F. Bridou

1.9k total citations
86 papers, 1.1k citations indexed

About

F. Bridou is a scholar working on Atomic and Molecular Physics, and Optics, Radiation and Electrical and Electronic Engineering. According to data from OpenAlex, F. Bridou has authored 86 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 30 papers in Atomic and Molecular Physics, and Optics, 29 papers in Radiation and 23 papers in Electrical and Electronic Engineering. Recurrent topics in F. Bridou's work include X-ray Spectroscopy and Fluorescence Analysis (18 papers), Advanced X-ray Imaging Techniques (13 papers) and Ion-surface interactions and analysis (11 papers). F. Bridou is often cited by papers focused on X-ray Spectroscopy and Fluorescence Analysis (18 papers), Advanced X-ray Imaging Techniques (13 papers) and Ion-surface interactions and analysis (11 papers). F. Bridou collaborates with scholars based in France, Germany and Italy. F. Bridou's co-authors include B. Pardo, Franck Delmotte, J. Gautier, M. F. Ravet, Marc Roulliay, J. M. Desvignes, M. Mâaza, Jerome Undiandeye, Arnaud Jérôme and Philippe Jonnard and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Physical Review A.

In The Last Decade

F. Bridou

84 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. Bridou France 19 456 334 334 307 210 86 1.1k
Hisataka Takenaka Japan 20 555 1.2× 274 0.8× 460 1.4× 270 0.9× 190 0.9× 128 1.3k
I. V. Kozhevnikov Russia 20 379 0.8× 241 0.7× 504 1.5× 181 0.6× 300 1.4× 126 1.2k
В. В. Кондратенко Ukraine 18 345 0.8× 344 1.0× 367 1.1× 234 0.8× 156 0.7× 96 1.0k
Qiushi Huang China 16 285 0.6× 261 0.8× 311 0.9× 211 0.7× 170 0.8× 134 932
Torsten Feigl Germany 17 389 0.9× 451 1.4× 324 1.0× 138 0.4× 211 1.0× 81 1.1k
Juan I. Larruquert Spain 19 624 1.4× 363 1.1× 155 0.5× 329 1.1× 480 2.3× 114 1.5k
Andrey Yakshin Netherlands 20 657 1.4× 429 1.3× 324 1.0× 370 1.2× 311 1.5× 96 1.4k
Farhad Salmassi United States 19 471 1.0× 417 1.2× 532 1.6× 176 0.6× 425 2.0× 75 1.3k
J. Pflüger Germany 17 622 1.4× 257 0.8× 248 0.7× 669 2.2× 133 0.6× 61 1.4k
S. Yu. Zuev Russia 16 266 0.6× 206 0.6× 228 0.7× 105 0.3× 166 0.8× 66 709

Countries citing papers authored by F. Bridou

Since Specialization
Citations

This map shows the geographic impact of F. Bridou's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Bridou with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Bridou more than expected).

Fields of papers citing papers by F. Bridou

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Bridou. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Bridou. The network helps show where F. Bridou may publish in the future.

Co-authorship network of co-authors of F. Bridou

This figure shows the co-authorship network connecting the top 25 collaborators of F. Bridou. A scholar is included among the top collaborators of F. Bridou based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Bridou. F. Bridou is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Jonnard, Philippe, et al.. (2014). Spontaneous soft x-ray fluorescence from a superlattice under Kossel diffraction conditions. Journal of Physics B Atomic Molecular and Optical Physics. 47(16). 165601–165601. 6 indexed citations
2.
Delmotte, Franck, Evgueni Meltchakov, Sébastien de Rossi, et al.. (2013). Development of multilayer coatings for solar orbiter EUV imaging telescopes. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8862. 88620A–88620A. 10 indexed citations
3.
Bridou, F., et al.. (2012). Design and fabrication of X-ray non-periodic multilayer mirrors: Apodization and shaping of their spectral response. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 680. 69–74. 12 indexed citations
4.
Meltchakov, Evgueni, Ahmed Ziani, F. Auchère, et al.. (2011). EUV reflectivity and stability of tri-component Al-based multilayers. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8168. 816819–816819. 20 indexed citations
5.
Reverdin, C., et al.. (2011). Development of supermirrors for high-resolution x-ray LMJ microscopes. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8139. 81390C–81390C. 2 indexed citations
6.
Gottwald, Alexander, F. Bridou, J. M. Desvignes, et al.. (2007). Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation. Applied Optics. 46(32). 7797–7797. 10 indexed citations
7.
Gautier, J., et al.. (2007). Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques. Surface Science. 601(11). 2315–2322. 18 indexed citations
8.
Gautier, J., Franck Delmotte, F. Bridou, et al.. (2007). Characterization and optimization of magnetron sputtered Sc/Si multilayers for extreme ultraviolet optics. Applied Physics A. 88(4). 719–725. 19 indexed citations
9.
Gautier, J., Franck Delmotte, Marc Roulliay, et al.. (2005). Study of normal incidence of three-component multilayer mirrors in the range 20–40 nm. Applied Optics. 44(3). 384–384. 61 indexed citations
10.
Jonnard, Philippe, Jean‐Marc André, J. Gautier, et al.. (2004). Étude d'un empilement multicouche périodique Mo/Si par spectroscopie d'émission X et par réflectométrie X. Journal de Physique IV (Proceedings). 118. 231–236. 5 indexed citations
11.
André, Jean‐Marc, R. Barchewitz, Marie-Françoise Ravet, et al.. (2002). X-ray multilayer monochromator with enhanced performance. Applied Optics. 41(1). 239–239. 11 indexed citations
12.
Delmotte, Franck, et al.. (2002). X-ray–ultraviolet beam splitters for the Michelson interferometer. Applied Optics. 41(28). 5905–5905. 15 indexed citations
13.
André, Jean‐Marc, R. Barchewitz, M. F. Ravet, et al.. (2002). Monochromateur multicouche X-UV à bande passante étroite et faible fond continu. Journal de Physique IV (Proceedings). 12(6). 293–298. 2 indexed citations
14.
André, Jean‐Marc, R. Barchewitz, Marie-Françoise Ravet, et al.. (2001). Fabrication and characterization of a Mo/Si multilayer monochromator with a narrow spectral bandwidth in the xuv domain. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 458(3). 650–655. 4 indexed citations
15.
Aubert, Pascal, et al.. (1999). Epitaxial growth of (Pb, La)TiO3thin films on (0001) Al2O3and (001)SrTiO3substrates by RF magnetron sputtering. Ferroelectrics. 225(1). 303–310. 1 indexed citations
16.
Mâaza, M., B. Pardo, J. P. Chauvineau, et al.. (1997). Zeeman neutron tunneling in “NiCoNi” thin film resonators. Physics Letters A. 235(1). 19–23. 7 indexed citations
17.
Bridou, F.. (1994). Curvature effect in grazing X-ray reflectometry. Journal de Physique III. 4(9). 1513–1522. 7 indexed citations
18.
Bridou, F., et al.. (1993). Modelling of ellipsometric data of inhomogeneous TiO2 films. Thin Solid Films. 234(1-2). 458–462. 9 indexed citations
19.
Mâaza, M., et al.. (1993). Reduction of the interfacial diffusion in Ni–Ti neutron-optics multilayers by carburation of the Ni–Ti interfaces. Journal of Applied Crystallography. 26(4). 574–582. 12 indexed citations
20.
Bridou, F., et al.. (1991). Carbon/tungsten multilayers for X-ray-UV optics deposited by laser evaporation: Preparation and interface characterization. Thin Solid Films. 203(1). 77–86. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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