G.K. Reeves

1.8k total citations · 1 hit paper
62 papers, 1.4k citations indexed

About

G.K. Reeves is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, G.K. Reeves has authored 62 papers receiving a total of 1.4k indexed citations (citations by other indexed papers that have themselves been cited), including 47 papers in Electrical and Electronic Engineering, 29 papers in Atomic and Molecular Physics, and Optics and 15 papers in Materials Chemistry. Recurrent topics in G.K. Reeves's work include Semiconductor materials and interfaces (23 papers), Semiconductor materials and devices (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). G.K. Reeves is often cited by papers focused on Semiconductor materials and interfaces (23 papers), Semiconductor materials and devices (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). G.K. Reeves collaborates with scholars based in Australia, Malaysia and United States. G.K. Reeves's co-authors include H.B. Harrison, Anthony S. Holland, Patrick W. Leech, G. V. H. Wilson, Madhu Bhaskaran, K. T. Short, David R. G. Mitchell, Y. Pan, Philip Tanner and Sharath Sriram and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Materials Science.

In The Last Decade

G.K. Reeves

56 papers receiving 1.3k citations

Hit Papers

Obtaining the specific contact resistance from transmissi... 1982 2026 1996 2011 1982 250 500 750

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
G.K. Reeves Australia 13 1.1k 707 410 200 167 62 1.4k
H. Güttler Germany 11 1.7k 1.5× 1.6k 2.2× 758 1.8× 229 1.1× 219 1.3× 16 2.0k
C. O. Bozler United States 22 1.2k 1.1× 733 1.0× 228 0.6× 314 1.6× 151 0.9× 77 1.4k
T. C. Anthony United States 20 468 0.4× 742 1.0× 466 1.1× 169 0.8× 172 1.0× 46 1.1k
Paola Favia Belgium 21 1.2k 1.1× 331 0.5× 515 1.3× 282 1.4× 256 1.5× 120 1.5k
Konstantin Vassilevski United Kingdom 19 916 0.8× 430 0.6× 358 0.9× 118 0.6× 269 1.6× 86 1.2k
Frédéric Houzé France 18 465 0.4× 365 0.5× 343 0.8× 349 1.7× 118 0.7× 72 964
Q. Wahab Sweden 23 1.9k 1.7× 546 0.8× 420 1.0× 132 0.7× 158 0.9× 96 2.1k
Alton B. Horsfall United Kingdom 23 1.5k 1.3× 441 0.6× 728 1.8× 271 1.4× 68 0.4× 167 1.9k
Antti Tukiainen Finland 22 1.1k 1.0× 884 1.3× 416 1.0× 378 1.9× 188 1.1× 129 1.5k
J. Schumann Germany 17 549 0.5× 709 1.0× 723 1.8× 135 0.7× 161 1.0× 70 1.4k

Countries citing papers authored by G.K. Reeves

Since Specialization
Citations

This map shows the geographic impact of G.K. Reeves's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G.K. Reeves with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G.K. Reeves more than expected).

Fields of papers citing papers by G.K. Reeves

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G.K. Reeves. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G.K. Reeves. The network helps show where G.K. Reeves may publish in the future.

Co-authorship network of co-authors of G.K. Reeves

This figure shows the co-authorship network connecting the top 25 collaborators of G.K. Reeves. A scholar is included among the top collaborators of G.K. Reeves based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G.K. Reeves. G.K. Reeves is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Alnassar, Mohammad Saleh N, Patrick W. Leech, G.K. Reeves, et al.. (2015). Graphitic Schottky Contacts to Si formed by Energetic Deposition. MRS Proceedings. 1786. 51–56. 3 indexed citations
2.
Pan, Y., G.K. Reeves, Patrick W. Leech, Philip Tanner, & Anthony S. Holland. (2013). Two-contact Circular Test Structure for Determining Specific Contact Resistivity. MRS Proceedings. 1553. 3 indexed citations
3.
Leech, Patrick W., T. S. Perova, Robert A. Moore, et al.. (2005). Effect of prior C, Si and Sn implantation on the etch rate of CVD diamond. Diamond and Related Materials. 15(9). 1266–1270. 1 indexed citations
4.
Reeves, G.K., Anthony S. Holland, & Patrick W. Leech. (2001). Modelling the Current Density and Resistance of Interconnect Vias. xx. 503–506. 1 indexed citations
5.
Holland, Anthony S., G.K. Reeves, & Patrick W. Leech. (2001). Effects of Non-Planar Surfaces on the Growth of RF Magnetron Sputtered ZnO. MRS Proceedings. 672. 2 indexed citations
6.
Reeves, G.K., Anthony S. Holland, & Patrick W. Leech. (1998). Kelvin Test Structure Modeling of Metal-Silicide-Silicon Contacts. MRS Proceedings. 514. 4 indexed citations
7.
Reeves, G.K., et al.. (1997). Electrical modelling of Kelvin structures for the derivation of low specific contact resistivity. European Solid-State Device Research Conference. 492–495. 6 indexed citations
8.
Reeves, G.K., Anthony S. Holland, H.B. Harrison, & Patrick W. Leech. (1996). Electrical Modelling of Silicide Ohmic Contacts for MOS Devices. European Solid-State Device Research Conference. 303–306.
9.
Ressel, P., Patrick W. Leech, G.K. Reeves, Weiying Zhou, & E. Kuphal. (1996). Pd/Zn/Pd/Au and Pd/Zn/Au/LaB6/Au ohmic contacts to p-type In0.53Ga0.47As. Applied Physics Letters. 68(13). 1841–1843. 1 indexed citations
10.
Reeves, G.K., et al.. (1995). Interface states capacitance in Schottky contacts—A modified Schottky Capacitance Spectroscopy method. Solid-State Electronics. 38(10). 1771–1774. 6 indexed citations
11.
Austin, Michael W., et al.. (1993). AlGaAs/GaAs arrow waveguides. Electronics Letters. 29(12). 1058–1060. 3 indexed citations
12.
Elliman, R. G., M.A. Lawn, G.K. Reeves, & C. Jagadish. (1992). Physical AMD Electrical Properties of Iridium Thin Films. MRS Proceedings. 260. 1 indexed citations
13.
Harrison, H.B., et al.. (1988). Titanium silicides formed by rapid thermal vacuum processing. Journal of Applied Physics. 63(6). 2171–2173. 15 indexed citations
14.
Harrison, H.B. & G.K. Reeves. (1986). Comment on "An accurate method to extract specific contact resistivity using cross-bridge Kelvin resistors". IEEE Electron Device Letters. 7(2). 142–142.
15.
Reeves, G.K. & H.B. Harrison. (1986). Determination of contact parameters of interconnecting layers in VLSI circuits. IEEE Transactions on Electron Devices. 33(3). 328–334. 16 indexed citations
16.
Harrison, H.B., G.K. Reeves, & A.J. Walton. (1985). An Experimental Technique to Obtain the Specific Contact Resistance of Multi-Layer Interconnections. MRS Proceedings. 54. 1 indexed citations
17.
Reeves, G.K., et al.. (1983). The effect of thermochemical treatments on the mechanical properties of tool steel part II. Materials & Design (1980-2015). 4(2). 716–722. 3 indexed citations
18.
Harrison, H.B., J. S. Williams, & G.K. Reeves. (1983). Low ohmicity contacts to mono- and polycrystalline silicon. Thin Solid Films. 104(3-4). 382–382. 2 indexed citations
19.
Reeves, G.K. & H.B. Harrison. (1982). Contact resistance of polysilicon silicon interconnections. Electronics Letters. 18(25-26). 1083–1085. 21 indexed citations
20.
Reeves, G.K.. (1980). Specific contact resistance using a circular transmission line model. Solid-State Electronics. 23(5). 487–490. 213 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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