G. Raymond

646 total citations
11 papers, 43 citations indexed

About

G. Raymond is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Computer Networks and Communications. According to data from OpenAlex, G. Raymond has authored 11 papers receiving a total of 43 indexed citations (citations by other indexed papers that have themselves been cited), including 5 papers in Electrical and Electronic Engineering, 3 papers in Mechanics of Materials and 2 papers in Computer Networks and Communications. Recurrent topics in G. Raymond's work include Metal and Thin Film Mechanics (3 papers), Thin-Film Transistor Technologies (3 papers) and Reliability and Maintenance Optimization (2 papers). G. Raymond is often cited by papers focused on Metal and Thin Film Mechanics (3 papers), Thin-Film Transistor Technologies (3 papers) and Reliability and Maintenance Optimization (2 papers). G. Raymond collaborates with scholars based in France, United States and Czechia. G. Raymond's co-authors include A. Devos, D.H. Brandwood, Marion Berbineau, Juliette Marais, Muriel Braccini, Pascal Morin, A. Pasturel, N. Enjalbert, Sébastien Dubois and Jordi Veirman and has published in prestigious journals such as Journal of Applied Physics, Solar Energy Materials and Solar Cells and Thin Solid Films.

In The Last Decade

G. Raymond

11 papers receiving 37 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
G. Raymond France	5	23	13	8	7	5	11	43
H. Huber Germany	4	11 0.5×	13 1.0×	3 0.4×	5 0.7×	5 1.0×	4	23
D. Hertz France	2	11 0.5×	9 0.7×	12 1.5×	4 0.6×	1 0.2×	2	22
J. Kimbrough United States	4	22 1.0×	4 0.3×	5 0.6×	3 0.4×	2 0.4×	10	37
Bong Hyuk Choi South Korea	4	13 0.6×	11 0.8×	5 0.6×	17 2.4×		11	31
M. Ruschman United States	4	17 0.7×	8 0.6×	6 0.8×	9 1.3×		8	32
S. Lian China	4	20 0.9×	9 0.7×	3 0.4×	4 0.6×	1 0.2×	11	32
N. J. Simon United States	4	9 0.4×	19 1.5×	13 1.6×	7 1.0×	2 0.4×	6	49
N. Hitomi Japan	5	15 0.7×	7 0.5×	4 0.5×	12 1.7×	1 0.2×	9	36
S. Wolbers United States	4	11 0.5×	5 0.4×	7 0.9×	7 1.0×		9	29
A. V. Kazantsev Russia	5	29 1.3×	13 1.0×	21 2.6×	3 0.4×	2 0.4×	14	44

Countries citing papers authored by G. Raymond

Since Specialization

Citations

This map shows the geographic impact of G. Raymond's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Raymond with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Raymond more than expected).

Fields of papers citing papers by G. Raymond

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Raymond. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Raymond. The network helps show where G. Raymond may publish in the future.

Co-authorship network of co-authors of G. Raymond

This figure shows the co-authorship network connecting the top 25 collaborators of G. Raymond. A scholar is included among the top collaborators of G. Raymond based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. Raymond. G. Raymond is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

11 of 11 papers shown

1.

Veirman, Jordi, G. Raymond, N. Enjalbert, et al.. (2016). Thermal History Index as a bulk quality indicator for Czochralski solar wafers. Solar Energy Materials and Solar Cells. 158. 55–59. 6 indexed citations

2.

Veirman, Jordi, N. Enjalbert, Johannes Stadler, et al.. (2015). Spatial characterization of interstitial oxygen and its related defects in Czochralski silicon wafers and ingots: A way to improve the material and device quality. 1–3. 2 indexed citations

3.

Braccini, Muriel, et al.. (2014). Dual mechanical behaviour of hydrogen in stressed silicon nitride thin films. Journal of Applied Physics. 116(4). 6 indexed citations

4.

Braccini, Muriel, et al.. (2013). Elastic properties of tensile nitrogen-plasma-treated multilayer silicon nitride films. Thin Solid Films. 551. 120–126. 8 indexed citations

5.

Mante, Pierre‐Adrien, A. Devos, G. Raymond, Pascal Morin, & P. Ancey. (2009). Comparison between picosecond ultrasonics and nanoindentation characterization in thin film. HAL (Le Centre pour la Communication Scientifique Directe). 93. 2564–2567. 3 indexed citations

6.

Raymond, G., Juliette Marais, & Marion Berbineau. (2004). INNOVATION BRINGS SATELLITE-BASED TRAIN CONTROL WITHIN REACH. Railway gazette international. 160(12). 5 indexed citations

7.

Brandwood, D.H., et al.. (1977). Adaptive interference cancellation in radar systems. 212–217. 3 indexed citations

8.

Brandwood, D.H., et al.. (1975). The application of interference cancellation to an earth station. 126. 233–238. 4 indexed citations

9.

Raymond, G.. (1965). Second Thoughts on Reliability. IEEE Transactions on Reliability. R-14(1). 66–72. 4 indexed citations

10.

Raymond, G.. (1964). Second Thoughts on Reliability. 2(2). 338–344. 1 indexed citations

11.

Raymond, G., et al.. (1958). The Athena computer, a reliability report. 20–24. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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