on Electronics Packaging Manufacturing. 26(2). 110–114. 4 indexed citations
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12.
Hong, Sang Jeen, et al.. (2003). Neural network modeling of reactive ion etching using optical emission spectroscopy data. IEEE Transactions on Semiconductor Manufacturing. 16(4). 598–608. 70 indexed citations
13.
Kenney, J.S., William D. Hunt, & G.S. May. (2002). Yield prediction of acoustic charge transport transversal filters. 390–395.
14.
Han, Seung-Soo & G.S. May. (2002). Recipe synthesis for PECVD SiO/sub 2/ films using neural networks and genetic algorithms. 855–860. 6 indexed citations
15.
Kim, Tae Seon & G.S. May. (2002). Modeling of via formation by photosensitive dielectric materials for MCM applications. 2. 930–933. 4 indexed citations
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May, G.S., et al.. (2001). Indirect adaptive control of reactive ion etching using neural networks. IEEE Transactions on Robotics and Automation. 17(5). 650–657. 5 indexed citations
18.
May, G.S., et al.. (1999). Using multivariate nested distributions to model semiconductor manufacturing processes. IEEE Transactions on Semiconductor Manufacturing. 12(1). 53–65. 2 indexed citations
19.
May, G.S., et al.. (1998). Modeling component placement errors in surface mount technology using neural networks. 21(1). 66–70. 11 indexed citations
20.
Erbil, A., et al.. (1997). Computer simulation study of the MOCVD growth of titanium dioxide films. Journal of Crystal Growth. 171(1-2). 154–165. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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