F. Osaka

540 total citations
34 papers, 447 citations indexed

About

F. Osaka is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, F. Osaka has authored 34 papers receiving a total of 447 indexed citations (citations by other indexed papers that have themselves been cited), including 32 papers in Atomic and Molecular Physics, and Optics, 16 papers in Electrical and Electronic Engineering and 6 papers in Biomedical Engineering. Recurrent topics in F. Osaka's work include Semiconductor Quantum Structures and Devices (22 papers), Surface and Thin Film Phenomena (13 papers) and Force Microscopy Techniques and Applications (12 papers). F. Osaka is often cited by papers focused on Semiconductor Quantum Structures and Devices (22 papers), Surface and Thin Film Phenomena (13 papers) and Force Microscopy Techniques and Applications (12 papers). F. Osaka collaborates with scholars based in Japan and United States. F. Osaka's co-authors include Takashi Mikawa, T. Kaneda, Takashi Kato, Shunsuke Ohkouchi, Ichiro Tanaka, Osamu Wada, Ichiro Tanaka, Shuzo Mishima, M. Suzuki and S. Morita and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Surface Science.

In The Last Decade

F. Osaka

34 papers receiving 395 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. Osaka Japan 12 389 296 68 67 54 34 447
R.C. Goodfellow United Kingdom 12 224 0.6× 409 1.4× 45 0.7× 15 0.2× 55 1.0× 44 457
L. W. Cook United States 15 484 1.2× 564 1.9× 35 0.5× 100 1.5× 69 1.3× 27 597
L. A. Koszi United States 15 431 1.1× 564 1.9× 44 0.6× 8 0.1× 91 1.7× 38 640
P. A. Childs United Kingdom 12 79 0.2× 286 1.0× 28 0.4× 9 0.1× 59 1.1× 30 331
Y.–H. Zhang United States 11 291 0.7× 309 1.0× 28 0.4× 13 0.2× 113 2.1× 33 385
D. H. Jaw United States 11 501 1.3× 445 1.5× 80 1.2× 6 0.1× 144 2.7× 22 566
T. H. Windhorn United States 15 501 1.3× 602 2.0× 51 0.8× 31 0.5× 51 0.9× 23 649
M. Hovinen United States 11 388 1.0× 399 1.3× 31 0.5× 8 0.1× 149 2.8× 30 453
E. P. G. Smith United States 12 201 0.5× 321 1.1× 35 0.5× 32 0.5× 36 0.7× 23 340
Shin Mou United States 10 231 0.6× 283 1.0× 45 0.7× 15 0.2× 107 2.0× 26 347

Countries citing papers authored by F. Osaka

Since Specialization
Citations

This map shows the geographic impact of F. Osaka's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Osaka with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Osaka more than expected).

Fields of papers citing papers by F. Osaka

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Osaka. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Osaka. The network helps show where F. Osaka may publish in the future.

Co-authorship network of co-authors of F. Osaka

This figure shows the co-authorship network connecting the top 25 collaborators of F. Osaka. A scholar is included among the top collaborators of F. Osaka based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Osaka. F. Osaka is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sugawara, Yasuhiro, S. Morita, F. Osaka, et al.. (1996). Atomic resolution imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact mode. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(2). 953–956. 43 indexed citations
2.
Ohta, Makoto, Yasuhiro Sugawara, F. Osaka, et al.. (1995). Atomically resolved image of cleaved surfaces of compound semiconductors observed with an ultrahigh vacuum atomic force microscope. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(3). 1265–1267. 13 indexed citations
3.
Ohta, Makoto, Yasuhiro Sugawara, Seizo Morita, et al.. (1994). Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope. Japanese Journal of Applied Physics. 33(1A). L52–L52. 8 indexed citations
4.
Osaka, F., et al.. (1994). Scanning tunneling microscopy of Cl2-gas etched GaAs (001) surfaces using an ultrahigh vacuum sample transfer system. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(5). 2894–2900. 5 indexed citations
5.
Sugawara, Yasuhiro, Makoto Ohta, Seizo Morita, et al.. (1994). Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope. Japanese Journal of Applied Physics. 33(6S). 3739–3739. 13 indexed citations
6.
Tanaka, Ichiro, Shunsuke Ohkouchi, F. Osaka, & Takashi Kato. (1992). Scanning tunneling microscopy of thermally cleaned InP surfaces in an arsenic flux. Surface Science. 267(1-3). 191–194. 10 indexed citations
7.
Kato, Takashi & F. Osaka. (1992). Voltage-dependent scanning tunneling microscopy image of the GaInAs/InP multiquantum well structure. Journal of Applied Physics. 72(12). 5716–5720. 2 indexed citations
8.
Tanaka, Ichiro, Shunsuke Ohkouchi, Takashi Kato, & F. Osaka. (1991). Scanning tunneling microscopy of molecular-beam epitaxially grown GaAs (001) surfaces. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(4). 2277–2281. 34 indexed citations
9.
Kato, Takashi, F. Osaka, Isao Tanaka, & Shunsuke Ohkouchi. (1991). A scanning tunneling microscope using dual-axes inchworms for the observation of a cleaved semiconductor surface. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(4). 1981–1984. 9 indexed citations
10.
Tanaka, Ichiro, Takashi Kato, Shunsuke Ohkouchi, & F. Osaka. (1990). Observation of multiquantum well structure in air using a scanning tunneling microscope. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(1). 567–570. 20 indexed citations
11.
Kato, Takashi, Ichiro Tanaka, Naoharu Sugiyama, & F. Osaka. (1990). Current Imaging Tunneling Spectroscopy of Thin n-GaAs/p-GaAs Multilayer Structures in Air. Japanese Journal of Applied Physics. 29(7A). L1188–L1188. 1 indexed citations
12.
Osaka, F., et al.. (1986). EBIC Observation on the InP/InGaAs/InP Heterostructure Photodiode. Japanese Journal of Applied Physics. 25(4A). L269–L269. 1 indexed citations
13.
Osaka, F., Takashi Mikawa, & Osamu Wada. (1986). Effect of Alloy Scattering on Electron and Hole Impact Ionization Rates in Ga1-xInxAsyP1-y Alloy System. Japanese Journal of Applied Physics. 25(4R). 568–568. 3 indexed citations
14.
Osaka, F., et al.. (1986). Excess noise design of InP/GaInAsP/GaInAs avalanche photodiodes. IEEE Journal of Quantum Electronics. 22(3). 471–478. 30 indexed citations
15.
Osaka, F., et al.. (1985). Low-temperature characteristics of electron ionization rates in (100)- and (111)-oriented InP. Journal of Applied Physics. 58(11). 4426–4430. 6 indexed citations
16.
Osaka, F., Takashi Mikawa, & T. Kaneda. (1985). Impact ionization coefficients of electrons and holes in. IEEE Journal of Quantum Electronics. 21(9). 1326–1338. 84 indexed citations
17.
Osaka, F., et al.. (1985). Low-temperature impact ionization rates in (111) oriented InP. Applied Physics Letters. 47(8). 865–866. 6 indexed citations
18.
Osaka, F., Takashi Mikawa, & T. Kaneda. (1984). Electron and hole ionization coefficients in (100) oriented Ga0.33In0.67As0.70P0.30. Applied Physics Letters. 45(3). 292–293. 9 indexed citations
19.
Osaka, F., Takashi Mikawa, & T. Kaneda. (1984). Electron and hole ionization coefficients in (100) oriented Ga0.18In0.82As0.39P0.61. Applied Physics Letters. 45(6). 654–656. 4 indexed citations
20.
Yamasaki, Susumu, et al.. (1982). Multiplication noise in planar InP/InGaAsP heterostructure avalanche photodiodes. Applied Physics Letters. 40(6). 532–533. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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