G.K. Reeves

1.8k total citations · 1 hit paper
62 papers, 1.4k citations indexed

About

G.K. Reeves is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, G.K. Reeves has authored 62 papers receiving a total of 1.4k indexed citations (citations by other indexed papers that have themselves been cited), including 47 papers in Electrical and Electronic Engineering, 29 papers in Atomic and Molecular Physics, and Optics and 15 papers in Materials Chemistry. Recurrent topics in G.K. Reeves's work include Semiconductor materials and interfaces (23 papers), Semiconductor materials and devices (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). G.K. Reeves is often cited by papers focused on Semiconductor materials and interfaces (23 papers), Semiconductor materials and devices (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). G.K. Reeves collaborates with scholars based in Australia, Malaysia and United States. G.K. Reeves's co-authors include H.B. Harrison, Anthony S. Holland, Patrick W. Leech, G. V. H. Wilson, Madhu Bhaskaran, K. T. Short, David R. G. Mitchell, Y. Pan, Philip Tanner and Sharath Sriram and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Materials Science.

In The Last Decade

G.K. Reeves

56 papers receiving 1.3k citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Obtaining the specific contact resistance from transmission line model measurements

1982 828 citations G.K. Reeves, H.B. Harrison IEEE Electron Device Letters profile →

Peers

Countries citing papers authored by G.K. Reeves

Since Specialization

Citations

This map shows the geographic impact of G.K. Reeves's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G.K. Reeves with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G.K. Reeves more than expected).

Fields of papers citing papers by G.K. Reeves

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G.K. Reeves. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G.K. Reeves. The network helps show where G.K. Reeves may publish in the future.

Co-authorship network of co-authors of G.K. Reeves

This figure shows the co-authorship network connecting the top 25 collaborators of G.K. Reeves. A scholar is included among the top collaborators of G.K. Reeves based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G.K. Reeves. G.K. Reeves is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Title	Journal	Authors	Indexed citations
1	Graphitic Schottky Contacts to Si formed by Energetic Deposition	MRS Proceedings	Mohammad Saleh N Alnassar, Patrick W. Leech et al.	3
2	Two-contact Circular Test Structure for Determining Specific Contact Resistivity	MRS Proceedings	Y. Pan, G.K. Reeves et al.	3
3	Effect of prior C, Si and Sn implantation on the etch rate of CVD diamond	Diamond and Related Materials	Patrick W. Leech, T. S. Perova et al.	1
4	Modelling the Current Density and Resistance of Interconnect Vias		G.K. Reeves, Anthony S. Holland et al.	1
5	Effects of Non-Planar Surfaces on the Growth of RF Magnetron Sputtered ZnO	MRS Proceedings	Anthony S. Holland, G.K. Reeves et al.	2
6	Kelvin Test Structure Modeling of Metal-Silicide-Silicon Contacts	MRS Proceedings	G.K. Reeves, Anthony S. Holland et al.	4
7	Electrical modelling of Kelvin structures for the derivation of low specific contact resistivity	European Solid-State Device Research Conference	G.K. Reeves, Anthony S. Holland et al.	6
8	Electrical Modelling of Silicide Ohmic Contacts for MOS Devices	European Solid-State Device Research Conference	G.K. Reeves, Anthony S. Holland et al.	0
9	Pd/Zn/Pd/Au and Pd/Zn/Au/LaB6/Au ohmic contacts to p-type In0.53Ga0.47As	Applied Physics Letters	P. Ressel, Patrick W. Leech et al.	1
10	Interface states capacitance in Schottky contacts—A modified Schottky Capacitance Spectroscopy method	Solid-State Electronics	G.K. Reeves et al.	6
11	AlGaAs/GaAs arrow waveguides	Electronics Letters	Michael W. Austin, G.K. Reeves et al.	3
12	Physical AMD Electrical Properties of Iridium Thin Films	MRS Proceedings	R. G. Elliman, M.A. Lawn et al.	1
13	Titanium silicides formed by rapid thermal vacuum processing	Journal of Applied Physics	H.B. Harrison, G.K. Reeves et al.	15
14	Comment on "An accurate method to extract specific contact resistivity using cross-bridge Kelvin resistors"	IEEE Electron Device Letters	H.B. Harrison, G.K. Reeves	0
15	Determination of contact parameters of interconnecting layers in VLSI circuits	IEEE Transactions on Electron Devices	G.K. Reeves, H.B. Harrison	16
16	An Experimental Technique to Obtain the Specific Contact Resistance of Multi-Layer Interconnections	MRS Proceedings	H.B. Harrison, G.K. Reeves et al.	1
17	The effect of thermochemical treatments on the mechanical properties of tool steel part II	Materials & Design (1980-2015)	G.K. Reeves et al.	3
18	Low ohmicity contacts to mono- and polycrystalline silicon	Thin Solid Films	H.B. Harrison, J. S. Williams et al.	2
19	Contact resistance of polysilicon silicon interconnections	Electronics Letters	G.K. Reeves, H.B. Harrison	21
20	Specific contact resistance using a circular transmission line model	Solid-State Electronics	G.K. Reeves	213

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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