Fred Duewer

1.3k total citations
26 papers, 969 citations indexed

About

Fred Duewer is a scholar working on Biomedical Engineering, Electrical and Electronic Engineering and Radiation. According to data from OpenAlex, Fred Duewer has authored 26 papers receiving a total of 969 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Biomedical Engineering, 12 papers in Electrical and Electronic Engineering and 9 papers in Radiation. Recurrent topics in Fred Duewer's work include Advanced X-ray Imaging Techniques (9 papers), Near-Field Optical Microscopy (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). Fred Duewer is often cited by papers focused on Advanced X-ray Imaging Techniques (9 papers), Near-Field Optical Microscopy (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). Fred Duewer collaborates with scholars based in United States, Japan and China. Fred Duewer's co-authors include X.‐D. Xiang, Yalin Lu, Gao Chen, Michael Feser, Tao Wei, Wenbing Yun, Andrei Tkachuk, Steve Wang, Hauyee Chang and Nai‐Ben Ming and has published in prestigious journals such as Nature, Science and Physical review. B, Condensed matter.

In The Last Decade

Fred Duewer

25 papers receiving 897 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Fred Duewer United States 14 460 407 330 197 190 26 969
Mauro Prasciolu Italy 18 308 0.7× 329 0.8× 208 0.6× 218 1.1× 208 1.1× 63 898
Amal Chabli France 17 363 0.8× 639 1.6× 415 1.3× 255 1.3× 69 0.4× 105 1.1k
Juris Blūms Latvia 11 374 0.8× 191 0.5× 160 0.5× 250 1.3× 96 0.5× 42 863
Andrei Tkachuk United States 15 240 0.5× 281 0.7× 332 1.0× 84 0.4× 385 2.0× 27 1.1k
J. H. Je South Korea 16 232 0.5× 194 0.5× 276 0.8× 59 0.3× 212 1.1× 41 749
J. Verhoeven Netherlands 21 470 1.0× 442 1.1× 496 1.5× 285 1.4× 213 1.1× 73 1.4k
Andreas Kupsch Germany 16 239 0.5× 282 0.7× 306 0.9× 100 0.5× 310 1.6× 87 988
F. Pérez‐Willard Germany 17 462 1.0× 363 0.9× 281 0.9× 483 2.5× 63 0.3× 33 1.1k
Oliver Fox United Kingdom 13 207 0.5× 310 0.8× 406 1.2× 128 0.6× 162 0.9× 42 832
Hiroshi Yamazaki Japan 13 202 0.4× 249 0.6× 195 0.6× 92 0.5× 338 1.8× 59 852

Countries citing papers authored by Fred Duewer

Since Specialization
Citations

This map shows the geographic impact of Fred Duewer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Fred Duewer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Fred Duewer more than expected).

Fields of papers citing papers by Fred Duewer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Fred Duewer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Fred Duewer. The network helps show where Fred Duewer may publish in the future.

Co-authorship network of co-authors of Fred Duewer

This figure shows the co-authorship network connecting the top 25 collaborators of Fred Duewer. A scholar is included among the top collaborators of Fred Duewer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Fred Duewer. Fred Duewer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kwan, Michael, et al.. (2020). Optimizing X-Ray Inspection for Advanced Packaging Applications. IMAPSource Proceedings. 2020(1). 165–168. 1 indexed citations
2.
Drukker, Karen, Fred Duewer, Maryellen L. Giger, et al.. (2014). Mammographic quantitative image analysis and biologic image composition for breast lesion characterization and classification. Medical Physics. 41(3). 31915–31915. 11 indexed citations
3.
Chen, Sharon, Janos Kirz, Feng Yan, et al.. (2009). Absolute efficiency measurement of high-performance zone plates. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7448. 74480D–74480D. 6 indexed citations
4.
Chen, Sharon, Janos Kirz, Feng Yan, et al.. (2008). Absolute zone plate efficiency measurement using laboratory X-ray sources. Journal of X-Ray Science and Technology. 16(4). 235–241. 1 indexed citations
5.
Feser, Michael, Jeff Gelb, Huibin Chang, et al.. (2008). Sub-micron resolution CT for failure analysis and process development. Measurement Science and Technology. 19(9). 94001–94001. 73 indexed citations
6.
Zeng, Xianghui, et al.. (2008). Ellipsoidal and parabolic glass capillaries as condensers for x-ray microscopes. Applied Optics. 47(13). 2376–2376. 62 indexed citations
7.
Tkachuk, Andrei, et al.. (2007). X-ray computed tomography in Zernike phase contrast mode at 8 keV with 50-nm resolution using Cu rotating anode X-ray source. Zeitschrift für Kristallographie - Crystalline Materials. 222(11). 650–655. 175 indexed citations
8.
Yin, Gung-Chian, Fred Duewer, Xianghui Zeng, et al.. (2006). Dark-field image of full-field transmission hard x-ray microscope in 8-11 keV. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6317. 631703–631703. 2 indexed citations
9.
Tkachuk, Andrei, et al.. (2006). High-resolution x-ray tomography using laboratory sources. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6318. 63181D–63181D. 26 indexed citations
10.
Scott, David A., et al.. (2004). A Novel X-Ray Microtomography System with High Resolution and Throughput for Non-Destructive 3D Imaging of Advanced Packages. Proceedings - International Symposium for Testing and Failure Analysis. 30873. 94–98. 6 indexed citations
11.
Feser, Michael, et al.. (2004). 3-D X-ray Microscopy using a Laboratory Source. Microscopy and Microanalysis. 10(S02). 1036–1037. 4 indexed citations
12.
Hasegawa, Takuya, Tomoteru Fukumura, Noriaki Okazaki, et al.. (2002). High-throughput characterization of composition-spread manganese oxide films with a scanning SQUID microscope. Applied Surface Science. 189(3-4). 210–215. 9 indexed citations
13.
Yoo, Young K., Fred Duewer, Tomoteru Fukumura, et al.. (2001). Strong correlation between high-temperature electronic and low-temperature magnetic ordering inLa1−xCaxMnO3continuous phase diagram. Physical review. B, Condensed matter. 63(22). 17 indexed citations
14.
Yoo, Young K., Tsuyoshi Ohnishi, Gang Wang, et al.. (2001). Continuous mapping of structure–property relations in Fe1−xNix metallic alloys fabricated by combinatorial synthesis. Intermetallics. 9(7). 541–545. 35 indexed citations
15.
Li, Jingwei, Fred Duewer, Gao Chen, et al.. (2000). Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba1−xSrxTiO3 materials chips. Applied Physics Letters. 76(6). 769–771. 55 indexed citations
16.
Duewer, Fred, Chunxiao Gao, & X.‐D. Xiang. (2000). Tip–sample distance feedback control in a scanning evanescent microwave probe for nonlinear dielectric imaging. Review of Scientific Instruments. 71(6). 2414–2417. 7 indexed citations
17.
Duewer, Fred, Chunxiao Gao, Ichiro Takeuchi, & X.‐D. Xiang. (1999). Tip–sample distance feedback control in a scanning evanescent microwave microscope. Applied Physics Letters. 74(18). 2696–2698. 28 indexed citations
18.
Chen, Gao, Fred Duewer, & X.‐D. Xiang. (1999). Quantitative microwave evanescent microscopy. Applied Physics Letters. 75(19). 3005–3007. 37 indexed citations
19.
Chen, Gao, Fred Duewer, Yalin Lu, & X.‐D. Xiang. (1998). Quantitative nonlinear dielectric microscopy of periodically polarized ferroelectric domains. Applied Physics Letters. 73(8). 1146–1148. 29 indexed citations
20.
Takeuchi, Ichiro, Tao Wei, Fred Duewer, et al.. (1997). Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7−x films. Applied Physics Letters. 71(14). 2026–2028. 47 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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